Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM) has announced the new Ztherm Modulated Local Thermal Analysis Option for its MFP- 3D and Cypher AFMs. Ztherm provides highly localized heating with sensitivity to =10-22 liter (sub-zeptoliter) materials property changes, more than an order of magnitude improvement in volume over that previously available with commercial systems.
A standing problem with existing AFM-based thermal analysis systems is thermally induced bending of the cantilever that results in spurious deflection signals and variable loads being applied during heating.
Asylum has developed a patent-pending cantilever compensation and control solution that corrects this problem, providing constant-load detection of thermally induced melting (Tm), phase transitions (Tg) and other morphological and compliance effects for materials studies and material identification - for areas less than 20nm x 20nm. In addition to standard thermal analysis capabilities, the Ztherm package can also be used to evaluate contact stiffness and dissipation as a function of temperature with advanced techniques such Dual AC Resonance Tracking (DART). The contact stiffness and dissipation - measured at the cantilever resonance - are much more sensitive to temperature dependent properties, including surface melting and transition temperatures, than conventional deflection-based measurements.
In addition, integrated piezo actuation allows high resolution AC imaging of samples for surface topographical mapping before and after thermal measurements. The Ztherm option is compatible with and includes Anasys ThermaleverTM probes.
Dr. Roger Proksch, Asylum Research President commented, "Our new Ztherm option is the most powerful thermal analysis package on the market today, with sensitivity, resolution and capabilities beyond anything else available. With the ability to be used in combination with our new DART technique, we believe Ztherm will enhance existing research avenues and open up new directions for analysis of thermal effects and material identification on scales previously impossible."