Oxford Instruments Asylum Research in conjunction with IOP Publishing will present the webinar “Exploring Flatlands: Characterizing 2D Materials with Atomic Force Microscopy (AFM)” on December 13, 2016, 11:00 am EST.
AFM topography image of a CVD-grown single crystal of MoS2 on sapphire. Image courtesy A. Kis, adapted from ACS Nano, 2015, 9 (4), pp 4611–4620.
Registration is at
Ideal for researchers in both academia and industry, this webinar discusses the powerful techniques of today’s AFMs for characterizing 2D materials that enable higher resolution, greater sensitivity, and more quantitative results for applications in device manufacturing, energy storage and optoelectronics.
Dr. Andras Kis, Associate Professor at Ecole Polytechnique Federale de Lausanne (EPFL), and Keith Jones, Applications Scientist at Asylum Research, discuss the “hows” and “whys” of AFM measurements on:
Molybdenum disulfide and graphene
Measuring mechanical properties
Kelvin probe force microscopy (KPFM) of operating transistors
Scanning microwave impedance microscopy (sMIM)
Real-world examples will be presented. Additionally, they address how AFM can now be used to accurately determine the thickness of single or multiple layers of a 2D material. This will challenge the misconception that AFM cannot be used to precisely measure the thickness of 2D materials.
AFM has played an essential role in 2D materials research since it was used to confirm the first isolation of graphene. Today’s AFMs are even more powerful, with higher spatial resolution, faster imaging rates, greater environmental control, and enhanced modes for mapping physical properties. AFM will continue to play an essential role in developing future 2D materials for a wide range of applications. This webinar will be an excellent education on how AFM tools are being used in this active research field.
Jason Li, Applications Manager, Asylum Research
Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics.
In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization.
Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets.
Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.
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