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Results 1 - 2 of 2 for A2O3/a-Si
  • Supplier Profile
    HORIBA Scientific, part of HORIBA Instruments, Inc., headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific...
  • Article - 15 Aug 2005
    In this article, Spectroscopic Ellipsometry is demonstrated to be particularly suitable for thin film characterization.