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Results 1 - 10 of 524 for Atomic force microscopes
  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D...
  • Supplier Profile
    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
  • Supplier Profile
    Asylum Research is the technology leader in atomic force probe microscopy (AFM) for both materials and bioscience applications.  Founded in 1999, we are dedicated to innovative...
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    WITec GmbH pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without compromise. Raman,...
  • Supplier Profile
    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
  • Supplier Profile
    Alemnis enables breakthrough academic research in material science by providing leading-edge micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing...
  • Supplier Profile
    Oxford Instruments Plasma Technology is a Leading Provider of Etch and Deposition Processing Solutions Plasma technology is used in the fabrication of most semiconductor devices created today...
  • Supplier Profile
    Founded in the 1990's by scientist and entrepreneur, Dr. Raj Lartius, Novascan Technologies has established itself as a leader in the development of products and instrumentation for molecular...
  • Equipment
    The Cypher S atomic force microscope (AFM) from Oxford Instruments Asylum Research provides both ultra-high resolution and fast scanning.
  • Equipment
    Find out how this atomic force microscope (AFM) can be used for high-quality nano-imaging.

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