The Latest Innovation in Real-Time, High-Throughput Volatile Impurities Analysis

SIFT-MS - direct-injection mass spectrometry - provides real-time, chromatography-free, trace-level detection of volatile compounds.

Launched at Pittcon 2023, the Syft TracerTM is the next generation of SIFT-MS designed to solve the most complex analytical challenges. It delivers trace-level detection sensitivity, unparalleled performance stability, superior selectivity, and highly reproducible quantitative data.  This webinar demonstrates how Syft Tracer can be used to revolutionize the workflows of volatile impurities analysis.

Features of Syft TracerTM

  • Trace level multi-analyte detection sensitivity
  • No sample preparation time is required. The device eliminates slow matrix purification steps for ethylene oxide analysis in Polysorbate 80 and derivatization steps for formaldehyde analysis.
  • Much faster sample analysis, delivering throughputs for headspace analysis of 12 samples/hour, or up to 16 times more samples a day than GC.
  • Utilizes Fine Auto Retune to optimize signal levels and Performance Authenticator for superior analytical stability.
  • Using the same configuration, this device allows for seamless “mix-and-match” analysis of volatiles of any functionality.

The webinar will also touch upon some of the new hardware advancements of the Syft Tracer that help to increase the lifetime of the system, even when running in a 24/7 environment.

Watch this webinar to discover the true speed of SIFT-MS.

Key Learning Objectives

  • The combination of SIFT-MS with automation offers a high throughput solution for the screening of inorganic acids and VOCs in a number of applications and industries, including pharmaceutical and CDMO, consumer safety, and environmental.
  • The crucial features of SIFT-MS (selected ion flow tube mass spectrometry) will be compared against conventional GC/MS, including its ability to selectively and comprehensively analyze samples in a rapid and simple procedure.

This webinar will outline how Syft Tracer can be employed to help solve some of the most complex analytical challenges while supporting high-throughput, 24/7 operation.

About the Speakers

Langford joined Syft Technologies in 2002 after completing his Ph.D. in Physical Chemistry at the University of Canterbury and post-doctoral fellowships at the Universities of Geneva, Western Australia, and Canterbury.

With an extensive background in diverse applications of SIFT-MS and over thirty peer-reviewed publications under his belt, Langford is more than qualified to provide support on advanced applications to global SIFT-MS users.



Dr. Silva graduated from the University of Calgary with a Ph.D. in Biochemistry and Molecular Biology before undertaking a post-doctoral fellowship at the MD Anderson Cancer Center, where she worked as a Senior Research Scientist at Lawrence Berkeley National Laboratory.

Dr. Silva headed her own Analytical Chemistry lab for a San Francisco-based Food and Beverage startup for four years before joining the US Syft Technologies team as an Applications Scientist in October 2020.

Leslie works closely with both the New Zealand the US-based sales and product development teams to develop applications and help customers with their SIFT-MS workflows.

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