The DECTRIS ARINA is an ultra-fast 4D STEM detector that does not trade off on sensitivity or dynamic range.
The DECTRIS ARINA retractable, electron-counting detector is designed to handle 4D STEM applications. It features a new ASIC and combines an extreme speed of up to 120,000 frames per second with a noise-free readout and a high dynamic range. This allows superior-quality data acquisition at the conventional speed of a traditional STEM measurement.
Owing to DECTRIS’ hybrid-pixel technology, ARINA can utilize various sensor materials and runs optimally in the entire energy range from 30 to 300 keV.
DECTRIS ARINA is ideal for a wide range of 4D STEM applications with dwell times lower than 10 μs, spanning from crystalline phases and orientation mapping to ptychography, including versatile STEM image reconstruction using virtual detectors.
- Flexible: Comprising silicon (Si) or high-Z sensor materials, DECTRIS ARINA encompasses an extensive range of energies from 30 to 300 keV.
- Rapid and sensitive: The DECTRIS ARINA can count every single electron—up to 10 pA/pixel even at a frame rate of 120 kHz.
- Empowering: The DECTRIS team, comprising engineers and scientists, is ready to assist users in obtaining the maximum from their setup.
Get Up To Speed
Meet DECTRIS ARINA: A Hybrid-Pixel Electron Detector for Advanced 4D STEM Applications
Video Credit: Dectris Ltd.
Detector Specifications
Source: Dectris Ltd.
| . |
. |
| Number of pixels (W x H) |
192 x 192 |
| Active area (W x H) [mm²] |
20 x 20 |
| Pixel size (W x H) [µm²] |
100 x 100 |
| Sensor material |
Silicon (Si) or high-Z |
| Energy range [keV] |
30 - 300 |
| Frame rate (max.) [Hz] |
120,000 |
| Count rate (max.) [el/s/pixel] |
108 |
| Detective Quantum Efficiency, DQE(0) |
at 80 keV - 0.82 | at 200 keV - 0.75 | at 300 keV - 0.75 |
| Detector mounting |
Retractable |
*All specifications are subject to change without notice.
Novena Software
NOVENA, developed by eisTools for DECTRIS, presents a swift and user-friendly solution for visualizing and analyzing extensive 4D STEM datasets produced by the ARINA electron-counting detector. Its intuitive interface allows users to effortlessly define virtual detectors and calculate Center-of-Mass and Differential-Phase-Contrast images
Image Credit: Dectris Ltd.
Techniques
Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM)
Image Credit: Dectris Ltd.
Users can gather 4D STEM data of the maximum quality with the precise and dependable electron-counting detectors from DECTRIS.