Featured Equipment
Malvern offers a modular multi-angle light scattering detector called Viscotek SEC-MALS 20. The system can be utilized to calculate the absolute molecular weight of synthetic and natural polymers, proteins, as well as the molecular size over the broadest possible range.
ibss Group, in association with a plasma source inventor, has designed a sophisticated in situ Asher dubbed GV10x DS.
LUMOS is a fully automated stand-alone FT-IR microscope. It combines best performance for visual inspection and infrared spectral analysis of micro samples with highest comfort in use.
The Thermo Scientific™ DXR™xi Raman Imaging Microscope is an excellent instrument to rapidly scan the complete sample area and easily find what you are actually searching for such as defects, contaminants, target particles.
Electron beam evaporation is used to provide a vapor stream from materials commonly difficult to evaporate with standard thermal techniques.
The Phenom Pro is Phenom-World’s high-end imaging desktop SEM. In combination with a large range of sample-holders and automated system software, it can be tailored to suit a multitude of applications.
Other Equipment
The Spectra-Physics Solstice® Ace™ is a high-energy, ultrafast amplifier that is integrated with performance specifications of the Spitfire® Ace™ to enhance product reliability, output stability, and performance.
Freshly cleaved ruby muscovite mica surfaces are highly even and flat. They are also quite transparent and free from scratches and contamination. Cleaved mica is conventionally used in electron microscopy for the production of carbon support films, cell growing and thin film coating research.
The XploRA ONE is an advanced Raman microscope specifically designed for industrial and analytical sectors.
Agar GO support films are manufactured in the company’s laboratories by a unique application method, are hydrophilic and ideally suited to imaging of small nanoparticles, nanowires and suspensions.
The PSEM eXpress from Aspex Corp is a benchtop personal scanning electron microscope (PSEM) equipped with a Backscatter Electron Detector (BSED) and an optional Energy Dispersive Spectrometer (EDS). The eXpress is smaller and more cost-effective than traditional scanning electron microscopes. In addition it has a greater depth of field and greater resolution than a traditional optical microscope.
Agar Scientific offers a comprehensive range of high quality microscope slides. The glass is subject to rigid quality processes to ensure flatness without impurities or defects. Slides can be supplied pre- washed or polished with ground edges in boxes of 50. A range of labels and markers are also available.
The Gentle Asher offered by ibss Group has been specifically designed to expand the GV10x investment for sample cleaning prior to inserting into the EM chamber.
Nikon Eclipse MA200 Inverted Microscope from Buehler is optimized with high numerical aperture and excellent ergonomic efficiency for viewing samples mounted on flat surfaces.
Buehler can supply a range of consumables for sample preparation operations. Some of the products that they can supply include grinding discs, magnetically backed polishing pads, as well as SunMet Bundles which include everything you need for grinding and polishing samples.
Park XE7 is an advanced yet affordable research-grade atomic force microscope that comes with a variety of unique features. It allows flexible sample handling and enables users to conduct research on time and within budget.
The XE-Bio is an innovative yet user-friendly Atomic Force Microscope designed specifically for biomedical and other advanced life science research. The modular design of the XE-Bio provides the user with a wide array of imaging modes including the revolutionary Scanning Ion Conductance Microscopy (SICM) module.
Angstrom Advanced’s AA3000 Scanning Probe Microscope is customized for research and industry applications, where users have to carry out fast and simple analysis.
Agar Scientific offers a wide range of specimen stubs and mounts for microscopy, some of which are discussed.
Agar Scientific's range of polystyrene particles has been proven to be very good for SEM and TEM calibration purposes. It is possible to derive an internal standard of size by mixing a suitable concentration of these particles with the particles of unknown size being studied.
inVia Raman microscopes from Renishaw are high-sensitivity systems with integrated research grade microscopes, enabling high resolution confocal measurements. inVia Raman microscopes support multiple lasers, with automatic software switching of excitation wavelength.
The latest generation of QUANTAX EDS for SEM features a broad range of active areas from 10 to 100 mm² and slim line technology for the XFlash® 6 detector series.
Agar Scientific offers a range of sample preparation equipment for microscopy. These include pestle and mortar, pipettes, beakers, weighing boats, and much more.
VEGA3 LM from TESCAN is a fully PC controlled SEM designed to handle both high vacuum and low vacuum operations. It is provided with a traditional tungsten heated cathode, and allows 3D measurements on a reconstructed surface using 3D metrology software.
Two separate sample preparation techniques are combined by the FloVac Degasser into a single elegant solution. This stand alone device has six sample stations, each having individual control valves to help add or remove individual sample cells without interrupting the other samples in process.
Advanced Abrasives provides an extensive line of supplies needed for lapping and polishing in a variety of industries from the precision lapping of semiconductor wafers and lapping / polishing of optical lens elements, to the lapping of metal and ceramic components in industrial manufacturing.
Regardless of sample size, the Keysight 5600LS large-stage AFM is ready to deliver high-resolution results. The versatile 5600LS is the world's only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with an AFM & STM scanner.
The LensAFM from Nanosurf is a powerful add-on to optical microscopes or 3D profilometers.
The µSense-I/L Raman microscope system available from Enwave Optronics is a cost effective instrument and offers high performance microscopic Raman measurements. The system is reliable and can be easily used for routine Raman microscopy applications.
The SENTERRA is a high-performance Raman microscope spectrometer developed for highly challenging analytical and research applications.
The U-eLektron Ebeam system was designed to provide a research and development oriented solution to labs of any size. As a bench top tool, the U-eLektron can provide immediate results without the cost or time required for external testing.
Advanced Abrasives manufactures superabrasive diamond and cBN powders in sizes extending down into the sub-micron/nanometer particle size range.
The SynthWAVE model by Milestone, a global leader in the field of microwave-based sample prep technology is a synthetic microwave that will fit on any benchtop in even the smallest lab.
Carl Zeiss offers Shuttle & Find which is a correlative microscopy interface for light and electron microscopes and is suitable for materials analysis.
Agar Scientific offer a wide range of grids for SEM and TEM. Standard grade grids are offered in nickel, gold or copper, or in copper with one side flash coated with palladium for identification purposes. Agar's range of grids includes rectangular, square and parallel bar mesh grids, along with a several more specialist grid types.
The Inspire™ AFM-based IR nanocharacterization system developed by Bruker allows highest resolution nanoscale chemical and properties mapping with exceptional AFM performance.
WITec's new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image.
WITec has designed a sophisticated and reliable scanning near-field optical microscope called alpha300 S. The instrument includes an atomic force microscope (AFM, ), a scanning near-field optical microscope (SNOM), and a confocal microscope (CM) in a single instrument. Users can select AFM, CM or SNOM by simply rotating the objective turret.
The GeoSpec 2 NMR Core Analyser is designed specifically for studies of core samples from oilfield reservoirs. GeoSpec 2 is the industry standard with installations in almost every major oil producer and SCAL laboratory world-wide.
The AM 300 is a simple to use scanning acoustic microscope for advanced industry quality control and research. It is a cost-effective tool enabling non destructive acoustic investigations using new rf and transducer technologies of up to 400 MHz.
The 300 kV HF-3300 TEM/STEM is a combination of cold field emission gun (CFEG) technology pioneered by Hitachi with novel functions such as parallel nanobeam electron diffraction, spatially-resolved EELS, and double-biprism electron holography.
The SKP5050 with RHC020 is the ideal Kelvin Probe system for researches looking to investigate samples in a controlled atmosphere with the option of increasing sample temperatures up to 90°C.This system includes everything the researcher needs to produce reliable, repeatable results, due to the unique features provided by the ‘Baikie System’.
Omniprobe lift-out grids are designed specifically to accept TEM lamellae milled by FIB or SEM/FIB systems. The grids are 25 - 30µm thick, with posts engineered such that consistent attachment of lamellae is enabled while providing an un-obscured view of each section. All grids are 3mm diameter.
The MFP-3D-BIO offers excellent sensitivity and highly accurate images and measurements possible on an inverted optical platform.
The K975X Turbo Evaporator available from Quorum Technologies is a multiple application system designed for vacuum deposition of thin layers of metals and carbon.
SciAps has designed an advanced hand-held Raman analyzer called InspectorSCOPE. This benchtop unit offers a unique combination of a handheld Raman analyzer which docks seamlessly to a digital camera and microscope, thus making it suitable for both laboratory applications and bulk material analysis in the field.
The Carl Zeiss ORION® PLUS Helium ion microscope is a dramatic new break-through in microscopy, delivering images with never-before seen ultra-high resolution and material contrast, with five times better depth of field. The ZEISS ORION® PLUS microscope is based on the revolutionary, atomic-sized, ALIS gas field ion source.
EVOLUTION I is a simple to use scanning acoustic microscope for advanced industry quality control and research. It is a cost-effective tool enabling non destructive acoustic investigations using new rf and transducer technologies of up to 100 MHz, optionally up to 230 MHz.
NT-MDT’s Titanium is an advanced atomic force microscope (AFM) that comes with the new Revolution cartridge with multi-probe technology for automatic replacement of cantilevers. Cantilever exchange makes system adjustment fast and easy for users.
An element of consistency is introduced into the PIKE Auto-CrushIR microprocessor controlled automated hydraulic press applications such as thin film and pellet making.
The FEI Quanta family includes six variable-pressure and environmental scanning electron microscopes (ESEM), all of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.
NT-MDT offers SPECTRUM, a fully automated AFM- Raman-SNOM system that combines AFM with multiple optical techniques such as TERS, SNOM and confocal Raman/fluorescence microscopy.
The world's first extreme high-resolution (XHR) SEM, the FEI® Magellan™ 400L system delivers unmatched surface-sensitive imaging performance at sub-nanometer resolution, without compromising the analytical capabilities, sample flexibility or ease of use of a traditional analytical SEM. New and innovative electron-optical elements together with field-proven, industry-leading stage technology deliver breathtaking performance and rock-solid reliability.
SAM 400 QUAD is a high performance tool enabling non destructive acoustic investigations for high throughput analysis, quality control and research applications. It features a new high speed linear motion scanner and new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface.
Asylum’s MFP Nanoindenter is a true instrumented indenter and is the first AFM-based indenter not using cantilevers as part of the indenting mechanism.
The RamanScopeIII is a high performance FT-Raman microscope designed for the microanalysis of samples in research and development.
EDAX's Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM) offers the crucial analytical solution for TEM applications.
Hitachi’s AFM5300E is an environmentally-controlled atomic force microscope (AFM) that allows observations under different conditions and enables surface measurements in liquid, air, or under vacuum environment.
The Bruker Innova Atomic Force Microscope offers a wide range of functionality for the physical, life, and material science industries.
Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and affordably-priced.
The Phenom ProX desktop SEM is the ultimate all-in-one imaging and X-ray analysis system. With the ProX, sample structures can be physically examined and their elemental composition determined.
Uniscan Instruments offers M370 Scanning Electrochemical Workstation which is designed to deliver spatially resolved, non-contact, ultra-high resolution electrochemical measurements.
Optotune's LSR series of transmissive laser speckle reducers allows you to significantly reduce the speckle noise of laser systems. Local interferences are removed by dynamically diffusing the coherent beam.
The MIRA3 LM is a PC-controlled FE SEM manufactured by TESCAN and provides customers flicker-free digital image with excellent clarity and superior optical properties. This instrument can be adapted for both high vacuum and low vacuum operations.
Rapidly becoming the industry standard in many areas, Sheen Instruments Automatic Panel Sprayers have been developed with the co-operation of end users to ensure the product meets the exacting quality standards of the industries using them.
Every sample has its own specific demands. The shape of some samples requires flexible manipulation to obtain optimum imaging results. Samples can contain lines, holes, multi-layer structures or other specific features.
Based on the popular Easyscan 2 STM tool, the NaioSTM is integrated with controller and scan head in a single device for convenient use, installation, and transportation.
The K1050X Plasma Etcher/Asher/Cleaner available from Quorum Technologies is an advanced, solid-state RF plasma barrel reactor specifically designed to meet the needs of research and development and small-scale production for a variety of plasma ashing, plasma etching and plasma cleaning applications.
Agar Scientific offers a broad variety of high quality disc apertures and thin foil apertures to be used in focus ion beam, electron microscope, microprobe and X-ray systems. Precision drilled holes are used to manufacture disc apertures to tight tolerances.
The BM4 microscope from Micron Optical has a flexible design which makes it ideal for use in research applications and medical laboratories.
A high quality metallurgical microscope equipped with a trinocular head ready for the attachment of a digital camera. This microscope includes a full set of high quality plan achromatic metallurgical objectives on a modern reversed objective turret. Specimens can placed on the mechanical stage with ergonomically positioned controls for XY stage and focus control.
The ONH836 Oxygen/Nitrogen/Hydrogen Elemental Analyzer is designed by Leco Corporation for measuring the content of nitrogen, oxygen, and hydrogen in ferrous and non-ferrous alloys, inorganic materials, and refractory materials using the inert gas fusion technique.
The SS-200 from Leco Corporation is a variable-speed grinder/polisher with simple operation suitable for low- or medium-volume laboratories.
A scanning electron microscope’s tightly focused electron beam behaves like a radiating dipole source at the electron impact position.
Now, Asylum Research introduces the Cypher ES™, which adds full environmental control to the Cypher family.
Agar Scientific's series of liquid nitrogen Dewars, based on a proven design and construction, offer a wide range of capacities to suit individual laboratory storage and liquid nitrogen handling requirements.
Keyence are proud to introduce the VHX-1000: a digital Microscope that not only integrates advanced functionality into a streamlined, all-in-one unit, but truly launches microscopy into the next generation.
The Keyence VW6000 Motion Analysis Microscope is capable of high-speed motion recording of up to 24,000 fps. This enables accurate filming of high-speed motion which conventional microscopes cannot capture.
The P100 AFM from Ardic Instruments is ideal for high resolution measurement and imaging as it has a sub-nanometer Z-axis resolution. Ardic's unique astigmatic optical design produces a small 0.56µm laser spot size, permitting users to experiment with smaller and faster AFM cantilevers.
WITec’s RISE microscope integrates the alpha300 confocal Raman imaging and all the features of a stand-alone scanning electron microscope (SEM) in a single instrument. Through RISE microscopy, ultra-structural surface properties can be connected to molecular compound data.
The ANKOM2000 Fibre Analyzer has been subjected to rigorous testing over a broad range of sample types, and is used by ANKOM for the NFTA and AAFCO check sample programs. The ANKOM2000 Fibre Analyzer provides increased automation to enhance laboratory operations and reduce labour costs. Automation eliminates chemical and hot water handling. The Instrument requires very little space.
The Spero developed by Daylight Solutions is a purpose bulilt fully integrated high spatial resolution high throughput Mid Infrared rapid imaging microscopy system. Spero incorporates Quantum Cascade Laser technologies and provides full frame, real-time imaging capabilities previously unavailable with bench top instrumentation.
The CRAIC Apollo Raman spectrometer is ideal for metrology, research and inspection of microscopic sampling areas by Raman spectroscopy. It is suited metrology, research and inspection of microscopic sampling areas by Raman spectroscopy.
Lapping film is available from Advanced Abrasives as rectangular sheets, discs, belts and rolls in a variety of format sizes, abrasive sizes and abrasive types on high-quality polyester film of 3 mil (76µm) standard thickness.
The SAM-255 workstation is now available with IntelliTemp Infrared temperature control enabling rapid drying of all types of samples.
Navitar offers Precise Eye lenses that are specifically designed to deliver high vibration stability and excellent optical performance in contrast to other traditional C-mount video lenses.
In combination with the Phenom desktop SEM, the Fibermetric application allows you to produce accurate size information from micro and nano fiber samples.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.
Axio Observer is an inverted microscope platform for materials research. It is suitable for automized scanning and imaging of non-metallic inclusions in steel.
TESCAN offers TIMA, a fully-automated, high throughput SEM that measures parameters like size-by-size liberation, mineral association, and modal abundance in minerals processing and mining industries.
The FEI Morgagni 268 transmission electron microscope available from Technical Sales Solutions (TSS) provides 0.45nm point-to-point resolution and offers excellent image quality for chemical, biological, and pharmaceutical applications.
The surface properties of TEM support films will be modified by a glow discharge treatment with a specific gas atmosphere to optimize the adsorption of the solutions to be spread.
Technical Sales Solutions (TSS) offers the Hitachi 5200 high-resolution scanning electron microscope that comes with a number of features, such as SEM, detectors, Win NT software, and TMP with mechanical RP.
Photon etc. offers an ultrafast hyperspectral imager called RIMA NANO. This state-of-the-art Raman imager comes with a range of excitation wavelengths and is suitable for analyzing nanomaterials from graphene to carbon nanotubes.
The ESPM 3D is a specialized atomic force microscope designed for biological, material science and nanoscience applications. Its design allows for stand alone applications as well as easy intregation with other instruments such as confocal microscopes, spectral confocal microscopes, inverted optical microscopes, laser traps and other optical instruments. In addition, our scientists can help you to custom integrate or design a scanning probe microscope system that is specific to your application or group, saving you precious time and resources.
The SIGMA, featuring the unique and proven GEMINI® technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS).
The Temperature Controlled Sample Holder is able to control the temperature by cooling or heating the sample and therefore influence the humidity around it. This minimizes the charging effect of the electron beam and vacuum damage to the sample.
The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility.
The Solver NANO atomic force microscope supplied by NT-MDT is specifically designed for research and education purposes.
NT-MDT has introduced an advanced scanning probe microscope called NTEGRA Aura. The instrument is particularly designed for carrying out research in external magnetic fields, low vacuum, and controlled environment conditions.
The Hitachi IM4000 Ar ion milling system renders two milling configurations in one instrument.
Tescan’s LYRA3 XM is a Schottky field emission cathode integrated SEM that is fully controlled by PC. It is combined with gallium Focused Ion Beam (FIB) column and an optional Gas Injection System (GIS).
Agar Scientific offers a wide selection of high quality tweezers manufactured by Dumont, Switzerland.
Agar Scientific specializes in providing a wide range of specimens specifically for TEM calibration where high resolution results or quantification are required. Agar calibration specimens are famous globally for their quality and reliability, and each one undergoes extensive quality checking prior to shipping.
Axio Imager 2 is a future-oriented imaging platform which is suitable for use in material applications and biomedical sciences. It is suitable for correlative microscopy workflow and particle analysis.
Sample surfaces are coated with hydrocarbon contamination because of sample preparation or due to storage.
Quantachrome's Sieving Riffler is developed for handling large powder quantities when compared to the rotary micro riffler. Furthermore, particles larger than a specific size or foreign bodies can be excluded from the riffling process by attaching a sieve to the top of the hopper.
The alpha300 R provides a still unmatched level of Confocal Raman Imaging capabilities focusing on high resolution as well as high speed spectrum and image acquisition.
Spectra-Physics’ Mai Tai® DeepSee™ Ti:Sapphire oscillator is integrated with the company’s patented automated dispersion compensation to exclusively enable optimal usage in multiphoton microscopy.
Quantachrome's Rotary Micro Riffler divides easily and automatically large samples into eight smaller representative samples for analysis. It is possible to obtain the final desired size by repetitive division of the collected smaller representative samples.
The AbrasiMatic 300 Abrasive Cutter is a bench-top cutter featuring manual cutting action in 3 directions or automated cutting in 1 direction. This gives the user the maximum versatility to section a wide variety of sample materials, sizes and geometries. It is engineered with innovative capabilities to be used in both production support and laboratory environments.
The Q300TD dual target sputter coating system supplied by Quorum Technologies is a fully automatic unit designed for conductive coating of scanning electron microscopy (SEM) specimens and for thin film applications.
The Cypher AFM/SPM from Asylum Research is the first totally new small sample AFM/SPM in over a decade. The all new design gives the Cypher increased capabilities, more control, more functionality, more modularity, and more resolution – all with striking ease of use.
Imina Technologies has introduced miBot™ BT-11, a mobile micro-robot designed to perform different manipulation, sensing and positioning tasks at micro and nano scales.
The Olympus BLISS HD system advances the field of clinical digital imaging with the introduction of high-definition virtual microscopy. Bringing together the technology and software from Bacus Laboratories with Olympus’ advanced optical expertise, BLISS HD delivers superior, high- resolution virtual slide images, automatically, with push-button simplicity.
Superabrasive diamond and cubic boron nitride (cBN) powders produced by Advanced Abrasives, a leading superabrasive micronizer, are superior in quality and lot to lot consistency with particle sizes ranging from of 25nm up to and including the mesh region.
The Phenom Pure desktop SEM is an ideal tool for the transition from light optical to electron microscopes. It is the most economical solution for high-resolution imaging, providing the best imaging results in its class.
The Titan™ ETEM is the ultimate in situ high resolution electron microscope to study dynamic behavior of chemical reactions under the influence of variable temperatures and gas pressures at the atomic level.
The MFP-3D Origin™ combines affordability and performance in the Asylum Research MFP-3D™ AFM family.
The NX20 atomic force microscope (AFM) available from Park Systems is a highly accurate instrument designed for the hard disk and semiconductor industry.
Advanced Abrasives offers an extensive range of alumina powders and suspensions of superior quality in a variety of abrasive size choices.
The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.
HORIBA Scientific has introduced new, advanced LabRAM HR Evolution systems that are suitable for both macro and micro measurements.
The variable pressure SEM, Hitachi S-3700N has a specimen chamber that can handle specimen sizes up to 300mm in diameter and 110mm in height at analytical working distance of 10mm.
Advanced Abrasives provides a variety of very competitive, high-quality metallographic grinding and polishing consumables.
Agar Scientific supplies uniform polystyrene particles from Nanospheres for size calibration and quantification in electron microscopy applications.
Holey carbon films have a number of uses in microscopy when the mesh sizes of standard TEM grids are too large to support the sample, and continuous carbon thin films can ineastically scatter electrons, contributing to background noise.
The ICAM scanning acoustic microscope is a high speed, fully digital and integrated system designed for rapid non-destructive inspection of integrated circuit (IC) packages and similar parts. It can be used in development, production and failure analysis situations to give repeatable and detailed information on internal features, showing the presence of manufacturing, processing and in-service defects.
Olympus' MX61L/ MX61 semiconductor inspection microscope offers excellent clarity and image resolution using observation techniques such as infrared, fluorescence, differential interference contrast (DIC), dark-field and bright-field. It consists of specially designed IR objective lenses for imaging defects below the glass/silicon surface.
The PSEM platform has been in the market for more than twenty years providing solutions in a variety of industries, including forensics, health sciences, industrial automation, and metals. The newest generation, the PSEM eXplorer from Aspex Corp, is a small footprint Scanning Electron Microscope integrated with liquid-nitrogen-free energy dispersive spectrometers, all possible due to the Perception Software Suite for both automated and manual analysis.
Initially colloidal gold was introduced as a cytochemical marker for TEM in 1971 by Faulk and Taylor, and has become the universally accepted label of choice for electron microscope immunocytochemistry applications and detection of cellular and subcellular macromolecules.
BioTools has introduced a new family of portable Raman microscopes - µ-Raman and µ-BioRaman, designed for examining particles, liquids, contaminants and biological substances such as fibers and proteins.
Hitachi offers the SU5000 Schottky field-emission SEM that has redefined SEM operation. The EM Wizard is an advanced computer-assisted technology that provides a new level of SEM operation and control.
The Optical Micrometer available from Taber Industries is capable of making non-contact measurements on flat or curved surfaces. This portable instrument has a robust housing and easy-to-read vernier scale.
The Keysight 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Keysight Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.
Clemex Powder Disperser is a free-flowing, dry powder disperser used for un-clustering particles so that they may be observed easily and measured on glass slides for Image Analysis by optical microscopy.
With the compact MiniMill 2, samples can be ground at low cost with a high degree of reproducibility. The bench-top MiniMill 2 is based on the principle of planetary ball mills with just one grinding bowl holder. Grinding bowl in sizes 80 - 500ml. speeds of up to 600rpm, new electronic system with timer and programmable reversing unit, short grinding times and high fineness ratings make the MiniMill 2 an ideal sample preparation tool for subsequent spectro-analytical work.
FRITSCH Planetary Mills classic line are ideal for fast and loss-free grinding from a few milligrams to several kilograms at a wide range of fineness levels down to less than 1 µm – dry or in suspension – absolutely reliable, easy to operate and to clean!
The BioCell from BioTools is an easy-to-use CaF2 cell that is compatible with any kind of FT-IR spectrometers to carry out water-based experiments.
Agar Scientific offers safety equipment and PPE for microscopy purposes, including goggles, fasemasks, aprons, and hand protectors.
The CHI900B Scanning Electrochemical Microscope consists of a digital function generator, a bipotentiostat, high resolution data acquisition circuitry, a three dimensional nanopositioner, and a sample and cell holder. The CHI900B is designed for scanning electrochemical microscopy, but many conventional electrochemical techniques are also integrated for convenience.
The FEI Morgagni 268(D) provides a great value-for-the-money transmission electron microscope (TEM) that is adaptable, easy-to-use and delivers excellent image quality.
Park Systems offers the NX10 atomic force microscope that is specifically designed for nanotechnology research. The system generates data which users can reproduce and publish at high nano resolution.
PremaSol CS colloidal silica suspensions from Advanced Abrasives contain spherical silica particles in an alkaline (pH 9–11) base formulated to resist drying and reduce the possibility of re-crystallization.
The Zwick 7140 specimen grinder enables work-hardened areas of the specimen to be ground off quickly and economically. Grinding is performed in the tensile direction so that machining marks have no effect on the test result. The grinder can be used to machine a wide range of specimen shapes.
The HD-2700 dedicated STEM features the Hitachi developed spherical aberration correction system affording unmatched resolution and analytical sensitivity.
The Zeta-20 enables analysis and imaging of surface characteristics on all kinds of samples, namely low reflectivity to high reflectivity, smooth to rough and transparent to opaque based on the proprietary ZDot™ technology.
The DXR Raman Microscope from Thermo Scientific offers point and shoot Raman microscopy with superior sensitivity and spatial resolution for functional applications.
The SECM370 is a precision scanning ultra micro-electrode system which provides information on the electrochemical characteristics of a material at high spatial resolutions.
Agar Scientific offers a large number of scanning electron microscope calibration standards.
The WITec alpha500 is the first instrument on the market to combine Confocal Raman Microscopy for 3-D Chemical Imaging and Atomic Force Microscopy for high resolution structural imaging in an automated system.
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of applications to be performed easily.
MSX255M models are ideal for creating medium-sized sections from automotive, ceramics, and composite parts; 12-inch blade capacity; 5.4 HP motor.
MMR Technologies’ variable temperature micro probe systems (VTMPs) and low temperature micro probe systems (LTMPs) are designed to provide measurements of semiconductor materials such as amorphous silicon, gallium arsenide, mercury cadmium telluride or others across a broad temperature range of 70K to 730K.
Carl Zeiss has launched an advanced 3-in-1 multibeam ion microscope for sub-10nm nanostructuring.
Agar filaments are fabricated with specially developed jigs that ensure reproducibility and accuracy in production.
Hitachi has introduced a new SPM controller that provides automated wizard navigation for simple and intuitive operation. This versatile SPM controller provides high resolution and allows observation of complex surfaces simply at the click of a button.
APE Research's TriA-SNOM microscope is capable of collecting optical signals in reflection, transmission and back-reflection modes. The instrument is suitable for surface science, optics and biological applications. Tri-SNOM is a microscope that allows the acquisition of three different and simultaneous optical signals, in addition to the topography of the sample.
AURIGA® the new CrossBeam® Workstation (FIB-SEM) from Carl Zeiss SMT exactly delivers all this – on a nanoscopic scale. Using the best-in-class FIB column and the proprietary GEMINI e-Beam column from Carl Zeiss, together with a completely new designed vacuum chamber for advanced analytics, AURIGA® assists you in obtaining the maximum information possible out of your sample.
Agar Scientific offers a range of complete nano tool systems that can be integrated into most commercially available FIBs and SEMs
The K2000 Digital Temperature Controller is a convenient device that provides flexibility to conduct experiments using the cryogenic cooling and Joule-Thompson thermal stage systems of MMR Technologies.
Presently test pieces from metal foils and steel sheets are economically and accurately produced using specimen blanking machines. Standards such as ASTM A370, EN 10002 and BS 18 stipulate that test results must not be influenced by any material change caused by work-hardening in the specimen edge zone.
Designed to deliver an SPM platform which can grow and adapt to changing research needs, the Ambios Q-ScopeTM delivers long-term value as well as excellent imaging performance and high resolution measurements. Our modular approach to building your system minimizes cost, offers maximum flexibility, and allows custom configurations for special applications. Electronic control signal levels are available to all users via back-panel BNC access.
PremaLox C is a 99.95% pure cerium oxide powder from Advanced Abrasives. It is white in color and suitable for precision polishing of optical glass and ophthalmic lenses.
The H-9500 300 kV transmission electron microscope is designed for supporting research on polymeric materials and solid state materials.
NT-MDT’s NTEGRA Spectra combines the full power of confocal Raman and fluorescence microscopy, atomic force microscopy, and scanning near-field optical microscopy in a single instrument.
The UVM-1™ microscope from CRAIC Technologies: A system designed to make imaging of microscopic samples fast and simple. Operating from the deep ultraviolet to the near infrared , the UVM-1™ is designed to push the limits of research as well as providing fast, reliable operation for industry.
Bruker’s BioScope Resolve™ is an advanced atomic force microscope that features high resolution biological imaging and complete cell mechanics capabilities for use with inverted optical microscopes.
Leco offers the PR-36 sample mounting press that can be used for single as well as dual sample mounting. The mounting press, combined with its easy desktop style and lightweight, compact design, is ideal for laboratories that are looking for high performance and long-lasting mounting press.
Agar Scientific offers a range of vacuum coating units that offer the user options to suit all the sputter coating requirements required in support of TEM and SEM applications. These compact bench-top coating units are designed to a high specification and employ microprocessor technology.
The PR4X mounting press creates high-quality samples efficiently and easily. Advanced features include a digital interface with durable stainless steel keypad, an easy-to-read fluorescent display, a unique face-sealing closure system (just push the upper unit away and remove your sample), and complete modularity. Other features include four interchangeable mold sizes, and a low 15-inch working height.
Boron Carbide (B4C) Powder from Advanced Abrasives with a Mohs hardness of 9.5 is almost as hard as cubic boron nitride (cBN) and so serves as a lower cost alternative abrasive to both diamond and to cBN.
For applications requiring large evaporation materials inventory (e.g. multiple or thick layers, extended throw distances) the Model 295 Source provides a wide range of crucible sizes including 6x100cc, 16x15cc, 10x40cc, and a 1486cc trough. Available in 10Kw or 15Kw versions, with Arc-Suppression available as an option.
The P300 Atomic Force Microscope manufactured by Ardic Instruments is a highly modular device that can be adapted for various experimental needs in the materials domain.
Agar Scientific offers a range of containers for microscopy slides and samples. Agar offers high-impact smooth ABS injection molded boxes, which are compact, durable and indexed and offer good microscope slide protection for the histology laboratory.
The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.
The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors.
The Hitachi AFM5100N is a general-purpose atomic force microscope (AFM) integrated with a high-resolution sensor lever for manual operation. Unlike traditional models, the internal sensor lever of the AFM is large and easy to install and operate.
The SC7620 sputter coater available from Quorum Technologies is a compact, low-cost sputter coater developed for SEM samples.
FERA3 XM from Tescan is a fully automated SEM integrated with Schottky field emission cathode, Xe plasma focused ion beam (i-FIB) column, and an optional gas injection system (GIS).
The Ergonom 3000 series provide the same features like depth of field, colour contrast, etc, yet with a maximum resolution of 200nm (incident, 300nm transmitted light). Ideal for doctors, practitioners, etc. who need to see more than is possible with bright and darkfield, yet do not need 100nm resolutions.
The combined Raman/ atomic force microscope (AFM) system is ideal for characterization of material properties at sub-micrometre, and potentially nanometre scales.
NT-MDT offers a fully automated atomic force microscope called LIFE. Integrated with inverted light microscope, the instrument can be used in medical, biology, food and pharmaceutical research.
Agar Scientific offers a wide range of tools for microscopy sample preparation. Available products include a wide range of laboratory tweezers, individually or in sets.
To maximize sample throughput, the DIL 803/803L offers two-sample simultaneous operation in a horizontal dilatometer. The DIL803/803L can also be operated with an inert reference sample for differential measurement, reducing the influence of measurement system expansion and increasing measurement accuracy under dynamic temperature conditions.
JEBG Series / High Power Electron Beam Sources are designed to uniformly deposit metal oxides onto wide plastic films or steel plates in a continuous feed such as in magnetic tape manufacture for high-density recording or in wrapping-film manufacture with an oxide barrier function. Electron beam sources are also used for depositing of MgO film on plasma display panels and for development of surface-treated steel plates. Electron beam sources are also used for the melting of high-melting-point materials and high-purity metals.
NT-MDT has introduced NEXT, an advanced atomic force microscope that allows multiple AFM and STM capabilities and delivers unparalleled performance.
Micron Optical’s BM3 microscope is designed with extraordinary features that provide high-quality performance at an affordable cost.
Sample preparation is an essential stage in the analysis process. Methodology is highly dependent upon sample type: rocks and ore, cement, clinker or slag for example. With the innovative, cost-effective Eagon 2 system, PANalytical brings the advantages of a high-performance, fully automated fusion instrument for fused bead sample preparation to all users.
Bruker’s Dimension Icon AFM (atomic force microscope) offers excellent resolution, reliability and productivity, whilst maintaining the highest level of expandability.
Technical Sales Solutions (TSS) offers the Tecnai G2 F30 S/TEM S-Twin, which is an advanced scanning transmission electron microscope with 0.20nm point-to-point resolution.
VITA technology adds high resolution nanoscale thermal characterization capabilities to Bruker's Dimension® Icon® AFM, Dimension Edge AFM, and MultiMode® 8 SPM.
With the help of specimen blanking machines, test pieces from metal foils and steel sheets are economically produced and also accurately using specimen blanking machines.
For both the Phenom™ Pure and Phenom Pro, a large variety of sample holders is available in order to extend the sample acceptance. These holders are designed for optimizing sample loading speed and guarantee the fastest time to image available in the market.
Spectra-Physics’ Spirit® ultrafast amplifier is an innovative flexible laser that is integrated with direct diode pumping technology. The Spirit’s design enables excellent power and beam pointing stability which in turn ensures high accuracy and reproducibility in material processing.
Anasys’ nanoIR2 AFM-based IR spectrometer is a powerful, full featured AFM that expands nanoscale IR to a wide range of real world samples.
System developed to automate the time consuming dosing, boiling and fitration steps required in crude fibre, ADF and NDF analysis.
Nanosurf offers FluidFM, a powerful and advanced fluid force microscope that combines AFM and nanofluidics.
The LEAP 4000X HR is a high performance 3D atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom by atom identification and accurate spatial positioning. The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample.
Agar Scientific offers a range of stub storage boxes and tabs. These include tubes for the storage and transportation of SEM specimens, which are developed to hold the stub firmly in the tube base.
Finder grids offer a simple mechanism for determining the exact position of points of interest within a specimen, speeding up otherwise time consuming relocation of features at high magnification. Diameter is 3.05 mm. They are normally packed in tubes of 100 unless otherwise specified.
NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.
The FEI Talos™ is a 200kV scanning/transmission electron microscope (S/TEM) that delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions. Designed from the ground up to be an entirely new TEM experience, FEI’s Talos F200 accelerates nanoscale discovery for everyone by delivering high quality S/TEM images and fast analytical data acquisition — all from an easy to use, automated operating platform.
Hitachi’s TM3030Plus Tabletop scanning electron microscope (SEM) features a highly sensitive, low-vacuum secondary electron detector that reveals detailed information about sample surfaces.
Advanced Abrasives Corporation manufactures a broad selection of superabrasive diamond suspensions, slurries and compounds (pastes) from their own high quality milled powders in monocrystalline and in polycrystalline diamond types.
FRITSCH Cutting Mills are the ideal, time-saving assistants in the comminution of soft to medium-hard as well as fibrous or also tough materials. They are indispensable in the areas of plastics, textiles, agriculture and forestry, environment, construction materials, chemistry, foodstuffs, analytic and sample preparation for RoHS analysis.
The FEI DualBeam 235 Focus Ion Beam (FIB) system offered by Technical Sales Solutions (TSS) is a combination of a high-resolution field emission scanning electron microscope and a scanning metal ion beam microscope.
The MasterPrep is developed to offer users of the AUTOSORB, QUADRASORB™ SI and NOVA surface area and pore size analyzer series with high-throughput sample preparation.
Since its introduction in 2005, the Titan's superior product design and proven ability to deliver ground-breaking results have made it the preferred scanning/transmission electron microscope (S/TEM) of leading researchers around the world.
The HORIBA Scientific introduces the NEW generation analytical Raman Instrument - the LabRAM ARAMIS. Intelligent Automation provides easy computer controlled operation for quality control, analytical and research applications alike. It maintains the market leading flexibility and performance of the LabRAM series to provide the most comprehensive analytical tool available.
The DSX500i opto-digital microscope from Olympus is a high-resolution motorized scope that allows easy inspection of samples with 13x zoom optics. The instrument can be operated using a mouse or touch panel.
The TMA 801 operates in a vertical orientation, making it ideal for the analysis of sintering, RCS (rate controlled sintering), viscoelastic behavior and the determination of softening temperatures. The linear motor generates a constant throughout the experiment, ensuring that contact is maintained with the sample regardless of dimension change.
Agar Scientific offers dry mounting tissue, replacement cutting wheel for rotatrim trimmers, Kodak electron microscope film, photographic papers and many other photographic materials and accessories.
The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale.
The MFP-3D Infinity AFM available from Asylum Research is the latest and most advanced atomic force microscope in the MFP-3D series.
The Labpol 12 Auto Polisher/Grinder is an advanced design of Automatic Polisher/Grinder in which polishing or grinding protocols can be created as a program by entering the required parameters on a keypad and then stored for future use.
In the life science field, the SECOM platform can be used for quickly and easily combining electron and light microscopy.
Quorum Technologies supplies the PP3010T Cryo-SEM preparation system, which is a highly automated column-mounted, gas-cooled cryo preparation system ideal for most SEM, FE-SEM and FIB/SEM systems.
Alicona’s InfiniteFocusSL is an advanced optical measurement system that combines a 3D measurement system and surface finish measurement device in a single product.
The FEI Tecnai family of transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.
Transmission electron microscopes (TEM) can experience loss of image quality due to contamination in the beam or sample interaction area. Earlier, it was difficult to clean this part of the microscope and involved significant amount of cost and time.
NT-MDT offers a universal fully automated desktop atomic force microscope (AFM) called OPEN. Integrated with PX Ultra controller, the instrument provides a wide range of AFM measuring methods.
Navitar offers an advanced dual view lens system, which is exclusively designed for the thin film transistor (TFT) repair industry, but is also utilized for applications demanding a wide field of view range.
The Renishaw RA100 is a compact Raman system for process monitoring and bulk material analysis. It enables in situ Raman monitoring in the laboratory, pilot plant, or process line.
The Nanosurf Isostage is an advanced and compact active vibration isolation system that helps protect scans from vibration disturbances. It comes with Adapter Plates for Mobile S, Easyscan 2, and Nanite AFM systems, thus providing an ideal vibration isolation solution for all Nanosurf AFM systems.
Convenience, flexibility, and quality - all in one easy-to-use system. The GPX 300 from Leco delivers smoother, flatter samples and works in almost any environment. Whatever your grinding or polishing need may be, the GPX has you covered.
The HYPERION is the culmination of more than 25 years of experience in FT-IR microscopy. Its high-quality design, including all optical, mechanical, and electronic components, provides high stability and reliability.
Delphi is the first completely integrated solution in the world, which facilitates rapid correlative microscopy with distinct overlay precision.
The XE15 atomic force microscope available from Park Systems comes with a number of exclusive features, making it suitable for researchers performing multi variant experiments, shared labs handling a wide range of samples, and failure analysis engineers working on wafers.
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