Microscopes | Equipment

FluidFM - Fluid Force Microscope from Nanosurf

Nanosurf offers FluidFM, a powerful and advanced fluid force microscope that combines AFM and nanofluidics.

Motion Analysis Microscope - VW6000 from Keyence

The Keyence VW6000 Motion Analysis Microscope is capable of high-speed motion recording of up to 24,000 fps. This enables accurate filming of high-speed motion which conventional microscopes cannot capture.

Metallurgical Abrasive Cutter from Spectrographic

The MetCut 250 abrasive cutting machine available from Spectrographic is specifically designed for general cutting applications in the materials and metallurgical laboratory.

New XploRA Raman Microscope from HORIBA

NTEGRA Prima Atomic Force Microscope from NT-MDT

NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.

PSEM eXplorer - Integrated SEM/EDX System

The PSEM platform has been in the market for more than twenty years providing solutions in a variety of industries, including forensics, health sciences, industrial automation, and metals. The newest generation, the PSEM eXplorer from Aspex Corp, is a small footprint Scanning Electron Microscope integrated with liquid-nitrogen-free energy dispersive spectrometers, all possible due to the Perception Software Suite for both automated and manual analysis.

Transmission Electron Microscope H-9500 from Hitachi High-Technologies

Atomic resolution 300kV transmission electron microscope. Atomic resolution electron microscopy is becoming increasingly important and indispensable for the R&D of semiconductors and advanced materials where micro-fabrication technologies have entered into the sub-nanometer realm.

Raman Microscope – DXR SmartRaman from Thermo Scientific

Thermo Scientific DXR SmartRaman spectrometer is a push-button operated, highly automated, dedicated macro-sampling Raman system that incorporates Raman technology in the routine analysis laboratory.

The PSEM eXpress - Personal Scanning Electron Microscope from Aspex

The PSEM eXpress from Aspex Corp is a benchtop personal scanning electron microscope (PSEM) equipped with a Backscatter Electron Detector (BSED) and an optional Energy Dispersive Spectrometer (EDS). The eXpress is smaller and more cost-effective than traditional scanning electron microscopes. In addition it has a greater depth of field and greater resolution than a traditional optical microscope.

ANKOM 2000 Fiber Analyzer

The ANKOM2000 Fibre Analyzer has been subjected to rigorous testing over a broad range of sample types, and is used by ANKOM for the NFTA and AAFCO check sample programs. The ANKOM2000 Fibre Analyzer provides increased automation to enhance laboratory operations and reduce labour costs. Automation eliminates chemical and hot water handling. The Instrument requires very little space.

Nanonics Optometronic 4000

Nanonics carries nanophotonic characterization to new heights with The Optometronic™ 4000. Photonic and plasmonic characterization today requires multiple functionality in one platform that can be added transparently and with modularity. This singular platform integrates Nanonics' revolutionary Multiprobe Near-field Optical & Atomic Force Capabilities with Nanonics' State of the Art Lensed Fibers and Highly Compact Lensed Fiber NanoManipulators that bear the mark of excellence and innovation that is Nanonics.

alpha500 Confocal Raman Microscope with Automated 3-D Chemical Imaging and Surface Inspection from Witec

The WITec alpha500 is the first instrument on the market to combine Confocal Raman Microscopy for 3-D Chemical Imaging and Atomic Force Microscopy for high resolution structural imaging in an automated system.

New DIL 803/803L Two Sample Dilatometer By TA Instruments

To maximize sample throughput, the DIL 803/803L offers two-sample simultaneous operation in a horizontal dilatometer. The DIL803/803L can also be operated with an inert reference sample for differential measurement, reducing the influence of measurement system expansion and increasing measurement accuracy under dynamic temperature conditions.

New LabRAM HR Evolution Systems from HORIBA

HORIBA Scientific has introduced new, advanced LabRAM HR Evolution systems that are suitable for both macro and micro measurements.

Benchtop Sectioning Machine - MSX255 from Leco

MSX255M models are ideal for creating medium-sized sections from automotive, ceramics, and composite parts; 12-inch blade capacity; 5.4 HP motor.

Raman System for SEM Systems from Renishaw

The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.

Olympus Offers DSX100 Microscope with 16x Digital Zoom

The DSX100 from Olympus is a free angle wide zoom microscope that is designed for inspection and measurement applications.

5600LS Atomic Force Microscope (AFM) from Agilent Technologies

Regardless of sample size, the Agilent 5600LS large-stage AFM is ready to deliver high-resolution results. The versatile 5600LS is the world's only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with an AFM & STM scanner.

5420 Atomic Force Microscope(AFM) from Agilent

Based on the popular Agilent 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved electronics, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price.

6000ILM Atomic Force Microscope (AFM) from Agilent Technologies

The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope with those of an inverted light microscope or a confocal microscope, letting life science researchers go beyond the optical diffraction limit to achieve nanoscale resolution without any special sample preparation. It is ideal for studying cell membranes, the surface structure of cells, single DNA/RNA strands, individual proteins, single molecules, and biopolymers.

LensAFM - Atomic Force Microscope from Nanosurf

The LensAFM from Nanosurf is a powerful add-on to optical microscopes or 3D profilometers.

3000-A Binocular Microscope from JP Selecta

The JP Selecta 3000-A Binocular Microscope is a high specification optical microscope with superior resolution planachromatic optics. It features maximum versatility with a broad range of configurations. It has phase contrast and bright and dark field optics and is suitable for a wide range of applications.

AbrasiMatic® 300 Abrasive Cutter from Buehler

The AbrasiMatic 300 Abrasive Cutter is a bench-top cutter featuring manual cutting action in 3 directions or automated cutting in 1 direction. This gives the user the maximum versatility to section a wide variety of sample materials, sizes and geometries. It is engineered with innovative capabilities to be used in both production support and laboratory environments.

Axio Imager 2 from Carl Zeiss

Axio Imager 2 is a future-oriented imaging platform which is suitable for use in material applications and biomedical sciences. It is suitable for correlative microscopy workflow and particle analysis.

Abrasive Cut Off Machines - LECO MSX255 from Spectrographic

The LECO MSX255 series abrasive cut off machines from Spectrographic are designed to handle medium-sized sections such as automotive, ceramic, and composite materials (up to 12-inch/300 mm blade).

Olympus Offers Advanced MX Microscopes with Ergonomic Design Features

Olympus MX microscopes are highly efficient systems that offer four beneficial levels, such as quick start-up, failure analysis, smooth operation and expandability for users.

FT-IR Microscope - Hyperion from Bruker Optics

The HYPERION is the culmination of more than 25 years of experience in FT-IR microscopy. Its high-quality design, including all optical, mechanical, and electronic components, provides high stability and reliability.

Scanning Kelvin Probe with Relative Humidity Chamber RHC020 by KP Technology

The SKP5050 with RHC020 is the ideal Kelvin Probe system for researches looking to investigate samples in a controlled atmosphere with the option of increasing sample temperatures up to 90°C.This system includes everything the researcher needs to produce reliable, repeatable results, due to the unique features provided by the ‘Baikie System’.

Olympus BLISS High-Definition Virtual Microscopy System

The Olympus BLISS HD system advances the field of clinical digital imaging with the introduction of high-definition virtual microscopy. Bringing together the technology and software from Bacus Laboratories with Olympus’ advanced optical expertise, BLISS HD delivers superior, high- resolution virtual slide images, automatically, with push-button simplicity.

The RamanScopeIII Raman Microscope from Bruker Optics

The RamanScopeIII is a high performance FT-Raman microscope designed for the microanalysis of samples in research and development.

PVA TePla EVOLUTION I Scanning Acoustic Microscope

EVOLUTION I is a simple to use scanning acoustic microscope for advanced industry quality control and research. It is a cost-effective tool enabling non destructive acoustic investigations using new rf and transducer technologies of up to 100 MHz, optionally up to 230 MHz.

NaioSTM - Scanning Tunneling Microscope from Nanosurf

Nanosurf offers an advanced scanning tunneling microscope called NaioSTM, which is the successor to the popular Easyscan 2 STM tool.

Olympus AL120 Wafer Handler Series for Back-End Inspections

The AL120 wafer handler series available from Olympus is capable of transferring compound semiconductor and silicon wafers from the cassette to the microscope stage with improved flexibility.

HORIBA Introduces LabRAM INV Inverted Raman Microscope

HORIBA Unveils LabRAM HR UV-VIS-NIR Raman Microscope

HORIBA Introduces Advanced LabRAM IR FTIR Microscope

3000-C Plan Phase Contrast Binocular Microscope from JP Selecta

The JP Selecta 3000-C Plan Phase Contrast Binocular Microscope is a high specification optical microscope with superior resolution planachromatic optics. It features maximum versatility with a broad range of configurations. It has phase contrast and bright and dark field optics.

Titan ETEM Scanning Transmission Electron Microscope

The Titan™ ETEM is the ultimate in situ high resolution electron microscope to study dynamic behavior of chemical reactions under the influence of variable temperatures and gas pressures at the atomic level.

Ambios Q-Scope Series Atomic Force Microscope

Designed to deliver an SPM platform which can grow and adapt to changing research needs, the Ambios Q-ScopeTM delivers long-term value as well as excellent imaging performance and high resolution measurements. Our modular approach to building your system minimizes cost, offers maximum flexibility, and allows custom configurations for special applications. Electronic control signal levels are available to all users via back-panel BNC access.

NaniteAFM Atomic Force Microscope from Nanosurf

The Nanosurf NaniteAFM is a mountable AFM for industrial applications.

MiniMill 2 Sample Preparation System from PANalytical

With the compact MiniMill 2, samples can be ground at low cost with a high degree of reproducibility. The bench-top MiniMill 2 is based on the principle of planetary ball mills with just one grinding bowl holder. Grinding bowl in sizes 80 - 500ml. speeds of up to 600rpm, new electronic system with timer and programmable reversing unit, short grinding times and high fineness ratings make the MiniMill 2 an ideal sample preparation tool for subsequent spectro-analytical work.

LEXT OLS4000 3D Laser Measuring Microscope from Olympus

Olympus offers the LEXT OLS4000 3D Laser Measuring Microscope that is specifically designed for 3D measurement, nanometer level imaging and roughness measurement.

MTI Instruments SEMtester - Tensile, Compression, Bending and Fatigure Testing for AFM, SPM, SEM and Optical Microscopes

MTII/Fullam offers a unique, compact test system specifically designed to fit inside scanning electron microscopes. Capable of performing fatigue, compression, bending and tensile testing, they are ideal testers for researchers and material scientists. During testing, crack propagation, grain rotation and other effects of mechanical stress can be observed under high magnification in an electron microscope.

FEI Magellan 400L XHR Scanning Electron Microscope

The world's first extreme high-resolution (XHR) SEM, the FEI® Magellan™ 400L system delivers unmatched surface-sensitive imaging performance at sub-nanometer resolution, without compromising the analytical capabilities, sample flexibility or ease of use of a traditional analytical SEM. New and innovative electron-optical elements together with field-proven, industry-leading stage technology deliver breathtaking performance and rock-solid reliability.

He-Ion Microscope - The Carl Zeiss ORION PLUS Concept

The Carl Zeiss ORION® PLUS Helium ion microscope is a dramatic new break-through in microscopy, delivering images with never-before seen ultra-high resolution and material contrast, with five times better depth of field. The ZEISS ORION® PLUS microscope is based on the revolutionary, atomic-sized, ALIS gas field ion source.

ONH836 Series Oxygen/Nitrogen/Hydrogen Analyzer by Leco Corporation

The ONH836 Oxygen/Nitrogen/Hydrogen Elemental Analyzer is designed by Leco Corporation for measuring the content of nitrogen, oxygen, and hydrogen in ferrous and non-ferrous alloys, inorganic materials, and refractory materials using the inert gas fusion technique.

DSX500 and DSX500i High-Resolution Microscopes from Olympus

Olympus offers new, high-resolution upright motorized microscopes that are integrated with 13x zoom optics. The DSX500 and DSX500i systems provide excellent results with their unparalleled operating simplicity and complete performance reliability.

OLYMPUS Stream Micro-Imaging Software with Intuitive Workflow Interface

OLYMPUS Stream is a sophisticated micro-imaging software that can be operated by users to acquire, process, and determine images to generate critical reports and data.

Phenom proX Desktop Scanning Electron Microscope Now Comes with Elemental Mapping Functionality

Phenom-World, a global supplier of desktop scanning electron microscopes (SEMs) for sub-micron-scale applications, has launched the Elemental Mapping functionality for the Phenom proX desktop SEM.

Acoustic Enclosure 300/500 - Noise Protection for AFM or STM from Nanosurf

Nanosurf offers the advanced Acoustic Enclosure 300/500 that is particularly developed for high-resolution measurements in noisy environments.

GX Series Inverted Metallurgical Microscopes from Olympus

The GX series inverted metallurgical microscopes from Olympus are high performance imaging systems featuring the innovative Olympus UIS2 optics.

U-eLektron Ebeam System from USHIO America

The U-eLektron Ebeam system was designed to provide a research and development oriented solution to labs of any size. As a bench top tool, the U-eLektron can provide immediate results without the cost or time required for external testing.

LVEM5 Multi-Mode Electron Microscope from Delong (TEM, SEM, STEM and Electron Diffraction)

The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.

The TechPress 2 Hydraulic-Pneumatic Automatic Sample Mounting Press

The TechPress 2 hydraulic-pneumatic automatic mounting press from Allied High Tech Products is used to encapsulate samples for metallographic preparation. The microprocessor based system allows up to 50 mounting steps to be programmed, including cycle start/stop, preheating time and temperature, heating time and temperature, predefined mold pressures or manual pressure control and cooling time.

Cutting Mills from Fritsch

FRITSCH Cutting Mills are the ideal, time-saving assistants in the comminution of soft to medium-hard as well as fibrous or also tough materials. They are indispensable in the areas of plastics, textiles, agriculture and forestry, environment, construction materials, chemistry, foodstuffs, analytic and sample preparation for RoHS analysis.

The MultiPrep Semi-Automated Sample Preparation System from Allied High Tech Products

The MultiPrep™ System enables precise semi-automatic sample preparation of a wide range of materials for microscopic (optical, SEM, TEM, AFM, etc.) evaluation. Capabilities include parallel polishing, precise angle polishing, site-specific polishing or any combination thereof. It provides reproducible sample results by eliminating inconsistencies between users, regardless of their skill.

Microscope Camera for Demanding Applications by Spectrographic

This Professional microscope camera is designed for metallurgical applications.These professional microscope cameras are available in resolutions from 2.0 to 14.0 megapixels The Microscope Camera has C Mount fitting for microscope applications. Systems are sold as package complete with professional software for image capture, measure, calibration and annotation.

Olympus BXiS Microscopes with Advanced Optical and Imaging Technologies

The BXiS microscopes from Olympus are particularly designed for material applications. They employ advanced imaging and optical technologies and feature OLYMPUS Stream software, which simplifies workflow and provides a flexible solution.

The Cypher AFM from Asylum Research

The Cypher AFM/SPM from Asylum Research is the first totally new small sample AFM/SPM in over a decade. The all new design gives the Cypher increased capabilities, more control, more functionality, more modularity, and more resolution – all with striking ease of use.

Novascan ESPM 3D Atomic Force Microscope

The ESPM 3D is a specialized atomic force microscope designed for biological, material science and nanoscience applications. Its design allows for stand alone applications as well as easy intregation with other instruments such as confocal microscopes, spectral confocal microscopes, inverted optical microscopes, laser traps and other optical instruments. In addition, our scientists can help you to custom integrate or design a scanning probe microscope system that is specific to your application or group, saving you precious time and resources.

Navitar Precise Eye High Magnification Fixed Lens System for Inspection Applications

Navitar offers Precise Eye lenses that are specifically designed to deliver high vibration stability and excellent optical performance in contrast to other traditional C-mount video lenses.

Trinocular Fluorescence Microscope 3001-F from JP Selecta

The JP Selecta 3001-F trinocular fluorescence microscope is designed with superior resolution. It is polyvalent, and can operate in epifluorescent or transmitted light modes.

Advanced Grinder/Polisher - GPX300 from Leco

Convenience, flexibility, and quality - all in one easy-to-use system. The GPX 300 from Leco delivers smoother, flatter samples and works in almost any environment. Whatever your grinding or polishing need may be, the GPX has you covered.

FIBRETHERM ADF, NDF and Crude Fiber Analyzer from Gerhardt GmbH

System developed to automate the time consuming dosing, boiling and fitration steps required in crude fibre, ADF and NDF analysis.

FEI Launches V400ACE Focused Ion Beam Microscope

FEI has launched a new, advanced product called V400ACE Focused Ion Beam (FIB) system which features the latest developments in gas delivery, ion column design and end point detection to enable quick, efficient and cost-effective editing on sophisticated integrated circuits.

Hitachi Launches FB-2200 Fixed Ion Beam Microscope for TEM Sample Preparation

The FB-2200 available from Hitachi promotes fast and accurate specimen preparation for scanning and transmission electron microscopy of semiconductors and other sophisticated materials.

JEM-ARM200F Transmission Electron Microscope from JEOL

The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the highest in the world among the commercial transmission electron microscopes.

CHI900B Scanning Electrochemical Microscope

The CHI900B Scanning Electrochemical Microscope consists of a digital function generator, a bipotentiostat, high resolution data acquisition circuitry, a three dimensional nanopositioner, and a sample and cell holder. The CHI900B is designed for scanning electrochemical microscopy, but many conventional electrochemical techniques are also integrated for convenience.

TMA 801 Vertical Dilatometer by TA Instruments

The TMA 801 operates in a vertical orientation, making it ideal for the analysis of sintering, RCS (rate controlled sintering), viscoelastic behavior and the determination of softening temperatures. The linear motor generates a constant throughout the experiment, ensuring that contact is maintained with the sample regardless of dimension change.

FEI Tecnai Family of Transmission Electron Microscopes

The FEI Tecnai family of transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.

Ergonom 3000 Optical Microscope from Grayfield Optical

The Ergonom 3000 series provide the same features like depth of field, colour contrast, etc, yet with a maximum resolution of 200nm (incident, 300nm transmitted light). Ideal for doctors, practitioners, etc. who need to see more than is possible with bright and darkfield, yet do not need 100nm resolutions.

SECM370 Scanning Electrochemical Microscope System from Uniscan Intruments

The SECM370 is a precision scanning ultra micro-electrode system which provides information on the electrochemical characteristics of a material at high spatial resolutions.

Solver NEXT Scanning Probe Microscope from NT-MDT

The Solver Next is the first to offer a new concept in general purpose SPM. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time. The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements.

True Surface Microscopy from Witec

WITec's new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image.

Fully Integrated Raman-AFM from Renishaw

Renishaw have developed optimised direct coupling technology making the inVia Raman microscope the perfect partner for coupling to a wide variety of SPM's, such as the NT-MDT NTEGRA offering Tip Enhanced Raman Spectroscopy (TERS), near-field techniques (SNOM, NSOM) and Raman-AFM capabilities.

Sample Mounting Press - PR4X from Leco

The PR4X mounting press creates high-quality samples efficiently and easily. Advanced features include a digital interface with durable stainless steel keypad, an easy-to-read fluorescent display, a unique face-sealing closure system (just push the upper unit away and remove your sample), and complete modularity. Other features include four interchangeable mold sizes, and a low 15-inch working height.

NanoEducator Platform from NT-MDT

We believe that future scientific breakthroughs have their origins in the present. Following that truth, we have developed a special student-orientated product: NanoEducator. More than a simple SPM, NanoEducator opens the door to nanotechnology education. We've designed it to be cost effective enough to equip a classroom with SPMs, complete with e-teach software, handbooks, and descriptive laboratory exercises - all the materials necessary to teach students crucial skills in nanotechnology.

Field Emission Transmission Electron Microscope HF-3300 from Hitachi High-Technologies

The Cold FE-TEM" with stable ultrahigh resolution and next-generation analytical capabilities. Combination of high reputation Hitachi cold field emission electron source and 300kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis. Spatially resolved EELS and high precision parallel nanobeam electron diffraction open a new avenue for efficient and high precision material analysis.

LabRAM ARAMIS Raman Microscope - HORIBA Scientific

The HORIBA Scientific introduces the NEW generation analytical Raman Instrument - the LabRAM ARAMIS. Intelligent Automation provides easy computer controlled operation for quality control, analytical and research applications alike. It maintains the market leading flexibility and performance of the LabRAM series to provide the most comprehensive analytical tool available.

Raman Microscope - SENTERRA from Bruker Optics

The SENTERRA is a high-performance Raman microscope spectrometer developed for highly challenging analytical and research applications.

Scanning Acoustic Miscroscope - AM 300 from PVA TePla

The AM 300 is a simple to use scanning acoustic microscope for advanced industry quality control and research. It is a cost-effective tool enabling non destructive acoustic investigations using new rf and transducer technologies of up to 400 MHz.

Metallurgical Abrasive Cutter for Sample Preparation from Spectrographic

Abrasive Cutting Machine for general applications in the metallurgical and materials laboratory. Cutting wheels up to a 300mm/12in diameter can be fitted on the spindle which is directly driven by a 4 HP motor. A side lever is used to raise or lower the cutting head.

AURIGA CrossBeam Workstation (FIB-SEM) from Carl Zeiss

AURIGA® the new CrossBeam® Workstation (FIB-SEM) from Carl Zeiss SMT exactly delivers all this – on a nanoscopic scale. Using the best-in-class FIB column and the proprietary GEMINI e-Beam column from Carl Zeiss, together with a completely new designed vacuum chamber for advanced analytics, AURIGA® assists you in obtaining the maximum information possible out of your sample.

Gentle Asher from ibss Group

The Gentle Asher offered by ibss Group has been specifically designed to expand the GV10x investment for sample cleaning prior to inserting into the EM chamber.

Omega Manual Polisher 250 from Spectrographic

Spectrographic offers the Metallurgical Omega 250 polishing system for material science.

Combined AFM-SEM-FIB System from Nanonics Imaging

For the first time ever, Nanonics Imaging Ltd. in its drive for integrated microscopic solutions has now been able to fully and transparently integrate atomic force microscopy (AFM) and scanning electron microscopy (SEM).

Dimension Icon Atomic Force Microscope from Bruker

The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility.

Nanonics Hydra BioAFM

The Nanonics Hydra resolves all of these and many other limitations in BioAFM, thus opening new horizons for the application of AFM in biology. The ground up design of The Hydra provides no geometric or optical obstruction or interference either from above or below the SPM system.

Leco Corporation Introduces the SS-200 Grinder/Polisher for Low-to-Medium Volume Laboratories

The SS-200 from Leco Corporation is a variable-speed grinder/polisher with simple operation suitable for low- or medium-volume laboratories.

LabRAM IR2 Combined Raman / FTIR Microscope from HORIBA

FlexAFM - Atomic Force Microscope from Nanosurf

For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of applications to be performed easily.

Heavy Duty Abrasive Cut Off Machine - Mecatome T355 from Spectrographic

The PRESI Mecatome T355 is heavy duty abrasive cut off machine capable of high quality automatic cutting.

NaioAFM - Atomic Force Microscope from Nanosurf

The NaioAFM atomic force microscope available from Nanosurf is a multipurpose system that is suitable for small sample measurements and nanoeducation. The AFM system offers excellent performance, cost-effective, and simple to handle.

FEI Morgagni 268 Transmission Electron Microscope

The FEI Morgagni 268(D) provides a great value-for-the-money transmission electron microscope (TEM) that is adaptable, easy-to-use and delivers excellent image quality.

Model 295 Large Capacity Multi-Pocket E-Beam Sources from Telemark

For applications requiring large evaporation materials inventory (e.g. multiple or thick layers, extended throw distances) the Model 295 Source provides a wide range of crucible sizes including 6x100cc, 16x15cc, 10x40cc, and a 1486cc trough. Available in 10Kw or 15Kw versions, with Arc-Suppression available as an option.

Isostage - Isolation Stage for AFM from Nanosurf

The Nanosurf Isostage is a compact and sophisticated active vibration isolation system that is specifically designed to help protect scans from vibration disturbances.

5500 Atomic Force Microscope (AFM) by Agilent Technologies

The Agilent 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Agilent Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.

T64000 Raman Research System from HORIBA

VITA - Thermal Analysis Module for Bruker AFM and SPM

VITA technology adds high resolution nanoscale thermal characterization capabilities to Bruker's Dimension® Icon® AFM, Dimension Edge AFM, and MultiMode® 8 SPM.

Dual View Lens System from Navitar

Navitar offers an advanced dual view lens system, which is exclusively designed for the thin film transistor (TFT) repair industry, but is also utilized for applications demanding a wide field of view range.

JEM-1400 Transmission Electron Microscope from JEOL

The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to 120kV, the JEM-1400 is suitable for biological, polymer and materials science applications.

Leco Corporation Offers CS744 Instrumentation to Analyse Carbon/Sulfur in Inorganic Materials

Leco’s CS744 Series has been specifically designed to measure sulfur and carbon in ores, metals and other inorganic materials.

ICAM Scanning Acoustic Microscope

The ICAM scanning acoustic microscope is a high speed, fully digital and integrated system designed for rapid non-destructive inspection of integrated circuit (IC) packages and similar parts. It can be used in development, production and failure analysis situations to give repeatable and detailed information on internal features, showing the presence of manufacturing, processing and in-service defects.

M370 Scanning Electrochemical Workstation from Uniscan Intruments

Uniscan Instruments offers M370 Scanning Electrochemical Workstation which is designed to deliver spatially resolved, non-contact, ultra-high resolution electrochemical measurements.

Microscopy for Low Temperature Research - CryoView 2000 from Nanonics Imaging

The Nanonics CryoView 2000™ introduces the world of integrated microscopy to low temperature research. With simultaneous NSOM, AFM, Confocal and Raman imaging, complementary techniques can be used to analyze samples at low temperatures and high vacuums.

LEAP HR High Performance 3D Atom Probe from CAMECA

The LEAP 4000X HR is a high performance 3D atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom by atom identification and accurate spatial positioning. The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample.

OmniMet Image Acquisition and Analysis from Buehler

In keeping with our time-tested tradition of innovation and reliability, Buehler, the premier provider of solutions for material preparation, testing, and analysis, is proud to present the new OmniMet Digital Imaging System.

Park Systems XE-Bio Atomic Force Microscope

The XE-Bio is an innovative yet user-friendly Atomic Force Microscope designed specifically for biomedical and other advanced life science research. The modular design of the XE-Bio provides the user with a wide array of imaging modes including the revolutionary Scanning Ion Conductance Microscopy (SICM) module.

UV-visible-NIR Microscopy with Absorbance, Reflectance and Fluorescence Imaging-Now with Raman Microspectroscopy

Imaging of microscopic samples in the UV-visible-NIR region-now with Raman microspectroscopy! The UVM-1™ microscope from CRAIC Technologies is a system designed to make imaging of microscopic samples fast and simple. Operating from the deep ultraviolet to the near infrared , the UVM-1™ is designed to push the limits of research as well as providing fast, reliable operation for industry.

Raman Microscope – Model DXR from Thermo Scientific

The DXR Raman Microscope from Thermo Scientific offers point and shoot Raman microscopy with superior sensitivity and spatial resolution for functional applications.

Rock Core Analyzers - GeoSpec 2 NMR from Oxford Instruments

The GeoSpec 2 NMR Core Analyser is designed specifically for studies of core samples from oilfield reservoirs. GeoSpec 2 is the industry standard with installations in almost every major oil producer and SCAL laboratory world-wide.

Micro Precision Cut Off Machine - PresiCut S1000 from Spectrographic

The PresiCut S1000 is a Micro Precision cut off machine for low deformation cutting. The Low Speed Diamond saw is well established in the materials laboratory for cutting and sectioning a wide variety of small and delicate samples

Scanning Acoustic Microscope - PVA Templa SAM 400 QUAD

SAM 400 QUAD is a high performance tool enabling non destructive acoustic investigations for high throughput analysis, quality control and research applications. It features a new high speed linear motion scanner and new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface.

Variable Temperature Options for Optical Systems from MMR Technologies

Variable Temperature Options for Optical Systems is designed for Raman and fluorescence measurements to be made over a wide range of temperatures. The Dewar has three windows, two for the entrance and exit of the exciting beam and one at right angles to this for observing the Raman or fluorescence radiation.

Raman Spectrometer for Microscopic Samples: Use with Your UV-vis-NIR Microspectrometer or Optical Microscope

The CRAIC Apollo™ Raman spectrometer is designed for fast, easy micro-Raman spectroscopy. As such, it is perfect for research, metrology and inspection of microscopic sampling areas by Raman spectroscopy. The CRAIC Apollo™ Raman spectrometer employs optics, software and hardware optimized for Raman spectroscopy of microscopic samples. The CRAIC Apollo™ Raman spectrometer is perfect for rapid, non-destructive analysis in fields such as life sciences, materials science, chemistry and physics.

RENISHAW inVia Raman Microscope

inVia Raman microscopes from Renishaw are high-sensitivity systems with integrated research grade microscopes, enabling high resolution confocal measurements. inVia Raman microscopes support multiple lasers, with automatic software switching of excitation wavelength.

XploRA-One Raman Microscope from HORIBA

The XploRA ONE is an advanced Raman microscope specifically designed for industrial and analytical sectors.

SIGMA Advanced Analytical Scanning Electron Microscope SEM from Carl Zeiss

The SIGMA, featuring the unique and proven GEMINI® technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS).

Grinding and Polishing Consumables for Sample Preparation from Buehler

Buehler can supply a range of consumables for sample preparation operations. Some of the products that they can supply include grinding discs, magnetically backed polishing pads, as well as SunMet Bundles which include everything you need for grinding and polishing samples.

Sonix UHR-2001 Acoustic Microscope

Provides ultra-high resolution imaging. Ideal for general laboratory use, where small volume inspections needs are required. Specifically designed for flip chip or CSP inspections where high resolutions are needed, but can inspect all varieties of semiconductor devices.

AFM for SEM - Combined Atomic Force Microscopy and Scanning Electron Microscopy from Nanosurf & Kleindiek

Nanosurf and Kleindiek offers an advanced plug-and-play retrofit solution for customers requiring quick 3D information in SEM.

JEBG Series High-Power Electron Beam Sources from JEOL

JEBG Series / High Power Electron Beam Sources are designed to uniformly deposit metal oxides onto wide plastic films or steel plates in a continuous feed such as in magnetic tape manufacture for high-density recording or in wrapping-film manufacture with an oxide barrier function. Electron beam sources are also used for depositing of MgO film on plasma display panels and for development of surface-treated steel plates. Electron beam sources are also used for the melting of high-melting-point materials and high-purity metals.

3000-B Triocular Microscope from JP Selecta

The JP Selecta 3000-B Triocular Microscope is a high specification optical microscope with superior resolution planachromatic optics. It features high versatility with multiple configurations. It has phase contrast and bright and dark field optics. The 3000-B Triocular Microscope is suitable for a wide range of applications.

Koslow- Mercury Oxide Reference Electrode - 5088

The Hg/HgO is the best choice reference for alkaline solutions! The Mercury Oxide Reference Electrode is ideal for battery development, energy systems research and development, process control and general electrochemical studies.

Desktop Scanning Electron Microscope - Phenom G2 Pure SEM

The Phenom G2 pure desktop scanning electron microscope (SEM) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom G2 pure is equipped with the basic fundamentals for meeting imaging needs.

The Labpol 12 Auto Polisher/Grinder

The Labpol 12 Auto Polisher/Grinder is an advanced design of Automatic Polisher/Grinder in which polishing or grinding protocols can be created as a program by entering the required parameters on a keypad and then stored for future use.

Shuttle & Find for Material Analysis from Carl Zeiss

Carl Zeiss offers Shuttle & Find which is a correlative microscopy interface for light and electron microscopes and is suitable for materials analysis.

Sample Holders for Phenom G2 Desktop Scanning Electron Microscope SEM

For both the Phenom™ G2 pure and Phenom G2 pro a large variety of sample holders is available in order to extend the sample acceptance. These holders are designed for optimizing sample loading speed and guarantee the fastest time to image available in the market.

Park Systems XE-70 Atomic Force Microscope

An economic extension of the XE-100, the XE-70 is Park Systems’ new AFM solution for budget conscious customers. Having a compact mechanical design, the XE-70 continues the innovative technology of the XE-series that sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as all other systems in the XE product line.

Planetary Ball Mills - Classic Line from Fritsch

FRITSCH Planetary Mills classic line are ideal for fast and loss-free grinding from a few milligrams to several kilograms at a wide range of fineness levels down to less than 1 µm – dry or in suspension – absolutely reliable, easy to operate and to clean!

Hitachi Introduces NB5000 FIB-SEM Fixed Ion Beam System

The Hitachi NB5000 FIB-SEM is incorporated with a sophisticated 40kV Ga ion FIB column featuring a superior resolution Schottky FE-SEM. Similar to all HITACHI products, all the parts have been designed considering the overall system performance.

Carl Zeiss Releases ORION NanoFab Ion Beam Microscope

Carl Zeiss has launched an advanced 3-in-1 multibeam ion microscope for sub-10nm nanostructuring.

Compact Raman System for Process Monitoring

The Renishaw RA100 is a compact Raman system for process monitoring and bulk material analysis. It enables in situ Raman monitoring in the laboratory, pilot plant, or process line.

Field Emission Scanning Electron Microscope (FE-SEM) 8500 from Agilent Technologies

The Agilent 8500 field emission scanning electron microscope (FE-SEM) has a small footprint and provides researchers with a FE-SEM in their own laboratory.

Tabletop Scanning Electron Microscope (SEM) TM300 from Hitachi

It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample preparation such as coating with metal films is required for hydrated, oily or non-conducting samples, and TM3000 is easy to use like a digital camera.

Easyscan 2 - Modular Scanning Probe Microscope from Nanosurf

The Nanosurf Easyscan 2 is an advanced and cost-effective modular SPM tool developed for science and industrial research. Users can easily upgrade this surface analysis tool to meet future requirements, thus eliminating the need for off-the-shelf solutions.

alpha300 R Confocal Raman Microscope from Witec

The alpha300 R provides a still unmatched level of Confocal Raman Imaging capabilities focusing on high resolution as well as high speed spectrum and image acquisition.

Automatic Pneumatic Panel Sprayers from Sheen Instruments

Rapidly becoming the industry standard in many areas, Sheen Instruments Automatic Panel Sprayers have been developed with the co-operation of end users to ensure the product meets the exacting quality standards of the industries using them.

PerkinElmer RamanMicro 200 Raman Microscope

RamanMicro 200 - an affordable dispersive Raman microscopy system that makes routine sample analysis and chemical imaging accessible to any laboratory.

alpha300 A Atomic Force Microscope from Witec

The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors.

Axio Observer from Carl Zeiss

Axio Observer is an inverted microscope platform for materials research. It is suitable for automized scanning and imaging of non-metallic inclusions in steel.

L3003 Metallurgical Microscope from GX Optical

A high quality metallurgical microscope equipped with a trinocular head ready for the attachment of a digital camera. This microscope includes a full set of high quality plan achromatic metallurgical objectives on a modern reversed objective turret. Specimens can placed on the mechanical stage with ergonomically positioned controls for XY stage and focus control.

Lambda TriA-SNOM Scanning Near-Field Optical Microscope

APE Research's TriA-SNOM microscope is capable of collecting optical signals in reflection, transmission and back-reflection modes. The instrument is suitable for surface science, optics and biological applications. Tri-SNOM is a microscope that allows the acquisition of three different and simultaneous optical signals, in addition to the topography of the sample.

PR-36 Sample Mounting Press by Leco Corporation

Leco offers the PR-36 sample mounting press that can be used for single as well as dual sample mounting. The mounting press, combined with its easy desktop style and lightweight, compact design, is ideal for laboratories that are looking for high performance and long-lasting mounting press.

Digitial Microscope - VHX 1000 from Keyence

Keyence are proud to introduce the VHX-1000: a digital Microscope that not only integrates advanced functionality into a streamlined, all-in-one unit, but truly launches microscopy into the next generation.

Olympus SZX Stereo Microscopes Offer Comfortable and Ergonomic Operation

Olympus SZX stereo microscopes are versatile instruments that are specifically designed for complex applications. They provide comfortable and ergonomic operation and offer a clear stereoscopic view.

Powder Disperser System from Clemex Technologies

The Clemex Powder Disperser is a powerful software-controlled dispersion unit for dry powders. Addressing a need in the field of particle characterization, the Clemex Powder Disperser breaks agglomerates, without damaging the particles, so that they might be easily observed and differentiated on glass slides for particle size and shape analysis by optical Microscopy.