The only autonomous areal confocal profilometer on the market is the S mart 2. It is a breakthrough in the optical field because of its potent features and compact design.
Never before has installing a Sensofar system been so simple; the S mart 2 only requires two single connections, an ethernet cable, and a power source.
Image Credit: Sensofar Metrology
Due to its small width (90 mm), the integrable head can be installed in areas without obstructing users or production processes.
Image Credit: Sensofar Metrology
The S mart 2 has all the electronics, including the computing power, inside the head and was created to be incredibly simple to integrate.
Image Credit: Sensofar Metrology
For a metrological tool to operate correctly, the temperature is essential. A highly effective passive cooling system is the solution to keep the system operational.
Image Credit: Sensofar Metrology
In contrast to point or line confocal chromatics, the S mart 2 areal confocal capability images an area at a time, so the lateral resolution and X and Y remain the same.
Image Credit: Sensofar Metrology
The S Mart 2 includes three technologies to measure in the same head, including AI Focus Variation, Confocal, and Interferometry, to scan with the most appropriate technology.
Image Credit: Sensofar Metrology
Image Credit: Sensofar Metrology
Image Credit: Sensofar Metrology
Image Credit: Sensofar Metrology
Simply concentrate on the surface, and the S mart sensor will handle the rest. The product portfolio for these sensors has been created to meet the automatization needs that are typically present in production lines.
Image Credit: Sensofar Metrology
Image Credit: Sensofar Metrology
The sensor locates the focus, optimizes the light and Z range, and the user receives the result after just one click.
Image credit: Sensofar Metrology
System Specifications
Table 1. Objective lenses - Brightfield. Source: Sensofar Metrology
| MAG |
5X |
10X |
20X |
50X |
| NA |
0.15 |
0.30 |
0.45 |
0.80 |
| WD (mm) |
23.5 |
17.5 |
4.5 |
1.0 |
| FOV1 (µm) |
2820 x 2820 |
1410 x 1410 |
700 x 700 |
280 x 280 |
| Spatial sampling2 (µm) |
2.76 |
1.38 |
0.69 |
0.27 |
| Optical resolution3 (µm) |
1.11 |
0.55 |
0.37 |
0.21 |
| Measurement noise4 (nm) |
90 |
35 |
10 |
4 |
| Maximum slope5 (º) |
9 |
17 |
27 |
53 |
1 Maximum field of view with 2/3” camera and 0.25X optics.
2 Pixel size on the surface.
3 L&S: Line and Space, half of the diffraction limit according to the Rayleigh criterion. Values for blue LED in brightfield objectives.
4 Measurement noise is measured as the difference between two consecutive measurements of a calibration mirror placed perpendicular to the optical axis. Values obtained in a VC-E vibration environment.
5 On smooth surfaces. Up to 86° on rough surfaces. Other objectives are available.
Table 2. Objective lenses - Interferometry. Source Metrology
| MAG |
10X |
20X |
50X |
| NA |
0.30 |
0.40 |
0.55 |
| WD (mm) |
7.4 |
4.7 |
3.4 |
| FOV1 (µm) |
1410 x 1410 |
700 x 700 |
280 x 280 |
| Spatial sampling2 (µm) |
1.38 |
0.69 |
0.27 |
| Optical resolution3 (µm) |
1.38 |
0.69 |
0.30 |
| System noise4 (nm) |
< 5 |
| Maximum slope5 (º) |
17 |
24 |
33 |
1 Maximum field of view with 2/3” camera and 0.25X optics.
2 Pixel size on the surface.
3 L&S: Line and Space, half of the diffraction limit according to the Rayleigh criterion. Spatial sampling could limit the optical resolution for interferometric objectives. Values for white LED in interferometric objectives.
4 Measurement noise is measured as the difference between two consecutive measurements of a calibration mirror placed perpendicular to the optical axis. Values obtained in a VC-E vibration environment.
5 On smooth surfaces.
Table 3. Z Performance. Source: Sensofar Metrology
| Z |
LINEAR STAGE |
| Vertical range |
20 mm (0.79″) |
| Resolution |
5 nm |
S mart 2, the new integrable areal confocal head from Sensofar