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A Profilometer is a measuring device used to measure relative surface roughness, peak to valley, in order to quantify its roughness. They may operate in either contact or non-contact modes and may use optical or stylus techniques to make the actual measurements.
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The TalyMaster has been specifically designed to measure multiple parts for Contour, Roughness and Roundness in a single automated operation, increasing throughput and reducing cost.
The NewView 7000 Series optical profilers are powerful tools for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 15000 µm at high speeds, independent of surface texture, magnification, or feature height!
WITec's new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image.
The Talyrond 585 from Taylor Hobson is a fully automated roundness/cylindricity instrument that is unsurpassed in accuracy and reliability, with 6 versions to choose from offering the right balance of automation and capacity for virtually every application.
The Conscan objective surface profilometer available from CSM Instruments combines the 3D chromatic confocal technology and the traditional microscopy.
The cyberSCAN VANTAGE 2 from cyberTECHNOLOGIES is an optical surface metrology system featuring x- and y-translation stages and a high resolution 3D white light interferometer. Superior height resolution is offered by the interferometer technology. The cyberSCAN VANTAGE 2 has all of its electronic components in a robust housing.
cyberTECHNOLOGIES offers cyberSCAN CT 100, a non-contact profilometer with smaller footprint and higher resolution. This instrument consists of an x-, y-motion system and a highly accurate chromatic white light sensor or laser with high measurement speed on a granite platform.
The Talysurf PGI Dimension from Taylor Hobson is an ideal dedicated metrology instrument for precision measurement of 3D form of shallow and steep aspherical lenses and moulds from <2mm and up to 200mm diameter.
FRT offers MicroSpy Profile, an optical profilometer that provides low-cost access to non-contact 2D- and 3D-surface metrology. The device is fitted with an energy-efficient and long-lasting LED and utilizes the chromatic distance measurement which ensures that even strongly absorbing surfaces can be measured easily, quickly and reliably.
cyberTECHNOLOGIES’ non-contact surface metrology system, cyberSCAN VANTAGE 2 is equipped with a x- and y-translation stage and a high-resolution confocal sensor, enabling measurement of large areas up to 200mm with a maximum resolution in all three directions. It has all of its electronic components in a robust housing, thus eliminating the need for external controllers or cables.
The LaserScan is a surface profilometer for fast 3D laser measurement in quality assurance and process control. It represents a significant step to providing affordable non-contact surface profilometry without sacrificing accuracy. The key to the system design is the modularity of component selection.
The CT 350T non-contact double-sided optical profilometer offered by cyberTECHNOLOGIES features a 300mm x-/y- scanning stage with a highly accurate z-axis of 100mm range. The lower sensor is fixed within a massive granite construction, whereas the upper sensor is installed on the z-axis.
ZeGage™ is the ideal non-contact optical profiler for quantitative measurements of 3D form and roughness on precision machined surfaces. The industrial design provides fast, accurate metrology in a compact, cost-effective package that can be located directly on the factory floor without the need for vibration isolation or specialized enclosures.
The CT R200 non-contact profilometer from cyberTECHNOLOGIES features a rotary stage with a 200mm x-axis and an automated z-axis. The rotary stage holds the samples of round parts, and the sensor is moved by the x- and the z-axis near the surface of interest. The sensor is then positioned at the optimal distance to the surface by the autofocus routine.
The cyberSCAN CT 300 non-contact profilometer from cyberTECHNOLOGIES is equipped with a 315 mm x-, y-motion system, enabling scanning of large substrates (up to 12” wafers) and components. It performs flatness measurements with an accuracy of submicron level over the entire 315mm travel.
The CT 350S non-contact profilometer offered by cyberTECHNOLOGIES has a 350mm x-, y-scanning stage with a closed loop 200mm z-axis. Magnetic linear motors and air bearings are used in all three axes. The system is mounted on a granite platform and a vibration isolated floor stand.
The cyberSCAN CT 600S non-contact profilometer from cyberTECHNOLOGIES is designed to measure large and heavy parts. The motion accuracy of the gantry system with a 600mm x-, y-motion system and area coverage of 24“ is not affected by the sample weight.
The Taylor Hobson CCI HD leads the world in the next generation of combined thin film and dimensional optical profilers. This instrument merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology. The CCI SunStar is able to meet the most demanding application challenges, including 1st and 2nd generation Solar P-V, High power LED, Displays and Vacuum Coatings.
The cyberSCAN VANTAGE 50 from cyberTECHNOLOGIES is a non-contact profiling system with smaller footprint. It can rapidly scan any surface or component. The system consists of a base unit integrated with a translation stage, a laser sensor, and a PC or a laptop to analyze data. The sensor generates a high-resolution height profile of objects by scanning over them.
The CCI MP is an advanced type of measurement interferometer (a non contact 3D Profiler). It uses an innovative, patented correlation algorithm to find the coherence peak and phase position of an interference pattern produced by our precision optical scanning unit.
cyberTECHNOLOGIES offers the scanning platform as an integrated solution that performs non-contact scanning of any surface automatically in a production process. The INLINE integrated scanning platform integrates a handling device, computer controlled motion system, high resolution sensor technology, and data analysis software to an innovative in-line non-contact profilometer.
The new Dektak XTL stylus profiler available from Bruker is designed to accommodate samples up to 350mm x 350mm, bringing the renowned Dektak reproducibility and repeatability to panel and large-format wafer manufacturing.