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A Profilometer is a measuring device used to measure relative surface roughness, peak to valley, in order to quantify its roughness. They may operate in either contact or non-contact modes and may use optical or stylus techniques to make the actual measurements.
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The Talysurf PGI Dimension from Taylor Hobson is an ideal dedicated metrology instrument for precision measurement of 3D form of shallow and steep aspherical lenses and moulds from <2mm and up to 200mm diameter.
The NewView 7000 Series optical profilers are powerful tools for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 15000 µm at high speeds, independent of surface texture, magnification, or feature height!
The CCI MP is an advanced type of measurement interferometer (a non contact 3D Profiler). It uses an innovative, patented correlation algorithm to find the coherence peak and phase position of an interference pattern produced by our precision optical scanning unit.
The TalyMaster has been specifically designed to measure multiple parts for Contour, Roughness and Roundness in a single automated operation, increasing throughput and reducing cost.
FRT offers MicroSpy Profile, an optical profilometer that provides low-cost access to non-contact 2D- and 3D-surface metrology. The device is fitted with an energy-efficient and long-lasting LED and utilizes the chromatic distance measurement which ensures that even strongly absorbing surfaces can be measured easily, quickly and reliably.
The Sensofar’s PLì 1300 is a portable Optical Imaging Profiler capable of measuring 3D information of technical surfaces with the use of Interferential or Confocal technologies. With a total weight less than 4.5 Kg and up to 5 meter single cable, the operator takes the sensor safely and places it onto the surface under inspection.
The Talyrond 585 from Taylor Hobson is a fully automated roundness/cylindricity instrument that is unsurpassed in accuracy and reliability, with 6 versions to choose from offering the right balance of automation and capacity for virtually every application.
WITec's new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image.
Rtec Instruments offers a combination system that is designed to accommodate both white light interferometer (optical profile) and AFM on the same platform.
The Taylor Hobson CCI HD leads the world in the next generation of combined thin film and dimensional optical profilers. This instrument merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology. The CCI SunStar is able to meet the most demanding application challenges, including 1st and 2nd generation Solar P-V, High power LED, Displays and Vacuum Coatings.
ZeGage™ is the ideal non-contact optical profiler for quantitative measurements of 3D form and roughness on precision machined surfaces. The industrial design provides fast, accurate metrology in a compact, cost-effective package that can be located directly on the factory floor without the need for vibration isolation or specialized enclosures.
The LaserScan is a surface profilometer for fast 3D laser measurement in quality assurance and process control. It represents a significant step to providing affordable non-contact surface profilometry without sacrificing accuracy. The key to the system design is the modularity of component selection.