Equipment | Microscopes | Transmission Electron Microscopes (TEM)

Transmission Electron Microscopes (TEM)

The transmission electron microscope (TEM) operates on the same basic principles as the light microscope but uses electrons instead of light. What you can see with a light microscope is limited by the wavelength of light. TEMs use electrons as "light source" and their much lower wavelength makes it possible to get a resolution a thousand times better than with a light microscope.
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Equipment
FEI Morgagni 268 Transmission Electron Microscope
The FEI Morgagni 268(D) provides a great value-for-the-money transmission electron microscope (TEM) that is adaptable, easy-to-use and delivers excellent image quality.
JEM-ARM200F Transmission Electron Microscope from JEOL
The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the highest in the world among the commercial transmission electron microscopes.
LVEM5 Multi-Mode Electron Microscope from Delong (TEM, SEM, STEM and Electron Diffraction)
The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.
Transmission Electron Microscope H-9500 from Hitachi High-Technologies
Atomic resolution 300kV transmission electron microscope. Atomic resolution electron microscopy is becoming increasingly important and indispensable for the R&D of semiconductors and advanced materials where micro-fabrication technologies have entered into the sub-nanometer realm.
JEM-1400 Transmission Electron Microscope from JEOL
The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to 120kV, the JEM-1400 is suitable for biological, polymer and materials science applications.
FEI Tecnai Family of Transmission Electron Microscopes
The FEI Tecnai family of transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.
Field Emission Transmission Electron Microscope HF-3300 from Hitachi High-Technologies
The Cold FE-TEM" with stable ultrahigh resolution and next-generation analytical capabilities. Combination of high reputation Hitachi cold field emission electron source and 300kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis. Spatially resolved EELS and high precision parallel nanobeam electron diffraction open a new avenue for efficient and high precision material analysis.
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