X-Ray Photoelectron Spectroscopy / XPS RSS Feed - X-Ray Photoelectron Spectroscopy / XPS

XPS or X-Ray Photoelectron Spectroscopy (also known as ESCA-Electron Spectroscopy for Chemical Analysis) is essentially a surface analysis technique that is able to quantitatively determine the atomic composition of a material. It can only be used on materials that are vacuum compatible and While generally used for surface analysis it can be used to depth profiling of thin films down to about 10nm.
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Equipment
The Thermo Scientific MAGCIS dual mode ion source functions both as a gas cluster ion source and a monatomic ion source, facilitating the depth profiling analysis and surface cleaning of soft and hard materials on a single XPS instrument.
The R4000 WAL XPS analyzer is used for high throughput XPS measurements. Lens tables for transmission and angular measurements are included.
The zeta potential of macroscopic solids can be investigated based on a streaming current and streaming potential measurement using the SurPASS™ 3 electrokinetic analyzer. The zeta potential can be correlated to the surface charge at the interface of a solid and liquid.
The Thermo Scientific™ theta probe is a high performance XPS system, which is used for ultra-thin film analysis.
The Thermo Scientific Avantage software is a premier software developed for surface analysis and forms an essential component in advanced XPS instruments, such as the Thermo Scientific™ K-Alpha™ XPS system, Thermo Scientific™ ESCALAB™ 250Xi XPS microprobe, and the Thermo Scientific™ Theta Probe™ XPS system.
The Thermo Scientific ESCALAB 250Xi is the most recent advancement in the ESCALAB product series. The ESCALAB 250Xi is an optimized multi-method platform that is expandable and comes with excellent flexibility and configurability.
Superior AXIS technology, which includes magnetic immersion lens, co-axial charge neutralization and delay-line photoelectron detection, is incorporated in the AXIS Nova.
Thermo Scientific K-Alpha is a completely integrated, monochromated small-spot X-ray Photoelectron Spectrometer (XPS) system.