X-Ray Diffractometers RSS Feed - X-Ray Diffractometers

X-Ray diffraction (XRD) is a powerful technique used to characterize crystalline materials. The crystals that make up a crystalline material have unique dimensions that are characteristic of a material. Using an x-ray diffractometer, and Bragg’s law the crystallography of a material can be determined. Conversely, unknown materials can be identified using XRD and standards that have been previously determined.
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Featured Equipment
Empyrean is a true multi-purpose research x-ray diffractometer. Like no other system available, the Empyrean platform is designed for now, and for years to come. It is PANalytical’s answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project.
Other Equipment
The exceptional price-to-performance ratio of the MiniFlex II benchtop X-ray diffractometer sets a new standard for companies, universities, and other research institutions looking to add XRD capabilities to research, development, and educational activities.
The SmartLab is a highly sophisticated, high-resolution diffractometer. The SmartLab Guidance software is the most innovative feature that provides the user an intelligent interface, which guides one through the minutest details of every experiment.
The PANalytical CubiX³ system provides high-speed phase analysis for quality control and process optimization. It is ideal for industrial X-ray diffraction (XRD) applications.
Rigaku offers the XtaLAB P200 chemical crystallography system for the expert small molecule crystallographer, where a flexible configuration is required.
The FR-X was designed to be utilized in structural biology and material science, and provides the highest usable X-ray flux available for the laboratory researcher. The new design provides 20% more flux when compared to the previous model and also a new direct-drive anode that reduces maintenance expense considerably.
The X'Pert³ materials research diffractometers (MRD) and MRD (XL) are a new generation of highly flexible materials research diffraction systems.
The SuperNova, from the Rigaku Oxford Diffraction division, consists of Rigaku’s hi-flux micro-focus sources and rapid self-optimizing S2 CCD detectors.
PANalytical’s latest X-ray diffraction system is based on the completely renewed X’Pert platform. With features such as on-board electronics, compliance with most recent and stringent X-ray and motion safety norms, with advancements in reliability and eco-friendliness, the X’Pert³ Powder is ready for the future.
During material manufacture, residual stress may be created or may be accumulated in a structure over many years in operation.
The new D8 ENDEAVOR from Bruker is an extension of the D8 diffractometer series and is suitable for powder applications in industrial process optimization and quality control processes.
The new Rigaku XtaLAB mini benchtop X-ray crystallography system for automated three dimensional (3D) chemical structure determination is one of the latest systems in affordable single crystal X-ray diffraction.
The new D2 PHASER from Bruker is a compact, fast and all-in-one amorphous and crystalline phase analysis tool designed for X-ray powder diffraction applications in Bragg-Brentano geometry.
The TTRAX III is a highly powerful diffractometer. The instrument can be operated using an 18 kW rotating anode X-ray source in a q/q geometry and is the optimal system for challenging applications.
The Thermo Scientific ARL 9900 IntelliPower series of X-ray spectrometers is the most capable and highly versatile ever offered for process control.
The LYNXEYE XE is the first energy dispersive single-dimensional detector operating at room temperature for ultra fast X-ray diffraction measurements. It is developed on the basis of compound silicon strip technology and is especially optimized to meet the demands in X-ray diffraction in terms of highest count rate capabilities, best angular resolution (FWHM), and best energy resolution.
The new D8 DISCOVER increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, grazing incidence diffraction (IP-GID), small angle X-ray scattering (SAXS), as well as residual stress and texture investigations.
The innovative design of the new D8 ADVANCE plausibly combines operating safety, ease of use, and user safety. Well-matched hardware, electronics, and software ensure an easy adaptation to any application in the field of X-ray powder diffraction.
The Terra Field Portable X-ray Diffraction/X-ray Fluorescence has evolved from X-ray diffraction analysis.
The Ultima IV represents sophisticated X-ray diffraction (XRD) systems.
The RAPID II is the most versatile X-ray area detector in the history of materials analysis. The success of the RAPID II is a testament to the suitability of imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials.