X-Ray Diffractometers

X-Ray diffraction (XRD) is a powerful technique used to characterize crystalline materials. The crystals that make up a crystalline material have unique dimensions that are characteristic of a material. Using an x-ray diffractometer, and Bragg’s law the crystallography of a material can be determined. Conversely, unknown materials can be identified using XRD and standards that have been previously determined.
If you'd like us to help you source a Quotation for X-Ray Diffractometers please click here. Once submitted, we will try and place you in contact with a suitable X-Ray Diffractometers supplier within 48 hours.
Featured Equipment
The Xsolo system available from Inel is a portable, lightweight and adaptable stress-measurement system.
The Equinox 6000 X-ray diffractometer available from Inel is suitable for all 4-circle goniometer X-ray diffraction applications.
Empyrean is a true multi-purpose research x-ray diffractometer. Like no other system available, the Empyrean platform is designed for now, and for years to come. It is PANalytical’s answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project.
The Equinox 3000 multi-purpose, high resolution X-ray diffractometer available from Intel is a research grade diffraction system.
Other Equipment
The D2 PHASER is a novel desktop X-ray diffraction tool enabling the analysis of poly-crystalline material. By means of X-ray powder diffraction using the classic Bragg-Brentano geometry the D2 PHASER measures high-quality data for application such as qualitative and quantitative crystalline phase identification, polymorphism investigations, determination of crystallinity, and structure investigations. The D2 PHASER desktop diffractometer is equipped with an integrated PC and a flat screen monitor.
The XRD-6000 from Shimadzu Scientific Instruments is a compact, multi-functional, general-purpose x-ray diffractometer that is easy to use. The XRD-7000 is a new concept in multifunctional x-ray diffractometry that can handle very large samples an liquid samples.
The PILATUS 100K is designed for superior performance with high speed to suit a variety of applications.
Anton Paar offers a new, advanced nanostructure analyzer called SAXSpace. The instrument is built on small- and wide-angle X-ray scattering (SWAXS).
The complete RIGI module from DECTRIS is a hybrid carrier comprising CVD-sensor and contact pads.
Inel’s Equinox 1000 is a powerful benchtop X-ray diffractometer with small dimensions. It is suitable for all X-ray powder diffraction applications.
The Mythen 1K from DECTRIS offers high speed and superior data quality for a variety of challenging X-ray diffraction applications.
The TTRAX III is a highly powerful diffractometer. The instrument can be operated using an 18 kW rotating anode X-ray source in a q/q geometry and is the optimal system for challenging applications.
The Ultima IV represents sophisticated X-ray diffraction (XRD) systems.
The D8 DISCOVER with GADDS combines cutting edge x-ray technology of the highest quality in a truly modular system. The D8 DISCOVER with GADDS can analyze an unrivaled variety of samples within a wide range of XRD2 and SAXS applications.
The innovative design of the new D8 ADVANCE plausibly combines operating safety, ease of use, and user safety. Well-matched hardware, electronics, and software ensure an easy adaptation to any application in the field of X-ray powder diffraction.
The D4 ENDEAVOR is an X-ray Diffraction (XRD) Solution for the analysis of polycrystalline material by means of X-ray powder diffraction. The D4 ENDEAVOR performs qualitative and quantitative crystalline phase analysis, peak profile analysis, residual stress determination and structure solutions.
The PILATUS 1M from DECTRIS is a powerful high speed detector for use in small-angle X-ray scattering (SAXS) applications.
CubiX3 delivers exceptional analysis speed, reliability and reproducibility. Introducing new features such as high-intensity data collection and extra flexibility in sample handling for automated environments, CubiX3 can be set up for fully automated, push-button operation. Its initial investment is rapidly earned back because of the ease of operation, the independency of operators and the safety for the users, when compared to traditional methods like wet-chemical process control or microscopy methods.
SAXSess mc2 is a new measuring system for nanostructure analysis using small-angle X-ray scattering (SAXS). Nanosized particles and sample domains scatter towards small angles. The SAXS pattern provides information on the overall size and shape of these particles. The modular system architecture of SAXSess mc2 enables users to select the optimal setup for their applications. This makes it a universal tool for investigating nanostructures in different materials, including proteins, foods, pharmaceuticals, polymers, nanoparticles and catalysts.
The exceptional price-to-performance ratio of the MiniFlex II benchtop X-ray diffractometer sets a new standard for companies, universities, and other research institutions looking to add XRD capabilities to research, development, and educational activities.
The SmartLab is a highly sophisticated, high-resolution diffractometer. The SmartLab Guidance software is the most innovative feature that provides the user an intelligent interface, which guides one through the minutest details of every experiment.
PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for advanced materials science and nanotechnology and metrologic characterization in semiconductor process development.
The X'Pert PRO MRD XL is an enlarged and improved version of PANalytical’s proven X'Pert PRO MRD XRD system. By facilitating X-ray analysis during the process development stage, the X'Pert PRO MRD XL represents the logical 'next step' in advanced materials analysis. it is suited to the analysis is semiconductors and advanced materials.
The Terra Field Portable X-ray Diffraction/X-ray Fluorescence has evolved from X-ray diffraction analysis.
The RAPID II is the most versatile X-ray area detector in the history of materials analysis. The success of the RAPID II is a testament to the suitability of imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials.
The Thermo Scientific ARL 9900 IntelliPower series of X-ray spectrometers is the most capable and highly versatile ever offered for process control.
The new D8 DISCOVER increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, grazing incidence diffraction (IP-GID), small angle X-ray scattering (SAXS), as well as residual stress and texture investigations.
The Equinox 100, a standalone benchtop X-ray diffractometer from Inel, is designed for analyzing crystalline phases on powder or bulks.
Site Sponsors
Site Sponsors
  • Dynamic-Ceramic: UK supplier of advanced ceramics - zirconia and alumina products