X-Ray Diffractometers RSS Feed - X-Ray Diffractometers

X-Ray diffraction (XRD) is a powerful technique used to characterize crystalline materials. The crystals that make up a crystalline material have unique dimensions that are characteristic of a material. Using an x-ray diffractometer, and Bragg’s law the crystallography of a material can be determined. Conversely, unknown materials can be identified using XRD and standards that have been previously determined.
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Featured Equipment
Empyrean is a true multi-purpose research x-ray diffractometer. Like no other system available, the Empyrean platform is designed for now, and for years to come. It is PANalytical’s answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project.
Other Equipment
The FR-X was designed to be utilized in structural biology and material science, and provides the highest usable X-ray flux available for the laboratory researcher. The new design provides 20% more flux when compared to the previous model and also a new direct-drive anode that reduces maintenance expense considerably.
The new D8 DISCOVER increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, grazing incidence diffraction (IP-GID), small angle X-ray scattering (SAXS), as well as residual stress and texture investigations.
PANalytical’s latest X-ray diffraction system is based on the completely renewed X’Pert platform. With features such as on-board electronics, compliance with most recent and stringent X-ray and motion safety norms, with advancements in reliability and eco-friendliness, the X’Pert³ Powder is ready for the future.
The new Rigaku XtaLAB mini benchtop X-ray crystallography system for automated three dimensional (3D) chemical structure determination is one of the latest systems in affordable single crystal X-ray diffraction.
The LYNXEYE XE is the first energy dispersive single-dimensional detector operating at room temperature for ultra fast X-ray diffraction measurements. It is developed on the basis of compound silicon strip technology and is especially optimized to meet the demands in X-ray diffraction in terms of highest count rate capabilities, best angular resolution (FWHM), and best energy resolution.
Rigaku offers the XtaLAB P200 chemical crystallography system for the expert small molecule crystallographer, where a flexible configuration is required.
The ADX-2700 Powder X-ray diffraction instrument available from Angstrom Advanced is a multi-function diffractometer that provides excellent analysis speed, reproducibility and reliability.
During material manufacture, residual stress may be created or may be accumulated in a structure over many years in operation.
The D4 ENDEAVOR is an X-ray Diffraction (XRD) Solution for the analysis of polycrystalline material by means of X-ray powder diffraction. The D4 ENDEAVOR performs qualitative and quantitative crystalline phase analysis, peak profile analysis, residual stress determination and structure solutions.
The Xsolo system available from Inel is a portable, lightweight and adaptable stress-measurement system.
The Equinox 100, a standalone benchtop X-ray diffractometer from Inel, is designed for analyzing crystalline phases on powder or bulks.
Inel’s Equinox 1000 is a powerful benchtop X-ray diffractometer with small dimensions. It is suitable for all X-ray powder diffraction applications.
The Equinox 6000 X-ray diffractometer available from Inel is suitable for all 4-circle goniometer X-ray diffraction applications.
The exceptional price-to-performance ratio of the MiniFlex II benchtop X-ray diffractometer sets a new standard for companies, universities, and other research institutions looking to add XRD capabilities to research, development, and educational activities.
The Equinox 3000 multi-purpose, high resolution X-ray diffractometer available from Intel is a research grade diffraction system.
The Ultima IV represents sophisticated X-ray diffraction (XRD) systems.
The Terra Field Portable X-ray Diffraction/X-ray Fluorescence has evolved from X-ray diffraction analysis.
The D2 PHASER is a novel desktop X-ray diffraction tool enabling the analysis of poly-crystalline material. By means of X-ray powder diffraction using the classic Bragg-Brentano geometry the D2 PHASER measures high-quality data for application such as qualitative and quantitative crystalline phase identification, polymorphism investigations, determination of crystallinity, and structure investigations. The D2 PHASER desktop diffractometer is equipped with an integrated PC and a flat screen monitor.
The TTRAX III is a highly powerful diffractometer. The instrument can be operated using an 18 kW rotating anode X-ray source in a q/q geometry and is the optimal system for challenging applications.
The innovative design of the new D8 ADVANCE plausibly combines operating safety, ease of use, and user safety. Well-matched hardware, electronics, and software ensure an easy adaptation to any application in the field of X-ray powder diffraction.
The SmartLab is a highly sophisticated, high-resolution diffractometer. The SmartLab Guidance software is the most innovative feature that provides the user an intelligent interface, which guides one through the minutest details of every experiment.
The Thermo Scientific ARL 9900 IntelliPower series of X-ray spectrometers is the most capable and highly versatile ever offered for process control.
Anton Paar offers a new, advanced nanostructure analyzer called SAXSpace. The instrument is built on small- and wide-angle X-ray scattering (SWAXS).
Rigaku's Compact HomeLab was developed for researchers who requireda low-maintenance X-ray system with the ultimate in experimental flexibility.
The RAPID II is the most versatile X-ray area detector in the history of materials analysis. The success of the RAPID II is a testament to the suitability of imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials.
The XRD-6000 from Shimadzu Scientific Instruments is a compact, multi-functional, general-purpose x-ray diffractometer that is easy to use. The XRD-7000 is a new concept in multifunctional x-ray diffractometry that can handle very large samples an liquid samples.