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A thin film is a layer of material ranging from fractions of a nanometre (monolayer) to several micrometres in thickness. Electronic semiconductor devices and optical coatings are the main applications benefiting from thin film construction.
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Equipment
The WT-2000PVN is a tabletop measurement system, capable of performing a variety of measurements on PV cells, wafers, and blocks. The base system includes the overhead functions, and you configure the measurement capabilities to match your specific needs.
The PT-5 panel tester Gen5 is designed to measure properties of thin film solar cells that meet the GEN-5 standard. It incorporates an ellipsometer, a non-contact resistivity mapper and a haze meter.
EP5, EP12 and EP20 tools from Semilab are based on Ellipsometric porosimetry (EP) having various degree of automation and wafer size capabilities. EP measures the change of the optical properties and thickness of the materials during adsorption and desorption of either an organic solvent or water at reduced pressure.
The Semilab AMS 3300 uses the exclusive SurfaceWave™ technology to measure the thickness and uniformity of thin film metals and dielectrics. It's a low cost but powerful product built expressly for copper, low k materials.
VG Scienta offers an advanced and highly sensitive membrane permeation measurement instrument called VacuTRAN.