Coating Testing

Featured Equipment
Semilab offers a unique modular optical platform, the SE-2000, which includes a spectroscopic ellipsometer with rotating compensator optics.
Other Equipment
Admet single column electromechanical testing systems are ideal for determining the mechanical properties of a variety of materials in a divers set of applications. Systems are ideal for measuring the tensile, flexural, shear, creep, and compressive properties of materials, components, and devices.
The spectroscopic ellipsometer SENpro represents a new generation of cost effective spectroscopic ellipsometers featuring simple operation, measurement speed and combined data analysis of ellipsometric measurements at single or multiple angle of incidence.
The UVISEL 2 available from HORIBA Scientific is a fully integrated and automated ellipsometer which has been specifically designed for industrial and research-oriented users.
The Bench Glossmeter is a simple to use compact instrument that analyze the surface finish of surfaces, in particular coated surfaces.
Digital eddy current testing for the metal processing industry.
The PosiTector 6000 is a rugged, weatherproof coating thickness gauges for accurate measurement of coating thicknesses on all metal substrates.
EDDYCHEK S is a modern, high speed tester capable of a wide scope of applications ranging from one-coil inspection problems (e.g. weld-seam testing) to multichannel applications.
The Alpha SE™ is the newest addition to the JA Woollam line of ellipsometers. This new ellipsometer is designed to make SE measurements as fast and simple as possible. The Alpha-SE™ will measure both thickness and index with the use of the Alpha-SE software. With the compact, fully integrated design and USB connection make the ultimate table top tool.
Oxford Instruments’ PlasmaPro 80 Stratum is a compact open-loading tool designed specifically for plasma enhanced chemical vapour deposition (PECVD).
Zetec’s MIZ-28 delivers more technology and performance for high-speed, high-efficiency inspection of heat exchanger tubing. Its data management features lead the industry with more on-board data storage and easy file transfer. And the MIZ-28 supports existing Zetec equipment and software already deployed for eddy current inspections.
The Semilab AMS 3300 uses the exclusive SurfaceWave™ technology to measure the thickness and uniformity of thin film metals and dielectrics. It's a low cost but powerful product built expressly for copper, low k materials.
The Filmetrics F20s are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F20 connects to the USB port of your Windows™ computer and sets up in minutes.
The AeroCheck ET Flaw Detector from ETher NDE is a non-destructive testing device designed for NDE on specific aerospace application. It comes in a compact, rugged and lightweight package, and features a daylight-readable 5.7” LCD Color Full VGA (640 x 480 pixels) Screen.
Angstrom Engineering offers a low pressure chemical vapor deposition (LPCVD) system that is specifically designed to meet the high temperature needs of carbon nanotubes and graphene studies.
ETher NDE’s WeldCheck Eddy Current (ECT) flaw detector has been designed for users within a wide range of industries. The instrument is compact, lightweight and enclosed in a rugged aluminium alloy outer case.
Oxford Instruments offers a range of electroplating and metal coating thickness gauges designed for measuring metallic coatings over ferrous substrates.
The SENresearch broadband spectroscopic ellipsometer family is designed to meet the requirements of modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
BYK-Gardner offers a wide variety of charts and drawdown cards for almost any application and coating material.
The Anton Paar Calotest (Compact Calotest (CATc) and Industrial Calotest CATi) is designed to measure coatings that have thicknesses in the range of 0.1 to 50µm.
The SE 500adv can be operated as a laser ellipsometer, film thickness probe FTPadv or as a Combined Ellipsometry and Reflectometry (CER) ellipsometer. As a result, it offers maximum flexibility never reached by standard laser ellipsometers.
The LFA 467 HyperFlash® from NETZSCH is a light flash apparatus offering unique dimensions in the measurement of thermal diffusivity and conductivity.
The FilmTek™ 2000SE is a high performance spectroscopic ellipsometer for thin film characterization that measures from the deep UV to NIR (190-1700nm). Based on a rotating compensator design, the FilmTek™ 2000SE spectroscopic ellipsometer combines spectroscopic ellipsometry with multiple angle reflectometry to make it ideally suited for measuring the thickness and optical constants (n & k) of very thin films.
Equipped with a power digital closed-loop controller, ADMET’s Micro EP is a mini tester that can also adapt to many microscope stages. Micro EP models are available with force capacities to 5kN (1,125 Lb), optional crosshead strokes, testing speeds, thermoelectric heaters and coolers.
The ADMET eXpert 2600 series dual column testing machines tackle the toughest tests with their superior axial alignment, stiffness, and crosshead guidance. A simple design allows for lower cost, faster delivery, and years of maintenance free operation. All eXpert systems are capable of performing compression tension, and flexure tests.
The T3 is an advanced new eddy current probe and driver combination developed by Monitran Technology in partnership with QinetiQ.
HORIBA Scientific has unveiled the Smart SE Spectroscopic Ellipsometer which is a powerful, versatile and cost-effective instrument for quick and precise thin film measurements.
The micro-gloss has been an excellent industry standard in gloss measurement for several years.
The New Sheen Glossmaster range of glossmeters have been designed mainly with the user in mind. They now offer greater versatility and ease of use, these instruments have far superior data handling capabilities than ever before.
Most imaging applications use more than one fluorescent probe e.g. FRET, dual color imaging, co-localization studies. Andor Technology offers a highly flexible and versatile solution for researchers working with multi-wavelength imaging.
A highly precise coating applicator is required to paint application onto a drawdown chart to achieve a consistent dry paint film.
This hydraulic pull-off type tester is fitted with a flexible hose, so that test can be performed on difficult to reach area, e.g. internal or external pipe surfaces.
Oxford Instruments provides a range of PCB and copper coating thickness gauges designed for non-destructive thickness measurement of foil, laminate, surface and through-hole copper for PCD assemblers and manufacturers.
The ultimate eddy-current test system for use during production fastest material sorting an high-resolution crack detection.
Labthink offers mechanical contacting-based i-Thickness 4400 Auto-Feed Thickness Tester that comes with an auto sample feeding system.
We manufacture our coating thickness gauges for convenience and ease-of-use in addition to accuracy, and design them in a variety of models (handheld, benchtop, multi-purpose).
Oxford Instruments offers a range of paint and powder coating thickness gauges designed specifically for measuring coating thickness over ferrous and non-ferrous metal substrates.
EP5, EP12 and EP20 tools from Semilab are based on Ellipsometric porosimetry (EP) having various degree of automation and wafer size capabilities. EP measures the change of the optical properties and thickness of the materials during adsorption and desorption of either an organic solvent or water at reduced pressure.
The Hauzer Flexicoat® 850 coating machine is a multi-purpose device from the Hauzer Flexicoat® series.
The Industrial Calotest (CATi) is designed to measure the thickness of coatings within two to five minutes. This industrial version has a motor attached to a hydraulic arm, enabling users to target samples of different sizes.
UNECS-3000A is an advanced, ultra-fast spectroscopic ellipsometer that uses snap shot measurement technique with automated mapping to measure optical and thickness parameters of thin films.
Oerlikon Leybold Vacuum developed the UNIVEX line of multi-use vacuum coating systems for research and development purposes and for building pilot production systems. These systems can also be used for vacuum coating applications and for vacuum process engineering experiments.
The new Mikrotest 7 combines the proven measuring principle of magnetic attraction with digital technology. It offers both high resolution measurement and ease of use. The measurement principle is still based on the attraction force of a permanent magnet on steel as defined in all International Standards.
The TQC Cylindrical Bend Test is a highly rugged yet elegant testing instrument which can be used to determine the elongation, elasticity and adhesion of a paint film at bending stress.
The WT-2000PVN is a tabletop measurement system, capable of performing a variety of measurements on PV cells, wafers, and blocks. The base system includes the overhead functions, and you configure the measurement capabilities to match your specific needs.
Calotest is used to determine the thickness of a coating. The Compact Calotest (CATc) is designed to determine coatings with thicknesses ranging between 0.1 µm and 50 µm.
Integrated probe for measurements on ferrous and non-ferrous materials, with automatic substrate recognition.
The all new US-454A brings the best innovative multi-frequency eddy current technology to market. Built from the rugged US-454 architecture, UniWest's engineering team has transformed eddy current testing by offering single and multi frequency inspection, frequency mixing capabilities, enhanced signal to noise, USB, ethernet and data storage capability; along with unprecendented digital strip chart data collection.
The X-ray fluorescence (XRF) analysis is a powerful quantitative and qualitative tool designed for the analysis of film composition and thickness, identification of trace and specific elements in complex sample matrices, and establishing elemental concentration by weight of solutions and solids.
The PT-5 panel tester Gen5 is designed to measure properties of thin film solar cells that meet the GEN-5 standard. It incorporates an ellipsometer, a non-contact resistivity mapper and a haze meter.