Newly published data demonstrate how the Morphologi G3 automated particle characterization system from Malvern Panalytical is being used to examine pollen in support of allergy research.
Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopes (AFMs) to the nanoscience community, announced today the launch of its Dimension® Icon® P-Series of Atomic Force Microscope Systems. Now, nanoscale researchers with limited budgets will have access to the latest generation of the world’s most utilized and flexible AFM platform.
Canada's National Institute for Nanotechnology will soon be home to a new electron microscopy research and product development centre. The Hitachi Electron Microscopy Products Development Centre (HEMiC) at the Nation...
Physicists at New York University have developed a technique to record three-dimensional movies of microscopic systems, such as biological molecules, through holographic video. The work, which is reported in Optics Expre...
Asylum Research and R&D Magazine have announced that Asylum’s Cypher Atomic Force Microscope (AFM) has been awarded the R&D100 Award for 2009. Cypher is the first completely new small sample AFM/SPM in over a decade and is the world’s highest resolution AFM.
Novelx, Inc. was just selected for a prestigious R&D 100 Award for one of the 100 most technologically significant new products in 2009. R&D Magazine recognized the Novelx mySEM® for miniaturizing and driving the cost out of the core technology inside a scanning electron microscope (SEM).
Scientists at DuPont and Lehigh University have refined a technique, first published in 2003, to sort carbon nanotubes using specific sequences of DNA. This technique offers the first demonstration that nanotubes can be ...
A new microscope that views the subatomic universe -- the first of its kind in the world -- is being built for the University of Victoria, Canada, in collaboration with Hitachi High-Technologies.
The new microscope-c...
Applied Materials, Inc. today announced that its Applied SEMVision™ G4 Defect Analysis platform has been honored with the prestigious Editors' Choice Best Product Award by Semiconductor International (SI) magazine.
Infrared Thermography is a technique that can be employed in the plastic industry for process optimization and quality improvement, as well as in the development of new tools. In the thermoplastic injection process, a large amount of information about the transformation process can be collected by taking thermographic images of the recently injected pieces that are still in the mould or that have just been extracted.
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