Jun 29 2009
Detecting and quantifying particles, pores and grains have never been easier. With the new Particle & Pore Analysis Module from Image Metrology you can detect any type of surface feature on virtually any background.
With just a few mouse clicks you can generate spread sheet style statistics and advanced histograms. You can even study the correlation between parameters such as particle height and area in scatter plots.
The user friendly interface lets you post process your results easily and choose between various particle visualizations including fiber, skeleton, contour and semitransparent fill.
Improved Template Design Tool for Batch Processing
SPIP version 5 includes a new Office 2007 compatiable utility for designing and editing batch report templates. In addition, all templates are now processed significantly faster when running batch scripts.
10% Discount on All Orders Including Particle & Pore Analysis
Order a new or updated SPIP license including the Particle & Pore Analysis Module before August 31st 2009 and we will grant you a 10% discount on your entire order.
The new module replaces the popular Grain Analysis Module. If you already have the Grain Analysis Module, you can get the new Particle & Pore Analysis Module simply by updating your license to version 5.