IEM 11 and IEM 11+ from Inovenso

IEM 11

The IEM 11 from Inovenso has the following features:

• Magnification up to 150,000x
• Combined SE and BSE images
• Low energy consumption
• Intuitive user interface
• High quality images (5 nm resolution)
• Easy navigation with the “navigation mode”
• Precise control with a joystick and the “driving mode”

Specifications

• Detector: SE Detector
• Stage: Auto Stage (X: 35 mmY: 35 mm,T: 0 to 45^o) Manual Stage (Z: 5 to 50 mm)
• Image Shift: X, Y, R(Rotation)
• Operating System: Microsoft Windows 7
• Dimensions (mm): 400(W) x 600(L) x 550(H)
• Dimensions (inch): 15,74(W) x 23,62(L) x 21,65(H)
• Weight: 85(kgs) - 187(lbs)
• Magnification: x20 ^~ x100,000 (Efficient: ^~x50,000)
• Acc Voltage: 1 ~ 30 kV (1kV increments)
• Electron Gun: Tungsten Filament (W)

Removable BSE Detector

By applying 4-channel BSE detector, topography and composition functions are available. These functions are optional and can be opted out.

SE: Composition
Material: Alloy Metal

BSE: Topography
Material: Alloy Metal

Low Voltage Analysis

Information on the morphology of a sample can be attained with voltage ranging from 1 to 30 kV.

ACC.Voltage: 20 kV / SE Image / Mag: x50,000

ACC.Voltage : 5 kV / SE Image / Mag: x50,000

Driving Mode

2-axes stage motion, focus and magnification can be effortlessly motorized and controlled with the help of a joystick.

Combined Signaling

BSE and SE can be detected together and separately.

Highest Resolution

Provides superior quality images (5 nm resolution, Max accelerating voltage: 30 kV).

ACC. Voltage : 30 kV / SE Image / Mag : x100,000

Driving Mode

By loading seven samples simultaneously into a multi holder, samples can be effortlessly located with a mini map, live display and a sample area.

IEM 11+

The IEM 11+ from Inovenso has the following features:

• High quality images (5 nm resolution)
• Low energy consumption
• Intuitive user interface
• Magnification up to 150,000x
• Combined SE and BSE images
• Easy navigation with the “navigation mode”
• Precise control with a joystick and the “driving mode”
• Oxford: 130 eV at Mnk, C(6) ~ U(92) / EDAX:133 eV at Mnk, Be(4) ~ U(92)

Specifications

• Detector: SE and BSE Detectors
• EDS: Oxford: 130 eV at Mnk, C(6) ~ U(92) EDAX: 133 eV at Mnk, Be(4) ~ U(92)
• Magnification: x20 ^~ x150,000 (Efficient: ^~x80,000)
• Acc Voltage: 1 ~ 30 kV (1 kV increments)
• Electron Gun: Tungsten Filament (W)
• Image Shift: Auto Stage (X: 35 mm, Y: 35 mm, T: 0 to 45^o) Manual Stage (Z: 5 to 50 mm)
• Operating System: Microsoft Windows 7
• Weight: 95(kgs)- 210(lbs)
• Dimensions (mm): 400(W) x 600(L) x 550(H)
• Dimensions (inch): 15,74(W) x 23,62(L) x 21,65(H)

Brand: Oxford

• Multilingual operation
• Fast and easy analysis with flow chart style menu
• Tru-Q Analysis Engine: accurate result by multi algorithm
• Quantitative Mapping (QuantMap, QuantLineScan)
• Diverse element analysis functions: point and ID, line scan, mapping, line overlap and background correction

Brand: EDAX

• Highest performance SDD
• Sensor size: 30 mm²
• High quality light element analysis: Be(4) ~ Am(95)
• Diverse Element Analysis Functions: Point and ID, Mapping, Line Scan

Oxford

Report and Data Save

Different report templates are provided. Users can produce a report with the Report Generate function. Data can be saved, printed, copied and e-mailed directly.

Available in Various Languages

The program is offered in different languages including English, Chinese simplified, Russian, French, Korean, Japanese and Portuguese.

LineScan

Linescan defines elemental concentration differences along a line defined by the users. Linescans are corrected for any false variations due to X-ray background and peak overlaps.

Point and ID

Spectrum that displays elemental composition can be attained from multiple points and areas.

EDAX

Outstanding Light Element Performance

Silicon nitride window enhances performance for light elements at low energies.

EDS Reporting

The TEAMTM EDS Smart Data Management system for SEM attains new levels of flexibility and ease with simplified file management and dynamic reporting.

Fast, Efficient Results for Industrial Needs

All results can be reviewed anytime. Spectrum, quantitative mapping and microelement detection are construed accurately.