The alpha300 A atomic force microscope from WITec is a modular nano-imaging system integrated with a research-grade optical microscope. It provides high-resolution sample survey, accurate cantilever alignment, and exceptional optical access. A proprietary AFM objective allows simultaneous cantilever and sample observation
The alpha300 A was designed and developed to be used with other imaging methods such as confocal Raman imaging and SNOM. Researchers can switch between the different techniques by just rotating the microscope objective turret.
Whether in air or liquid environments, or even with delicate and soft samples, the alpha300 A is ideally suited to the investigation of topographic structures at the highest resolution. For high-performance materials research imaging tasks, the alpha300 A can be equipped with the Pulsed Force Mode, allowing local surface properties such as local adhesion or stiffness to be imaged along with topography on the nanometer scale.
Other microscopy techniques than can be incorporated with the AFM include fluorescence, polarization analysis, photoluminescence and dark field and bright field imaging.
Key Features of the alpha300 A
- A wide range of available AFM modes
- Surface characterization can be achieved on the nanometer scale
- Can be combined with near-field optical microscopy (SNOM) and Raman imaging in one instrument
- Sample access from all directions
- Easy to use in liquids and air
- TrueScan™ controlled scanning stages
- Exclusive cantilever method for easy cantilever exchange and alignment
AFM topography image of a steel surface. Image Credit: WITec GmbH
Digital Pulsed Force Mode image of fossilized bacteria. Image Credit: WITec GmbH
Magnetic Force Measurement of a hard drive disk. The measurements were performed using AC mode technique with magnetic tips. Image Credit: WITec GmbH