Equipment |X-Ray Metrology

X-Ray Metrology

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for X-Ray Metrology

Once submitted, we will try and place you in contact with a suitable X-Ray Metrology supplier within 48 hours.

Equipment

X-Ray System –A compact and ideal for submicron X-ray and CT applications
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X-Ray System –Versatile with a large scanning envelope for inspecting small components to large parts
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X-Ray System for Comprehensive X-Ray Analysis – Modular system with the largest scanning envelope to scan large parts
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Small Footprint X-Ray System for In-Depth Imaging – Compact with capabilities typically available on larger X-ray CT systems
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We will try and place you in contact with a suitable supplier within 48 hours.