Article - 12 Nov 2013
Raman spectroscopy is a well-advanced and adopted quantitative technique for molecular identification. However, in recent years, the use of Raman has been extended to perform accurate and quality...
Article - 30 Apr 2007
Spectroscopic ellipsometry offers highly accurate characterization of TFT-LCD display panels based on a-Si and LTPS technologies. Spectroscopic ellipsometry measurements allow determination of the...
Article - 15 Aug 2005
TiO2 films are extensively studied because of their interesting chemical, electrical and optical properties. In this article, the Spectroscopic Ellipsometry (SE), non-destructive optical technique is...
Article - 7 Jan 2002
One of the barriers to wide spread acceptance of solar energy is the cost of photovoltaic systems. This article looks at ways these costs can be reduced such as capital costs, deposition rates, other...
Article - 20 Apr 2007
Solar cell research is on making solar cells cheaper and more efficient. This requires accurate characterization of thin film thickness and absorption efficiency. Spectroscopic ellipsometry is an...
Article - 7 Feb 2012
By using the ICP-CVD method, Oxford Instruments have developed a deposition process in which high quality films can be deposited with high density plasma, low deposition pressures and temperatures....
Article - 19 Dec 2013
The research-grade VeeMAX from Pike Technologies is a staple variable-angle specular reflection/ATR accessory featuring sophisticated optical design. The accessory has been used in many different...
Article - 7 Dec 2018
This article discusses the limitations of photovoltaics (PV), and how we may overcome them in the future.
Article - 8 Nov 2018
This article discusses for atomic layer deposition (ALD) assists in creating stable and efficient perovskite solar cells.
Article - 31 Oct 2017
Fouling, coking or simply “sticking” is a costly surface problem that occurs in most industrial applications. Surface fouling causes contamination, promotes corrosion, reduces flow, increases...