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  • Equipment
    The Ar Gas Cluster Ion Source is ideal for depth profiling inorganic materials in Ar+ monomer mode and organic materials in Arn+ cluster mode.
  • Equipment
    OIM Analysis™ is a technique based on the automated collection and analysis of EBSD patterns.
  • Equipment
    The OIM Matrix™ software package, which is offered as an option with OIM Analysis™, allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons.
  • Equipment
    The OIM Matrix™ software package, which is offered as an option with OIM Analysis™, allows users to simulate EBSD patterns based on the physics of dynamical diffraction of electrons.
  • Equipment
    The AXIS Nova from Kratos Analytical is a highly automated x-ray photoelectron spectrometer with the uncompromised spectroscopic performance.