Posted in | Nanomaterials

A New Concept in Semiconductor Material/Device Characterization that Combines the Benefits of Both DC and AC Sourcing and Measuring

Traditionally, material/device characterization applications have required a combination of specialized DC and AC instruments – often resulting in complicated setups that also require highly skilled operators to integrate and operate equipment of mixed brands, computer interfaces, and types. Such setups often employ long cables between instruments and the sample, and as channel counts increase, so do the challenges of minimizing system noise and ensuring channel-to-channel timing and reference frequency synchronization. 

This webinar will explore a new approach: the use of a highly synchronized, AC + DC sourcing and measurement system that utilizes remote analog modules for optimum sensitivity and noise rejection to accurately characterize samples. The instrument architecture for directing low-level measurements from DC to 100 kHz ensures inherently synchronized data from 1 to 3 measurement channels which can be coordinated with up to 3 source channels or an external reference signal. In this way, this novel platform is highly adaptable for a range of R&D applications, including photosensor development, novel photovoltaic material characterization, and low-noise transistor measurements. 

Attend this Webinar to Learn How the Architecture:

  • Eliminates the need for mixed instrument setups by combining the capabilities of DC picoammeters, voltmeters, and AC lock-in amplifiers
  • Minimizes the length of signal cables, which in turn minimizes cabling parasitics (leakage, noise, resistance, and reactance)
  • Uses a unique real-time sampling technology to ensure synchronous sourcing and measuring across multiple channels
  • Uses a single and simple touchscreen user interface that allows for easier setup and reconfiguration of a material/device characterization application.

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