Oct 22 2008
The new X-MET5100 X-ray fluorescence (XRF) analyzer takes hand-held analytical performance to a completely new level.
The X-MET5100 handheld XRF analyzer is capable of analyzing light elements.
X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers fast, highly accurate measurement and enables light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments - a truly huge step forward for hand-held X-ray fluorescence analysis.
PMI inspectors, scrap sorters and in particular the aerospace industry finally have the robust, XRF Light Element mobile testing tool they have been waiting for. The X-MET5100 assures laboratory quality analysis of Aluminum and Titanium alloys, as well as Copper, Nickel and Steel with Light Element capability and sensitivity that is unequalled.
The powerful combination of the SDD, 45 kV X-ray tube and traceable Empirical Calibration means that X-MET5100 can accurately analyze and identify metal alloys in just 1 second. Restricted elements, lead in toys, contaminants in soil and small concentrations in ores can be accurately measured at speeds previously not possible. Trace element results, down to ppm level, can be achieved in just seconds. The unparalleled speed and accuracy of the X-MET5100 ensure high throughput for real-time results that can be trusted.
X-MET5100 compliments Oxford Instruments already highly successful X-MET5000 introduced for routine multi-element analysis earlier this year. Both instruments are IP54 (NEMA 3) approved for dust and water splash protection and are built to withstand the harshest analytical conditions.
The X-MET5100 will be on show at the International Titanium Conference and Exhibition, Las Vegas, September 21-25, booth 315 and at the Aluminum World Trade Fair and Conference, Essen, Germany, 22-25 September, booth 1G11, Hall 1.