Bruker’s OPTIMUS™ Detector Head for TKD in SEM

The OPTIMUS™ detector head from Bruker is designed as an additional, interchangable detector head for their e-flash EBSD detector range. It provides the ideal geometric conditions to perform Transmission Kikuchi Diffraction (TKD) in the scanning electron microscope (SEM). The advanced detector head consists of a horizontal phosphor screen which can be placed beneath electron-transparent samples in order to detect the strongest diffracted electron signal.

The OPTIMUS™ is compatible all Bruker e-Flash EBSD detectors, enabling a single detector to be used for both EBSD and TKD.

There are two main benefits of using the OPTIMUS™ over an EBSD detector that has a vertical screen:

  • The strongest possible signal is acquired, allowing users to either obtain data faster, or acquire enhanced lateral spatial resolution at lower acceleration voltage and/or beam currents. A low acceleration voltage enables the analysis of very thin samples as it increases the probability of interaction with the crystal lattice.
  • The obtained patterns exhibit the lowest possible gnomic projection distortion, which leads to improved band detection and indexing accuracy

Bruker’s OPTIMUS™ Detector Head for TKD in SEM

OPTIMUS Sample Holder (Top View)
OPTIMUS Sic Phase Map
OPTIMUS (side view)

Key Features

The main features of the OPTIMUS™ detector head are listed below:

  • Electron energies down to 5 keV and probe currents down to 100 pA can be used
  • User-interchangeable within minutes
  • Automatic collision protection system
  • Integrated in ESPRIT 2 software through TKD mode
  • Integrated ARGUS™ imaging system for dark and bright field image acquisition
  • Seamlessly integrates with the Bruker TKD sample holder and all XFlash® EDS detectors

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