EDS on SEM - Fast Elemental Analysis for Electron Microscopes

The QUANTAX EDS system for SEM, FIB-SEM and EPMA is equipped with the fast, precise and reliable XFlash® 7 detector – allowing users to rapidly and accurately carry out the elemental analysis of samples such as advanced materials, minerals, electronic components and more.

  • Reach an unmatched analytical throughout of up to 1,000,000 kps
  • Access a complete atomic database of more than 2,200 elemental lines to quantify even the most complex data
  • Collect data at the largest solid angle available, >1.1 sr, thanks to optimized geometry

The XFlash® 7 EDS detector series provides the largest solid angle for X-ray and the highest throughput, setting standards for Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB-SEM) and Electron Probe Microanalysis (EPMA).

The detector’s superior energy resolution helps users attain the highest spectral performance possible.

In addition to standard EDS detectors the XFlash® FlatQUAD is also available and is perfectly suited for the analysis of beam-sensitive samples such as samples and biological materials. The XFlash® FlatQUAD allows for measurement at a low keV and low beam current facilitating accurate, high-resolution elemental mapping of delicate samples.

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Make Elemental Analysis More Efficient

  • Seamless integration of four analytical methods - EDS, WDS, EBSD, and micro-XRF on SEM – in the ESPRIT software suite
  • Detect small elemental quantities with a low detection limit
  • Benefit from accurate and reliable quantification results with the optimized geometry minimizing background noise and helping avoid unwanted absorption.
  • Gain very precise results faster with individually optimized EDS systems, ensuring unmatched speed and precision. 
  • Shorten measurement time with maximized throughput, enabling mapping and quantification at all settings with no limitation of data size.
XFlash 7 - The latest EDS Detector Series for Electron Microscopes

Video Credit: Bruker Nano Analytics

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