Equipment | Microscopes |Scanning Transmission Electron Microscopes (STEM)

Scanning Transmission Electron Microscopes (STEM)

Scanning transmission electron microscopes (STEM) combine the functionality of transmission electron microscopy (TEM) and scanning electron microscopy (SEM). Like TEM, STEM analyzes a beam of electrons transmitted by very thin sample. Like SEM, the STEM process scans a focused beam of electrons across the sample in a rectangular pattern.

Interactions between the electrons and the sample produce a signal, which is used to create a virtual image.

STEM involves the analysis of other signals that can't be spatially correlated in TEM, such as scattered beam electrons, distinctive X-rays, and electron energy loss. STEM also has a much better spatial resolution than SEM.

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