The JEM-F200 “F2” Multipurpose Analytical S/TEM has a Cold Field Emission Gun and twin Silicon Drift Detectors, making it the only advanced analytical, high throughput 200kV S/TEM in its class. The “F2” is a simple-to-use, exceptionally stable, high-resolution imaging and analytical 200kV TEM that incorporates the latest JEOL advancements.

The F2 is a multi-purpose workhorse system with sophisticated capabilities that no other non-aberration corrected S/TEM can match.

The F2 is a high-performance analytical S/TEM thanks to the increased probe current from the Cold FEG and twin EDS detectors. The next-generation JEOL Cold-FEG delivers high energy precision electron energy loss spectroscopy (EELS) for quick detection of chemical bonding states thanks to its high brightness/narrow energy spread.

For X-Ray analysis, dual Silicon Drift Detectors (SDD) provide the highest sensitivity and throughput. De-Scan is also used in the new Advanced Scan System to accomplish wide-field STEM-EELs spectrum imaging.

The F2 is equipped with a quad lens condenser system to independently control electron beam intensity (spot size) and convergence angle.

The F2 is also easier to operate, with more adaptability and capability than ever before in a non-aberration adjusted S/TEM. At the touch of a button, more than 100 beam conditions can be selected, and previous settings can be simply recalled. The ECO option reduces the amount of energy used.

The SpecPorter, a unique automated sample holder transfer device, makes loading samples easier than ever before. The PicoStage performs accurate, high-speed sample movements in 0.5 nm steps once loaded, allowing the operator to smoothly adjust the field of view over a large spatial scale range from millimeters to picometers.

Key Features

  • Intuitive and efficient operation
  • Advanced scan system
  • SpecPorter is a sample holder transfer system that is fully automated
  • Quad lens condenser system
  • Cold FEG with narrow energy spread
  • Pico stage drive for ultra-fast, high-precision field-of-view movement
  • Dual Silicon Drift Detectors
JEOL JEM-F200 Multi-purpose Electron Microscope

Video Credit: JEOL USA, Inc.

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