Rigaku Corporation, a group company of Rigaku Holdings Corporation and a global solutions partner in X-ray analytical instrumentation, will introduce the DicifferX™ Microarea Edition at JASIS 2026. This X-ray diffractometer enables materials characterization of microareas only a few tens of micrometers in size in a laboratory environment.
As electronic devices become smaller, electronic components such as multilayer ceramic capacitors (MLCCs) are becoming increasingly miniaturized and more densely integrated, driving demand for materials characterization of microareas only a few tens of micrometers in size. Conventional micro-area measurements present challenges such as the loss of X-ray intensity caused by reducing the beam size and shifts in the irradiation position caused by even slight mechanical deflection of the instrument. Purpose-built to overcome these technical challenges, the DicifferX Microarea Edition enables stable measurement of micro-areas at the scale of a few tens of micrometers.
Precise and Stable X-Ray Irradiation of Targeted Micro-Areas
The fixed incident X-ray source structurally minimizes factors that can cause shifts in the irradiation position. By precisely irradiating the targeted area, the system delivers highly reliable diffraction data.
High-Precision Goniometer Optimized for Micro-Area Measurement with Axis Intersection Correction
The system incorporates a high-precision multi-axis goniometer. Position deviations that cannot be fully eliminated through mechanical precision alone are corrected by software, maintaining high positional accuracy and enabling accurate measurement of microareas only a few tens of micrometers in size.
High-intensity Microbeam with a High-Brilliance X-Ray Source and Multilayer Focusing Mirror
A high-brilliance point-focus X-ray source combined with a multilayer focusing mirror delivers approximately 100 times the X-ray intensity in the high-resolution configuration and approximately 330 times in the high-intensity configuration, compared with a general-purpose XRD system.
Efficient Micro-Area Data Acquisition with a 2D Detector
The HyPix-3000 2D detector, with its wide detection area, efficiently acquires diffraction data from micro-areas. The system supports qualitative and quantitative evaluation of minute areas of discoloration and foreign materials, as well as pole figure measurements, residual stress measurements, and multipoint mapping.
“The DicifferX Microarea Edition represents a significant leap in our ability to characterize increasingly miniaturized electronic components with unprecedented stability and precision.” - Jun Kawakami, Rigaku Corporation