The NEX QC II Series is a compact benchtop XRF (EDXRF) platform designed for routine elemental analysis in industrial quality control applications. Suitable for laboratories, plant environments, and production settings, these systems provide rapid, non-destructive analysis across a broad range of sample types, including solids, liquids, powders, coatings, and thin films. Their combination of speed, ease of use, and small footprint makes them well-suited for dependable day-to-day testing with low operating costs.
The series includes two model configurations: the NEX QC II for standard quality control applications and the NEX QC II+ for applications requiring enhanced detector performance. Both models streamline operation through an intuitive touchscreen interface, an integrated computer, and a built-in printer, reducing the need for extensive operator training or external hardware.
For users requiring expanded analytical flexibility, the first-generation NEX QC+ QuantEZ remains available. This system offers enhanced method development capabilities, more advanced calibration options, and optional compliance features such as 21 CFR Part 11 support.
System Features
- Benchtop EDXRF for routine elemental testing
- Fast multi-element analysis from low ppm to high wt%
- Non-destructive analysis from sodium (Na) to uranium (U)
- Supports solids, liquids, powders, coatings, and thin films
- Small footprint for QC labs and industrial environments
- Intuitive touchscreen operation with minimal training requirements
- Built-in computer and printer (no external PC required)
- Low cost of ownership with minimal sample preparation
- Easy data export and LIMS-ready connectivity
- Optional autosamplers and a carrying case are available
- Backed by manufacturer warranty options
NEX QC II Series | Benchtop XRF for At-Line Elemental Testing & Quality Control