The quality of materials is becoming increasingly important in battery research and manufacture. For instance, minute impurities in the NCM powder can have catastrophic effects on the finished product.
High-resolution SEM imaging with EDS analysis for chemistry is needed to trace these contaminants effectively. When fully automated, this combination is a powerful tool for powder quality inspection.
Phenom Particlex Battery Desktop Sem Key Features
Conductance Classifications
Users can sort based on particle conductance by assigning a conductance label to each class of particles. This allows users to assess the impact of contamination much more accurately since a small organic contamination is not as severe as a metallic conductive contamination.
Ternary Diagram
A ternary diagram with representations for every particle can be created to see the overall chemistry of the particle population. With Ni, Co, and Mn on each axis, the outyears and general trends can be easily spotted.
Phenom ParticleX Battery Desktop SEM Specifications
Source: Thermo Scientific - Materials and Structural Analysis
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| Electron imaging |
- Long lifetime thermionic source (CeB6 )
- Multiple beam currents
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| Electron imaging magnification range |
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| Light imaging magnification |
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| Resolution |
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| Image resolution options |
- 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
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| Acceleration voltages |
- Default: 5 kV, 10 kV and 15 kV
- Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
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| Vacuum levels |
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| Detector |
- Backscattered electron detector (standard)
- Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
- Secondary electron detector (optional)
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| Sample size |
- Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
- Max. 40 mm height (optional up to 65 mm)
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| Sample loading time |
- Light optical <5 s
- Electron optical <60 s
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