Equipment | Microscopes | Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM)

A scanning electron microscope or SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes have developed new areas of study in the medical and physical science communities. The SEM has allowed researchers to examine a much bigger variety of specimens.
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Featured Equipment
World's Fastest Desktop SEM - Phenom G2 Pro Scanning Electron Microscope
Phenom-World is focused on giving you the opportunity to process ever-smaller samples and increase your productivity, while bringing down the costs of analysis. The Phenom G2 pro is the most effective, versatile and fastest desktop SEM available. Its unique design makes it suitable for use in a large variety of applications and markets.
Other Equipment
AURIGA CrossBeam Workstation (FIB-SEM) from Carl Zeiss
AURIGA® the new CrossBeam® Workstation (FIB-SEM) from Carl Zeiss SMT exactly delivers all this – on a nanoscopic scale. Using the best-in-class FIB column and the proprietary GEMINI e-Beam column from Carl Zeiss, together with a completely new designed vacuum chamber for advanced analytics, AURIGA® assists you in obtaining the maximum information possible out of your sample.
Raman System for SEM Systems from Renishaw
The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.
Shuttle & Find for Material Analysis from Carl Zeiss
Carl Zeiss offers Shuttle & Find which is a correlative microscopy interface for light and electron microscopes and is suitable for materials analysis.
SIGMA Advanced Analytical Scanning Electron Microscope SEM from Carl Zeiss
The SIGMA, featuring the unique and proven GEMINI® technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS).
FEI Magellan 400L XHR Scanning Electron Microscope
The world's first extreme high-resolution (XHR) SEM, the FEI® Magellan™ 400L system delivers unmatched surface-sensitive imaging performance at sub-nanometer resolution, without compromising the analytical capabilities, sample flexibility or ease of use of a traditional analytical SEM. New and innovative electron-optical elements together with field-proven, industry-leading stage technology deliver breathtaking performance and rock-solid reliability.
Desktop Scanning Electron Microscope - Phenom G2 Pure SEM
The Phenom G2 pure desktop scanning electron microscope (SEM) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom G2 pure is equipped with the basic fundamentals for meeting imaging needs.
Phenom proX Desktop Scanning Electron Microscope Now Comes with Elemental Mapping Functionality
Phenom-World, a global supplier of desktop scanning electron microscopes (SEMs) for sub-micron-scale applications, has launched the Elemental Mapping functionality for the Phenom proX desktop SEM.
MTI Instruments SEMtester - Tensile, Compression, Bending and Fatigure Testing for AFM, SPM, SEM and Optical Microscopes
MTII/Fullam offers a unique, compact test system specifically designed to fit inside scanning electron microscopes. Capable of performing fatigue, compression, bending and tensile testing, they are ideal testers for researchers and material scientists. During testing, crack propagation, grain rotation and other effects of mechanical stress can be observed under high magnification in an electron microscope.
LVEM5 Multi-Mode Electron Microscope from Delong (TEM, SEM, STEM and Electron Diffraction)
The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.
Sample Holders for Phenom G2 Desktop Scanning Electron Microscope SEM
For both the Phenom™ G2 pure and Phenom G2 pro a large variety of sample holders is available in order to extend the sample acceptance. These holders are designed for optimizing sample loading speed and guarantee the fastest time to image available in the market.
PSEM eXplorer - Integrated SEM/EDX System
The PSEM platform has been in the market for more than twenty years providing solutions in a variety of industries, including forensics, health sciences, industrial automation, and metals. The newest generation, the PSEM eXplorer from Aspex Corp, is a small footprint Scanning Electron Microscope integrated with liquid-nitrogen-free energy dispersive spectrometers, all possible due to the Perception Software Suite for both automated and manual analysis.
Tabletop Scanning Electron Microscope (SEM) TM300 from Hitachi
It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample preparation such as coating with metal films is required for hydrated, oily or non-conducting samples, and TM3000 is easy to use like a digital camera.
The PSEM eXpress - Personal Scanning Electron Microscope from Aspex
The PSEM eXpress from Aspex Corp is a benchtop personal scanning electron microscope (PSEM) equipped with a Backscatter Electron Detector (BSED) and an optional Energy Dispersive Spectrometer (EDS). The eXpress is smaller and more cost-effective than traditional scanning electron microscopes. In addition it has a greater depth of field and greater resolution than a traditional optical microscope.
Field Emission Scanning Electron Microscope (FE-SEM) 8500 from Agilent Technologies
The Agilent 8500 field emission scanning electron microscope (FE-SEM) has a small footprint and provides researchers with a FE-SEM in their own laboratory.
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