Scanning Electron Microscopes (SEM) RSS Feed - Scanning Electron Microscopes (SEM)

A scanning electron microscope or SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes have developed new areas of study in the medical and physical science communities. The SEM has allowed researchers to examine a much bigger variety of specimens.
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Featured Equipment
The Phenom Pro is Phenom-World’s high-end imaging desktop SEM. In combination with a large range of sample-holders and automated system software, it can be tailored to suit a multitude of applications.
The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.
Other Equipment
Carl Zeiss offers Shuttle & Find which is a correlative microscopy interface for light and electron microscopes and is suitable for materials analysis.
The PSEM platform has been in the market for more than twenty years providing solutions in a variety of industries, including forensics, health sciences, industrial automation, and metals. The newest generation, the PSEM eXplorer from Aspex Corp, is a small footprint Scanning Electron Microscope integrated with liquid-nitrogen-free energy dispersive spectrometers, all possible due to the Perception Software Suite for both automated and manual analysis.
The S-3400N is a world class variable pressure SEM. It was built on the success of the S-3000 series instruments and offers advancements in automation that include full filament saturation and “no touch” objective aperture alignment.
The new TM3030 features improved electron optics, higher magnification, and built-in image processing to further improve image quality and resolution at lower accelerating voltage.
The variable pressure SEM, Hitachi S-3700N has a specimen chamber that can handle specimen sizes up to 300mm in diameter and 110mm in height at analytical working distance of 10mm.
The SIGMA, featuring the unique and proven GEMINI® technology from Carl Zeiss, provides outstanding imaging and analytical results from a field emission microscope with the capability to handle all material types. Material analysis at high resolution is provided by the class leading X-ray geometry for both energy and wavelength dispersive spectroscopy (EDS and WDS).
WITec’s RISE microscope integrates the alpha300 confocal Raman imaging and all the features of a stand-alone scanning electron microscope (SEM) in a single instrument. Through RISE microscopy, ultra-structural surface properties can be connected to molecular compound data.
For both the Phenom™ Pure and Phenom Pro, a large variety of sample holders is available in order to extend the sample acceptance. These holders are designed for optimizing sample loading speed and guarantee the fastest time to image available in the market.
In combination with the Phenom desktop SEM, the Fibermetric application allows you to produce accurate size information from micro and nano fiber samples.
Every sample has its own specific demands. The shape of some samples requires flexible manipulation to obtain optimum imaging results. Samples can contain lines, holes, multi-layer structures or other specific features.
MTII/Fullam offers a unique, compact test system specifically designed to fit inside scanning electron microscopes. Capable of performing fatigue, compression, bending and tensile testing, they are ideal testers for researchers and material scientists. During testing, crack propagation, grain rotation and other effects of mechanical stress can be observed under high magnification in an electron microscope.
The Phenom ProX desktop SEM is the ultimate all-in-one imaging and X-ray analysis system. With the ProX, sample structures can be physically examined and their elemental composition determined.
In the life science field, the SECOM platform can be used for quickly and easily combining electron and light microscopy.
A scanning electron microscope’s tightly focused electron beam behaves like a radiating dipole source at the electron impact position.
The Phenom Pure desktop SEM is an ideal tool for the transition from light optical to electron microscopes. It is the most economical solution for high-resolution imaging, providing the best imaging results in its class.
The world's first extreme high-resolution (XHR) SEM, the FEI® Magellan™ 400L system delivers unmatched surface-sensitive imaging performance at sub-nanometer resolution, without compromising the analytical capabilities, sample flexibility or ease of use of a traditional analytical SEM. New and innovative electron-optical elements together with field-proven, industry-leading stage technology deliver breathtaking performance and rock-solid reliability.
The Agilent 8500 field emission scanning electron microscope (FE-SEM) has a small footprint and provides researchers with a FE-SEM in their own laboratory.
The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.
AURIGA® the new CrossBeam® Workstation (FIB-SEM) from Carl Zeiss SMT exactly delivers all this – on a nanoscopic scale. Using the best-in-class FIB column and the proprietary GEMINI e-Beam column from Carl Zeiss, together with a completely new designed vacuum chamber for advanced analytics, AURIGA® assists you in obtaining the maximum information possible out of your sample.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.
The PSEM eXpress from Aspex Corp is a benchtop personal scanning electron microscope (PSEM) equipped with a Backscatter Electron Detector (BSED) and an optional Energy Dispersive Spectrometer (EDS). The eXpress is smaller and more cost-effective than traditional scanning electron microscopes. In addition it has a greater depth of field and greater resolution than a traditional optical microscope.
The Temperature Controlled Sample Holder is able to control the temperature by cooling or heating the sample and therefore influence the humidity around it. This minimizes the charging effect of the electron beam and vacuum damage to the sample.
WITec has designed a sophisticated and reliable scanning near-field optical microscope called alpha300 S. The instrument includes an atomic force microscope (AFM, ), a scanning near-field optical microscope (SNOM), and a confocal microscope (CM) in a single instrument. Users can select AFM, CM or SNOM by simply rotating the objective turret.