Atomic Force Microscopes (AFM) RSS Feed - Atomic Force Microscopes (AFM)

Atomic force microscopes (AFM) are extremely high-resolution scanning probe microscopes, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Applications of AFM and other types of scanning probe microscopy continue to grow rapidly in number and include biological materials (e.g., studying DNA structure), polymeric materials (e.g., studying morphology, mechanical response, and thermal transitions), and semiconductors (e.g., detecting defects). In particular, AFM can be utilized to evaluate the surface quality of products such as contact lenses, optical components (mirrors, beamsplitters, etc.), and semiconductor wafers after various cleaning, etching, or other manufacturing processes.

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Equipment
The MFP-3D-BIO offers excellent sensitivity and highly accurate images and measurements possible on an inverted optical platform.
The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures.
The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility.
Rtec Instruments offers a combination system that is designed to accommodate both white light interferometer (optical profile) and AFM on the same platform.
The Solver Next is the first to offer a new concept in general purpose SPM. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time. The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements.
Designed to deliver an SPM platform which can grow and adapt to changing research needs, the Ambios Q-ScopeTM delivers long-term value as well as excellent imaging performance and high resolution measurements. Our modular approach to building your system minimizes cost, offers maximum flexibility, and allows custom configurations for special applications. Electronic control signal levels are available to all users via back-panel BNC access.
Angstrom Advanced’s AA3000 Scanning Probe Microscope is customized for research and industry applications, where users have to carry out fast and simple analysis.
The ESPM 3D is a specialized atomic force microscope designed for biological, material science and nanoscience applications. Its design allows for stand alone applications as well as easy intregation with other instruments such as confocal microscopes, spectral confocal microscopes, inverted optical microscopes, laser traps and other optical instruments. In addition, our scientists can help you to custom integrate or design a scanning probe microscope system that is specific to your application or group, saving you precious time and resources.
Nanosurf and Kleindiek offers an advanced plug-and-play retrofit solution for customers requiring quick 3D information in SEM.
WITec's new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image.
Regardless of sample size, the Agilent 5600LS large-stage AFM is ready to deliver high-resolution results. The versatile 5600LS is the world's only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with an AFM & STM scanner.
The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of applications to be performed easily.
Now, Asylum Research introduces the Cypher ES™, which adds full environmental control to the Cypher family.
The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale.
The WITec alpha500 is the first instrument on the market to combine Confocal Raman Microscopy for 3-D Chemical Imaging and Atomic Force Microscopy for high resolution structural imaging in an automated system.
The P300 Atomic Force Microscope manufactured by Ardic Instruments is a highly modular device that can be adapted for various experimental needs in the materials domain.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.
APE Research's TriA-SNOM microscope is capable of collecting optical signals in reflection, transmission and back-reflection modes. The instrument is suitable for surface science, optics and biological applications. Tri-SNOM is a microscope that allows the acquisition of three different and simultaneous optical signals, in addition to the topography of the sample.
We believe that future scientific breakthroughs have their origins in the present. Following that truth, we have developed a special student-orientated product: NanoEducator. More than a simple SPM, NanoEducator opens the door to nanotechnology education. We've designed it to be cost effective enough to equip a classroom with SPMs, complete with e-teach software, handbooks, and descriptive laboratory exercises - all the materials necessary to teach students crucial skills in nanotechnology.
Asylum’s MFP Nanoindenter is a true instrumented indenter and is the first AFM-based indenter not using cantilevers as part of the indenting mechanism.
Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and affordably-priced.
NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.
Anasys’ nanoIR2 AFM-based IR spectrometer is a powerful, full featured AFM that expands nanoscale IR to a wide range of real world samples.
The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors.
The Agilent 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Agilent Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.
The Nanosurf Isostage is an advanced and compact active vibration isolation system that helps protect scans from vibration disturbances. It comes with Adapter Plates for Mobile S, Easyscan 2, and Nanite AFM systems, thus providing an ideal vibration isolation solution for all Nanosurf AFM systems.
The P100 AFM from Ardic Instruments is ideal for high resolution measurement and imaging as it has a sub-nanometer Z-axis resolution. Ardic's unique astigmatic optical design produces a small 0.56µm laser spot size, permitting users to experiment with smaller and faster AFM cantilevers.
The LensAFM from Nanosurf is a powerful add-on to optical microscopes or 3D profilometers.
Nanosurf offers FluidFM, a powerful and advanced fluid force microscope that combines AFM and nanofluidics.
The XE-Bio is an innovative yet user-friendly Atomic Force Microscope designed specifically for biomedical and other advanced life science research. The modular design of the XE-Bio provides the user with a wide array of imaging modes including the revolutionary Scanning Ion Conductance Microscopy (SICM) module.
The MFP-3D Origin™ combines affordability and performance in the Asylum Research MFP-3D™ AFM family.
The MFP-3D Infinity AFM available from Asylum Research is the latest and most advanced atomic force microscope in the MFP-3D series.
VITA technology adds high resolution nanoscale thermal characterization capabilities to Bruker's Dimension® Icon® AFM, Dimension Edge AFM, and MultiMode® 8 SPM.
The Cypher AFM/SPM from Asylum Research is the first totally new small sample AFM/SPM in over a decade. The all new design gives the Cypher increased capabilities, more control, more functionality, more modularity, and more resolution – all with striking ease of use.
Bruker’s Dimension Icon AFM (atomic force microscope) offers excellent resolution, reliability and productivity, whilst maintaining the highest level of expandability.
The Bruker Innova Atomic Force Microscope offers a wide range of functionality for the physical, life, and material science industries.
The Inspire™ AFM-based IR nanocharacterization system developed by Bruker allows highest resolution nanoscale chemical and properties mapping with exceptional AFM performance.