FT-IR Microscope – Nicolet iN10 from Thermo Scientific

The Thermo Scientific Nicolet iN10 Infrared Microscope marks a milestone in productive, modern and economic infrared microanalysis.

The Nicolet iN 10 is an intelligent, novel and integrated IR microscope that offers the simplicity of an FT-IR spectrometer along with the capability of measuring samples down to a few microns.

The microscope is equipped with tools for streamlining the IR microanalysis workflow offering solutions that can be safely used by sophisticated analytical laboratories.

Features

The salient features of the fully Integrated FT-IR Microscope are:

  • An integrated design, which eliminates the need for an external spectrometer
  • Compact footprint saves laboratory space and budget
  • Room temperature detector eliminates the need for liquid nitrogen for samples down to 50-microns
  • Integral computer controlled automation enables access to all system settings from the computer
  • Programmable sample coordinates accelerates repetitive tasks
  • Dual monitor operation enables maximum viewing
  • Fully automated system performance verification offers maximum confidence
  • The intuitive OMNIC Picta User Interface ensures that simplified operation and automated routines are possible for most common micro-analysis routines
  • Spectral identification of pure compounds and mixtures with OMNIC Specta software
  • Direct contact sampling is possible with MicroTip ATR
  • Sensitivity enhancement is possible with LN-cooled MCT detector
  • Excellent visual inspection is possible with motorized visible polarizer
  • Using the Nicolet iZ 10 FT-IR module, it is possible to work with standard sample-compartment accessories

Applications

The Thermo Scientific Nicolet iN10 FT-IR Microscope finds applications in

  • Analytical Services
  • Quality Control
  • Forensic Science
  • Materials Science

This is an ideal instrument for industrial and investigative applications which include:

  • Packaging and Laminates
  • Coatings
  • API Mixtures Distribution Mapping
  • Contaminant Identification
  • Failure Analysis
  • Material Identification

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