The IM5000: An Advanced Ion Milling System

The sophisticated IM5000Ar ion beam milling system from Hitachi can be used to prepare customized cross-sections measuring up to 10 mm wide. It also enhances pre-polished surfaces of samples that are often hard to prepare through conventional means (such as polishing, grinding and cutting).

Processing Performance

  • Custom width uniform cross-sections measuring up to 10 mm wide can be processed
  • Final polishing, for example, for EBSD, utilizing low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in just a few minutes
  • A single powerful ion beam gun allows high milling speed
  • Constant ion beam emission from sub-1 kV accelerating voltage
  • Supports fine-surface polishing of sensitive materials

The IM5000: An Advanced Ion Milling System

Image Credit: Hitachi High-Tech Europe

Easy Sample Handling

  • Milling position can be readjusted at all times without remounting the specimen
  • Ex-situ alignment of mask and cross-sectioning range makes setup fast and easy
  • Resin-embedded samples of up to 25 mm in height and 50 mm in diameter can be loaded for ultimate polishing

Simple Operation

  • Easy maintenance and setup with a single ion beam gun
  • Single button push to initiate a process
  • Programmable multi-step processes

Extendability

  • Cryo cooling allows cross-sections on heat sensitive materials
  • Multi-position auto-processing, recipe management and workflow creation
  • Treating oxidation sensitive sample (such as LiB electrodes) without making contact with air
Hitachi ArBlade 5000 Broad Ion Beam System

Video Credit: Hitachi High-Tech Europe

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