Lyncée Reflection Series: Optical Interferometers Powered by Digital Holographic Microscopy

The Lyncée Reflection series of optical interferometers is powered by digital holographic microscopy (DHM). Real-time measurements are obtained in a single collection without mechanical scanning.

As well as measuring the 3D topography of samples, DHM's quasi-instantaneous measurement specificity allows it to monitor the time response of samples to external stimuli, characterize samples, optimize manufacturing processes, characterize extremely large surfaces and analyze them for small defects, and function in situ at high or low temperatures, in liquid, under vacuum, or in a gas-controlled environment.

Research labs and manufacturing facilities use DHM for applications in semiconductors, MEMS, medical technology, watches, industrial metrology, polymers, micro-nano technology, micro-optics, and photonics.

 The key features of the Lyncée Reflection Series, including a reflection DHM head and objective lens set.

Image Credit: Park Systems

Advanced Performance

  • Digital refocusing for fast, high-resolution imaging in difficult conditions 
  • Real-time data display and fast image capture
  • Interferometric resolution

Address All Experimental Needs

  • Wide range of options dedicated to specific applications
  • Stage: up to 300 mm travel range and six-axis
  • Multi-wavelengths for extended vertical range
  • Fully upgradeable

A Workflow Shaped for Quick and Time-Resolved Applications

A single image capture is used to acquire 3D data, which is then repeated at the camera frequency. Full-field, fast acquisition of dynamic samples is enabled by simultaneously acquiring every pixel in the field of view, without any lateral, vertical, or phase mechanical scanning.

The acquisition time defines the temporal resolution and equals the camera shutter's open time. In the case of a pulsed source, it is the duration of a laser pulse. It generally takes a few hundred microseconds for ordinary systems, a few tens of microseconds for high-speed cameras, and as little as five nanoseconds for MEMS analysis.

Large-area sample characterization and dynamic measurement of sample deformation are made possible by this remarkable acquisition speed. It guarantees strong resistance against environmental disturbances and exceptional reproducibility, which is especially important for industrial applications.

Diagram mapping the Lyncée Reflection Series process, from 3D data acquisition to digital reconstruction.

Image Credit: Park Systems

Other Equipment by this Supplier

Other Equipment

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.