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XEI Scientific to Feature Evactron® ES De-Contaminator™ at IMC 2014 Prague

XEI Scientific Inc. will feature the new Evactron ES Plasma De-Contaminator at the 18th International Microscopy Congress in Prague, Czech Republic on September 8th-12th, 2014.

The new Evactron ES Plasma De-Contaminator is specifically designed for SEM, FIB, x-ray, and high vacuum manufacturers.

Features of the Evactron ES De-Contaminator include:

  • Small plasma radical source
  • Plasma source can be installed on chamber or load lock port
  • POP™ Plasma ignition
  • Fastest cleaning with flowing afterglow
  • Rack mount for system integration
  • Safe for sensitive components
  • Elegant compact design

Visit booth #95 at the IMC Exhibition to see and learn more about the Evactron ES Plasma De-Contaminator.

About XEI Scientific:

XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems.

XEI manufactures and sells the Evactron® De-Contaminator, which removes hydrocarbon contamination from SEMs, FIBs and other vacuum systems. It has been described by one of our users as the only accessory you can buy for the SEM that will improve the performance of the instrument.

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