Scanning electron microscopy (SEM), along with key analytical techniques, such as energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), are essential for advanced materials characterization. EDS provides elemental composition analysis, while EBSD reveals crystallographic structure, orientation, and phase at the microscale. Expanding on the tried-and-true Thermo Scientific Apreo SEM platform, Thermo Scientific’s ChemiSEM EDS and TruePix EBSD offer a unified, streamlined solution that integrates imaging with structural and chemical analysis. This powerful synergy enables researchers to explore the relationships between microstructure and material properties (chemical, mechanical, and physical) to address core challenges in materials science and engineering. Seamless integration of such techniques into the SEM workflow reduces complexity, enhances analytical capability, and allows comprehensive analyses for users of all experience levels. This talk will showcase the key features of ChemiSEM EDS and TruePix EBSD, supported by a thorough case study in materials characterization.
By Attending this Webinar, You Will Learn:
- Fundamental principles and applications of SEM, EDS, and EBSD for advanced materials characterization, including how EDS analyzes elemental composition and EBSD reveals crystallographic details.
- Benefits of integrating ChemiSEM EDS and TruePix EBSD into the Apreo SEM platform as a unified solution that combines imaging with chemical and structural analysis for comprehensive materials insights.
- Practical understanding on how streamlined SEM workflows enhance analytical capabilities and enable users of all experience levels to tackle complex materials science challenges.
Who Should Attend this Webinar:
- Materials Scientists
- Polymer Scientists
- Materials Engineers
- Metallurgists
- Microscopy Specialists
- Electron Microscopists
About the Webinar Speakers
Dr. Kate Vanderburgh is a Sr. SEM Product Specialist at Thermo Fisher Scientific. Before joining Thermo in 2024, Kate managed the SEM, computerized tomography, and sample preparation tools at the Drexel University Materials Characterization Core. Kate has a B.E. in Chemical Engineering from Stevens Institute of Technology and a Ph.D. in Materials Science from Vanderbilt University followed by a post-doctoral research appointment at Lawrence Livermore National Laboratory. In addition to her experience in electron microscopy, she has an extensive background in the synthesis and characterization of nanomaterials for battery applications.
Dr. Chris Stevens focuses on analytical SEM, working with users across materials science to characterize samples using SEM microanalytical techniques, including EBSD. He completed a PhD in physics at the University of Leeds, studying phase transformations within confined systems using electron microscopy to characterize changes in material structure. Chris enjoys developing SEM microanalytical workflows and is currently focused on high-throughput and high-sensitivity applications.