Integrated Tools for Semiconductor Device Manufacturing

This webinar showcases how Oxford Instruments supports the production of high-quality semiconductor devices through advanced etch and deposition techniques.

It explores innovative imaging and analysis methods to verify that devices exhibit the intended features. Strategies for identifying defects and performing failure analysis are also discussed.

Key Learning Objectives

• Using plasma processes to build devices
• Optimizing semiconductor device manufacturing through etch and deposition processes
• Using AFM and EDS for process control and failure analysis
• Understanding semiconductor device development at the nanoscale

The webinar features solutions from across our portfolio range including Atomic Force Microscopy, Electron microscope imaging (EDS/EBSD), and atomic scale processing techniques.