New in AZtecCrystal 3.3: Strain Analysis and EBSD Enhancements for Advanced Materials Insight

EBSD is an effective tool for microstructural characterization, but data collection is just one half of the story. EBSD data sets can be processed and used to explore microstructures in several ways, including inferring material attributes.

For example, EBSD is frequently used to infer microstructure deformation and is typically represented by a Kernal Average Misorientation (KAM) Map or something similar (e.g., GOS, GROD).

Users are increasingly interested in EBSD-based strain measurement, which can be used to inform industrial operations such as machining, cold or hot rolling, and annealing or recrystallization mechanisms.

Recent developments in pattern matching technology, such as those used in MapSweeper, improve the angular precision required to directly fit strain tensors to experimentally recorded Kikuchi patterns.

This tutorial explains the most recent updates to AZtecCrystal 3.3, such as Strain Analysis tools, Particle Analysis tool improvements, and MapSweeper speed improvements.

You will learn: 

  • About new capabilities in AZtecCrystal 3.3
  • How to plot strain maps
  • About upgrades to particle analysis tools like MapSweeper

Speaker

Dr. Mark Coleman, Oxford Instruments: EBSD Product Manager

Mark Coleman is the EBSD product manager for Oxford Instruments NanoAnalysis. He received his PhD from Swansea University, where he focused on employing EBSD to investigate grain boundary engineering methods.

As a Senior Lecturer, he was also the Program Director for the Materials Science and Engineering department and collaborated extensively with industry on the use of SEM-based techniques for materials failure investigation. He has recently focused on merging EBSD with in-situ heating and micromechanical testing.

Other Webinars from Oxford Instruments America

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