Explore Thermo Fisher's latest developments in scanning transmission electron microscopy (STEM) technology, specifically focusing on the new Iliad platform. Dr. Lee Casalena, Senior Technical Product Specialist for Materials Science TEM, and Dr. Austin Wade, Senior TEM Products and Application Scientist at Thermo Fisher Scientific, discuss the latest advancements in optics, automation, and data acquisition to provide researchers with more precise and efficient tools for materials science.
Can you please introduce yourselves and describe your roles at Thermo Fisher?
Dr. Lee Casalena: My background is in microscopy and materials characterization. I have experience as a TEM field application scientist and have a Ph.D. in materials science and engineering from Ohio State University.
Dr. Austin Wade: I have a bachelor's and Ph.D. in materials science and engineering from Lehigh University. I have worked in various roles, such as a postdoctoral research fellow and staff scientist, demonstrating transmission electron microscopes and providing post-sale support and training.
Could you give us a brief overview of what inspired the development of the Iliad platform?
Dr. Lee Casalena: The Iliad platform represents years of R&D efforts to create a fully integrated, advanced analytical TEM system. With the Iliad, we aim to make incremental improvements and achieve a leap forward in resolution, data acquisition, and usability.
This platform was designed to simplify complex TEM workflows, particularly in areas critical for advanced materials research, such as energy-loss spectroscopy (EELS) and X-ray energy-dispersive spectroscopy (EDS). We believe it is a game-changer for researchers working in atomic-level materials discovery.
Image Credit: Thermo Fisher Scientific
How do these advancements impact researchers in practical terms?
Dr. Lee Casalena: The Iliad platform has been built with the user experience in mind. Its advanced optics, streamlined automation, and innovative data acquisition techniques allow researchers to capture and analyze data more precisely and efficiently. One of our goals is to make these advanced techniques, which traditionally required specialized knowledge, accessible to a broader audience. By integrating sophisticated controls into a user-friendly interface, the Iliad enables both new and experienced users to push the boundaries of what is possible in materials characterization.
Could you elaborate on the latest advancements in optics, automation, and data acquisition in the Iliad platform, and how these innovations provide researchers with improved tools for materials science?
Dr. Lee Casalena: The Iliad platform brings significant advancements in optics, automation, and data acquisition to make research faster and more precise. Our new always-in-focus optics keep spectral data sharp across the full energy range, reducing time spent on alignment and recalibration. On the automation side, the NanoPulser beam blanker gives precise control over the electron beam, protecting delicate samples and simplifying workflows for all experience levels. Then, with our Zebra detector array, we can capture multiple EELS ranges at once—meaning you get richer data in a single pass.
Can the Iliad TEM perform EF-TEM (energy-filtered transmission electron microscopy) imaging?
Dr. Austin Wade: Yes, the Iliad offers a full suite of energy-filtered TEM capabilities. Although demand for EF-TEM spectrum imaging has reduced, there is still high interest in stable zero-loss filtering for contrast enhancement of soft materials and energy-filtered 4D STEM.
How does filter alignment work without an imaging camera?
Dr. Austin Wade: The zebra detector in the Iliad includes six segments, one of which is a 2D pixel array (256x2048 pixels). Automated alignment routines use this segment to optimize filter alignment.
Can Extreme EELS be used on any sample, and how is it different from regular EELS?
Dr. Austin Wade: Extreme EELS extends the alignment range beyond standard EELS, allowing analysis at high energy losses. It can be used on any sample; however, the suitability of the sample depends on the desired analysis at high energy ranges. Samples with high-energy K-edge features are particularly suitable for Extreme EELS.
What is the KV range for the Iliad?
Dr. Austin Wade: The Iliad offers an acceleration voltage range of 30 to 300 kV, with factory-provided alignments. Experiments can go lower, particularly for specific research needs, using a low kV aperture package that limits contamination on apertures.
Can legacy in-situ holders and cryo-holders be used with the Iliad?
Dr. Austin Wade: The Iliad is compatible with legacy in-situ holders. The only exception is when the retractable UltraX EDS detector is inserted, which requires UltraX-compatible holders. For cryo-work, the Iliad supports the same cryo-holders as the Spectra series.
Can the Iliad be used for ptychography?
Dr. Austin Wade: Yes, the Iliad can perform ptychography. The energy filter functions as an imaging filter, allowing the collection of diffraction patterns, which can be synchronized with a scan position to enable data reconstruction.
Is simultaneous EELS and EDX acquisition possible, and how is it managed?
Dr. Austin Wade: Yes, the Velox software allows for the simultaneous acquisition of STEM images and EDS and EELS data, enabling all three to be collected concurrently.
What is the solid angle of the EDS, and is more than one detector supported?
Dr. Austin Wade: The Iliad Ultra uses the UltraX EDS detector, which offers a solid angle of just over four steradians, considering the shadowing from its dedicated holder. A full geometric solid angle of about 4.45 steradians is possible with specific setups.
When and where can potential users schedule a demo for the Iliad TEM?
Dr. Austin Wade: Demonstration activities will be held Eindhoven Nanoport in the Netherlands starting this year.
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About Dr. Lee Casalena
Dr. Lee Casalena is a seasoned materials scientist with over 15 years of expertise in transmission electron microscopy (TEM). As a Senior Product Specialist at Thermo Fisher Scientific, he consults globally, customizing high-end TEM solutions to meet diverse research needs and advance scientific innovation. Dr. Casalena holds a Ph.D. in Materials Science from The Ohio State University, where he was awarded the Presidential Fellowship. His research spans TEM technology applications, materials characterization, and alloy microstructures. He has published extensively, earned multiple awards, and actively contributes to product development, ensuring cutting-edge advancements in microscopy and materials analysis.
About Dr. Austin Wade
Dr. Austin Wade is a Senior Product Specialist at Thermo Fisher Scientific with deep expertise in materials science and electron microscopy. With a Ph.D. from Lehigh University, he has led research focused on atomic-scale analysis, particularly in the Cu-Bi system to understand grain boundary embrittlement. Over nearly nine years at Thermo Fisher, he has advanced electron microscopy applications, optimizing 3D atomic imaging and supporting global research initiatives. Dr. Wade’s contributions include pioneering next-generation X-ray spectrometers, mentoring in microscopy, and publishing extensively on grain boundary structure. His work enhances industrial applications in materials science.
This information has been sourced, reviewed and adapted from materials provided by Thermo Fisher Scientific – Electron Microscopy Solutions North America.
For more information on this source, please visit Thermo Fisher Scientific – Electron Microscopy Solutions North America.
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