In 1985, Pratt & Whitney (East Hartford, CT) commissioned an outside systems house to develop a proprietary computer-based creep system, ACTS (Automated Creep Test System). Written in Fortran and running on a Digital Equipment PDP-11 computer, the system included elevator and furnace controls. While advanced for its time, it suffered from significant hardware and software issues.
By 1987, after ongoing problems with bugs and temperature control, Pratt & Whitney brought in Virtech Inc. to improve the ACTS system. Virtech enhanced the software to improve temperature control and data acquisition, though issues remained with the original temperature measurement hardware.
A year later, in 1988, Pratt & Whitney’s Columbus, GA, plant adopted the system with modifications. With Virtech’s support, the proprietary temperature unit was replaced by Honeywell UDC5000 controllers, dramatically improving reliability and temperature control.
In 1989, ongoing hardware issues at Pratt & Whitney East Hartford prompted Virtech to recommend replacing proprietary components with off-the-shelf microcomputers and temperature measurement/data logging equipment from John Fluke Mfg. This approach was chosen for several key reasons:
- The proprietary hardware supplied by the original vendor was difficult to support, and its temperature measurement accuracy was highly questionable.
- Because the hardware interfaced only with the PDP-11, it locked the system into that platform. Meanwhile, 32-bit VAX computers were rapidly becoming more affordable. Fluke equipment, by contrast, could communicate via IEEE-488 and RS-232 serial, enabling compatibility with a wider range of host computers.
- Fluke’s temperature measurement specifications met ASTM E633 requirements, ensuring compliance with the ±3 °F and ±5 °F accuracy limits mandated by ASTM E139 for creep and stress rupture testing.
- Offloading some control routines to the Fluke microcomputer reduced the processing burden on the PDP-11, which was already highly compute-bound.
In 1990, Digital Equipment introduced the µVAX 3100, making a powerful minicomputer available at an affordable price point. Pratt & Whitney retired its aging PDP-11 and installed the µVAX 3100 to run the ACTS system. To accommodate differences in IEEE-488 communication and file structure, Virtech developed a converter program to modify all ACTS PDP-11 test and specification files for use on the µVAX platform.
In 1991, working with a plastics thermoforming company, Virtech developed a low-cost digital power controller for quartz heater arrays, securing patents for the technology. Combined with falling µVAX prices, this breakthrough encouraged Virtech to begin designing a new computer-controlled creep testing system.
The new system would incorporate Fluke 2289A Helios units for temperature and LVDT/LVC input, OPTO-22 digital I/O for frame control, and Virtech’s patented Power Control CPU for furnace power regulation. The host computer would be a µVAX running the VMS operating system, with all I/O handled via RS-232 serial for easier portability. To further support flexibility, the software was written in ANSI C, ensuring compatibility with other host platforms.
In 1992, Pratt & Whitney (East Hartford, CT) modified its hardware to align with the new Virtech creep system and served as a beta site for the software. The results were highly successful, leading to installation at the Columbus, GA, facility as well. The system delivered major improvements in creep data quality, significantly reducing noise and scatter thanks to new temperature control routines and advanced furnace power controllers. Much of this stability came from the AC power line adjustments provided by Virtech’s digital power controls.
By 1993, Virtech began marketing the µVAX-based Computer Creep System (CCS) through Applied Test Systems (Butler, PA), which became an authorized reseller.
Over the next two years, from 1994 to 1995, continuous improvements were made to the Virtech creep testing software, including expanded support for plastics testing. During this period, the system was installed at GE Pittsfield, MA, for plastics testing, and additional units were sold to commercial testing laboratories.
In 1995, with growing improvements in PC reliability and the release of Windows NT, Virtech initiated efforts to port the creep system to a Windows-based platform.
However, initial trials of the Windows-based version in 1996 proved unsuccessful. While Windows NT was a significant step up from 16-bit Windows, it was not stable enough to manage all system controls without periodic crashes.
Feedback from large commercial laboratories confirmed this limitation, leading Virtech to abandon the concept of a fully host computer–controlled system. The consensus was clear: PCs alone were not reliable enough for long-term testing, and separate controllers were necessary.
That year, Virtech began discussions with Metcut Research about a dedicated controller-based testing system that would combine Virtech’s software with a PC platform. Later in 1996, development began on a microprocessor-based controller capable of managing the testing machine locally while integrating with the new Windows-based creep system.
In 1997, GE in Evandale, OH, purchased the Virtech creep system for its laboratory, while Metcut Research committed to the Windows-based creep system built around the new frame controller, despite it not yet being field-proven. Later that year, Virtech shipped the first frame controllers to Metcut, officially bringing the Windows-based creep-testing system online. Pratt & Whitney and GE quickly converted to the new platform, and adoption expanded as additional laboratories began purchasing the system.
In 1998, Virtech introduced a new Load Control option for the WinCCS system. This feature, which could be retrofitted to nearly any stress rupture or creep-testing machine equipped with Virtech controllers and an electrically operated drawhead or elevator, allowed tests to run to completion without operator intervention once started. Dirats Laboratories became an early adopter, converting their entire creep and stress rupture lab to the Windows-based system, utilizing both manual and load control frames.
In 1999, Virtech released Version 2 of the WinCCS software, further advancing system capabilities.
Building on the success of the Load Control option, Virtech also released a stress relaxation control feature in 1999 for the WinCCS system. This enhancement enabled stress relaxation testing in accordance with ASTM E328 and added strain control functionality for creep and stress rupture machines.
Version 3 of the WinCCS software was released in the year 2000, bringing additional improvements to system performance and reliability.
As data acquisition capabilities and temperature stability improved, limitations of LVDT and SLVC sensors became more apparent. Their readings were inconsistent due to sensitivity to minor fluctuations in ambient temperature and humidity. To resolve this, in 2001 Virtech began evaluating glass scale incremental encoders, such as the Heidenhain ST and MT series, as replacements. These encoders quickly became the new standard in creep testing thanks to their ability to remain unaffected by laboratory temperature variations.
In 2002, Virtech introduced a lower-cost, stress-rupture-only controller, fully compatible with the WinCCS system. This controller met ASTM E633 requirements for temperature accuracy and ASTM E139 requirements for stress rupture testing, giving laboratories a cost-effective way to comply with standards without investing in the full-featured WinCCS Creep/Stress Rupture controller.
Version 4 of the WinCCS software was released in 2009. Version 5 was introduced two years later.
Version 6 was released in 2013 but remained in use for only a short period before being replaced by Version 7.
In 2014, Virtech and Applied Test Systems entered into an exclusive marketing agreement to sell and service the WinCCS system worldwide.
Then in 2020, Applied Test Systems acquired the WinCCS system from Virtech, ensuring long-term stability and continued development under ATS’s established infrastructure. As part of the transition, key Virtech team members joined ATS to support the rollout of next-generation frame controllers.
Version 8 of the WinCCS software was released in 2021.
And finally, in 2023, Applied Test Systems launched the Model 26xx, a fully automated, space-saving test machine built with the new SIGMA controller.
Today, thousands of Applied Test Systems WinCCS machines are installed worldwide, making the system the global standard for creep and stress rupture testing. Every system remains fully supported, and ongoing development ensures continued compatibility and performance. The latest software can read data from any generation of equipment, giving users of older systems a straightforward upgrade path.
Applied Test Systems is committed to supporting both GEN1 and GEN2 machines with the resources and expertise required for long-term success. The team is focused on delivering exceptional customer service and ensuring every interaction with our products is seamless and reliable.
By emphasizing innovation, continuous improvement, and trusted partnerships, Applied Test Systems provides the confidence that comes not only from the quality of its products but also from the long-term stability of its company.
This information has been sourced, reviewed and adapted from materials provided by Applied Test Systems.
For more information on this source, please visit Applied Test Systems.