Modern Electron Backscatter Diffraction (EBSD) detectors can index Kikuchi patterns in under a millisecond, delivering rapid insights into the crystallographic structure of materials.
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When paired with an analytical SEM equipped with high probe currents, researchers can capture high-quality EBSD maps in just minutes. However, the full potential of this analysis is often limited by surface contamination, such as atmospheric exposure, amorphous oxide layers, or damage from conventional mechanical polishing.
This whitepaper explores how Broad Ion Beam (BIB) milling, a cutting-edge SEM sample preparation method, removes surface artifacts to significantly improve EBSD data quality.
Download your copy of the whitepaper to:
- Learn how BIB milling enhances EBSD analysis
- See how the Hitachi ArBlade 5000 can be used to refine EBSD analysis of a two-phase as-cast nickel-based alloy
- Understand how precise BIB techniques improve surface quality before and after final end polishing
Ready to get more accurate, high-resolution EBSD results? Download the whitepaper now and take your analysis to the next level.
This information has been sourced, reviewed and adapted from materials provided by Hitachi High-Tech Europe.
For more information on this source, please visit Hitachi High-Tech Europe.