Micro-Epsilon to Showcase Its Award-Winning Laser Displacement Sensors At The Engineering Design Show 2016

At the Engineering Design Show (19th October – 20th October 2016) at the Ricoh Arena, Coventry, precision sensor manufacturer Micro-Epsilon UK (stand C25) will be showcasing its full range of sensor technologies, including non-contact capacitive, confocal and inductive displacement sensors, as well as 2D/3D laser profile sensors, infrared temperature sensors, thermal imagers and colour sensors. The stand will feature the award-winning optoNCDT 1320/1420 laser displacement sensors.

Stop by the stand to share your application challenges with experts from Micro-Epsilon, who will offer their technical support, advice and guidance. The stand will feature the following interactive product demonstrations:

The best in laser triangulation
Visitors can see a demonstration of the award-winning optoNCDT 1320 and optoNCDT 1420 laser displacement sensors. The speed, size, performance and ease of integration of these sensors is unrivalled in the market today. The sensors are suitable for a variety of medium-to-high volume applications in automation, machine building and systems integration, particularly where conventional laser sensors have reached the limits of their performance capabilities. The sensors were recently recognised with the Red Dot Award Industrial Design 2016. The Red Dot Award design competition is a globally acknowledged seal of quality for products. A 41-member jury of experts rates the best products of the year from a record-breaking 5,214 products from 57 nations in 2016.

Blue laser profile sensor

The scanCONTROL 2910-25 BL is a new high performance laser profile sensor with a sharp focused 10mm blue laser line. The sensor is ideal for applications where absolute precision is required on small or difficult-to-measure surfaces such as transparent plastic film, glass, red-hot glowing metals and organic (e.g. foods, wood) materials. This compact sensor with integrated electronics measures at a rate of 1280 points per profile with a 10mm field of view (FOV) for both Z- and X-axes, with an X-axis resolution of 7.8µm and a Z-axis reference resolution from 1µm.

Auto-calibration

The eddyNCDT 3100 represents a world first in eddy current displacement measurement. With its Smart Sensor Auto Calibration system, visitors can see how easily and quickly the sensor connects to the 3100 controller. All calibration data is then automatically uploaded from the sensor to the controller, with no need for any lengthy calibration. All calibration data required for both ferrous (St37) and non-ferrous (aluminium) target materials is stored in the sensor before it is shipped.

Measuring to nanometre resolution

The capabilities of the high precision, integrated capacitive displacement measuring system – the capaNCDT 6200 – will be demonstrated on the stand by measuring the deflection of granite stone to nanometre accuracy (resolution is down to 0.002µm). The capaNCDT 6200 comprises a control unit, demodulator and Ethernet interface that supports fast and easy configuration through a web browser.

Colour measurement

For those with a need to measure colour, the stand will also feature the new colorCONTROL ACS7000, an inline high speed colour measurement system that measures the actual colour of the target by identifying their coordinates in the colour space. The system can be set up to continually monitor a production process and output the colour measurement via Ethernet, EtherCAT or RS422 and can also be taught pass fail/limits and then output out-of-tolerance alarms using digital I/O. Existing applications include automotive paint inspection, colour measurement of car interiors, coloured glass, transparent film and sheet production, printing, packaging, medical technology, food, cosmetics, pharmaceuticals and in the processing of plastics, food, wood, paper, veneer and textiles.

For more information or to book an appointment on the stand, please call the Micro-Epsilon sales department on 0151 355 6070 or email [email protected]

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