Coxem is pleased to announce a new addition to their line of sample preparation tools, the CP-8000+ Cross Section Polisher. Building upon the success of the original CP-8000, the “+” incorporates a digital microscope to facilitate sample loading, and the milling speed has been increased to 700 μm/h. An improved GUI simplifies operation, while a special sample holder and software adds flat milling capability.
While conventional mechanical polishing can cause surface damage in delicate samples, an ion mill operates on the atomic level, avoiding distortion or surface scratches that can inhibit clear and precise imaging. Utilizing an argon ion beam to provide clean, precise cross sections, the CP-8000+ is ideal for preparing specimens for analysis in SEM, EDS and EBSD.