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Advantest Unveils Field-Upgradable Test Handler for System-on-Chip Devices

Advantest Unveils Field-Upgradable Test Handler for System-on-Chip Devices

Rudolph Receives Orders for AWX FSI Unpatterned Wafer Inspection System

Rudolph Receives Orders for AWX FSI Unpatterned Wafer Inspection System

NXP Launches SmartMX2-P40 Chip Card Microcontroller Platform for Banking, eGov Markets

NXP Launches SmartMX2-P40 Chip Card Microcontroller Platform for Banking, eGov Markets

TI Introduces 66AK2H14 SoC and EVM for KeyStone-Based SoCs

TI Introduces 66AK2H14 SoC and EVM for KeyStone-Based SoCs

China Hi-Tech Fair ELEXCON 2013: Toshiba to Highlight Advanced Semiconductor Solutions

China Hi-Tech Fair ELEXCON 2013: Toshiba to Highlight Advanced Semiconductor Solutions

ams Announces Updated Schedule for its IC Prototyping Service, Multi-Project Wafer

ams Announces Updated Schedule for its IC Prototyping Service, Multi-Project Wafer

TowerJazz to Present Design Enablement Technology to Japanese Market at EDSFair

TowerJazz to Present Design Enablement Technology to Japanese Market at EDSFair

EPA Ranks Advantest on Top 30 Tech and Telecom List

EPA Ranks Advantest on Top 30 Tech and Telecom List

Novel Method to Produce High-Quality AlN Layers with Atomic-Scale Thickness at Lower Temperature

Novel Method to Produce High-Quality AlN Layers with Atomic-Scale Thickness at Lower Temperature

Open Process Specification v1.1 Released by Si2’s OpenPDK Coalition

Open Process Specification v1.1 Released by Si2’s OpenPDK Coalition

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