Posted in | News | Materials Analysis

Thin Film Applications For Fully Integrated Benchtop Ellipsometer

HORIBA Scientific (HORIBA), a global leader with over 20 years of experience in phase modulation ellipsometry technology, is pleased to announce the launch of the UVISEL 2, a new generation of scientific spectroscopic ellipsometers.

The UVISEL 2 pioneers the combination of a fully automated platform that includes a patented vision system, 8 computer selectable, achromatic spot sizes, and fast scanning, high-resolution monochromators, making it a unique solution for efficient and rapid thin film characterization over a broad spectral range of 190-2100nm. No other instrument on the market offers this combination of capabilities.

The UVISEL 2 is designed as a highly automated instrument to provide automatic goniometer, automatic XYZ stage, automatic sample adjustment and automatic microspot optics. Microspots, combined with a real-time vision system, allow straightforward and accurate spot positioning on a sample. A selection of eight achromatic spots (down to 35µm) allows the user to perform measurements on a broad spectral range even with a small spot size. This unique system always allows an image to be obtained, whether on rough, smooth, transparent or reflective surfaces.

UVISEL 2 is the most sensitive and accurate spectroscopic ellipsometer on the market. With its robust phase modulation control and the new electronics, it is capable of characterizing advanced optical and material properties (e.g., anisotropy, gradient), detecting very thin layers (e.g., graphene) and can follow ultra fast kinetic phenomena at up to 1ms per point. The detection systems in VIS-FUV and NIR have also been enhanced to provide very low stray light and faster acquisition.

The powerful DeltaPsi2 software controls the UVISEL 2 to offer the largest range of data acquisition and advanced modelling features. New automatic troubleshooting facilitates the diagnosis of problems. And its new automatic calibration procedure using integrated reference samples ensures easy calibration. The user interface is intuitive and customized to meet the requirements of both experienced scientists and newcomers.

“The UVISEL 2 combines unique features in terms of automation, performance, ease-of-use and advanced software, providing unique optimal working conditions for accurate thin film thickness measurement and optical analysis,” stated Professor Stergios Logothetidis, Aristotle University of Thessaloniki, Greece. “In fact, by combining these features into one ellipsometer, HORIBA has ensured that the UVISEL 2 is ideal for both research and industrial quality control of thin films.”


Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    HORIBA Scientific. (2019, February 09). Thin Film Applications For Fully Integrated Benchtop Ellipsometer. AZoM. Retrieved on March 26, 2023 from

  • MLA

    HORIBA Scientific. "Thin Film Applications For Fully Integrated Benchtop Ellipsometer". AZoM. 26 March 2023. <>.

  • Chicago

    HORIBA Scientific. "Thin Film Applications For Fully Integrated Benchtop Ellipsometer". AZoM. (accessed March 26, 2023).

  • Harvard

    HORIBA Scientific. 2019. Thin Film Applications For Fully Integrated Benchtop Ellipsometer. AZoM, viewed 26 March 2023,

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type