New Paper on the Benefits of AC Field Hall for Low-Mobility Material Characterization

The traditional DC field Hall measurement methodology, while sufficient for studying a wide range of materials, is limited to measuring Hall mobilities down to about 1 cm2/V s—making it impossible to measure a number of materials that are characterized by very low mobilities.

The AC field Hall measurement method, however, breaks through the barriers of traditional DC field Hall measurements, a subject covered in a new white paper available from Lake Shore Cryotronics. The paper begins by examining the DC and AC field Hall protocols then provides examples of AC field Hall used for analyzing:

  • Transparent oxide materials
  • Micro-crystalline silicon materials
  • Bismuth vanadate (BiVO4) metal oxides
  • Various other materials

Click here to get the free white paper.

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