PANalytical offers data collection and analysis software for XRD and XRF applications. All instruments from PANalytical are available with sophisticated and highly specialized software, which improves the effectiveness of the analysis being carried out with that specific instrument.
PANalytical provides data collection and analysis software for X-ray imaging, X-ray diffraction, and X-ray scattering applications. This includes data collection software for multipurpose diffractometers, powder diffraction process control applications, thin film software modules, powder diffraction software modules, EasySAXS data analysis software, and texture and stress software modules.
All XRF spectrometers from PANalytical come with the latest, advanced and highly specialized software packages. X-ray fluorescence software suite includes Epsilon 3 software, Epsilon 5 software, SuperQ, SuperQ Thin Film, and Stratos.
The main features of the XRD and XRF software are as follows:
- Easy to use
- Fully customizable for experts
- Fully automatable for occasional users
- Available with comprehensive support
- Liberal licensing policy to meet current laboratory needs and support various data formats and instruments