Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis
The recent adoption of CMOS-based cameras for the collection of Electron Backscatter Diffraction (EBSD) patterns has unlocked faster collection speeds at higher pixel resolution. This technology enables rapid and accurate microstructural characterization of a wide range of materials. This presentation introduces EDAX’s new Velocity CMOS-based camera, and presents numerous application examples. Microstructural characterization strategies utilizing this new technology are also discussed.
