Gatan, Inc.

Gatan, Inc.

Address
5794 W. Las Positas Blvd.
Pleasanton
CA, 94588
United States
Phone: +1 925 463 0200
Fax: +1 925 463 0204
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Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are fully compatible with all brands of electron microscopes, cover the entire range of the analytical process from specimen preparation and manipulation to imaging and analysis. Our customer base spans the complete spectrum of end users of analytical instrumentation typically found in industrial, governmental and academic laboratories.

The applications addressed by these scientists and researchers include metallurgy, semiconductors, electronics, biological science, new materials research and biotechnology. The Gatan brand name is recognized and respected throughout the worldwide scientific community and has been synonymous with high quality products and the industry's leading technology.

Primary Activity

Instruments for Electron Microscopes

Revolutionizing OIM Analysis with Spherical Indexing

Revolutionizing OIM Analysis with Spherical Indexing
EDS Analysis in APEX EDS Software for Light and Heavy Elements

EDS Analysis in APEX EDS Software for Light and Heavy Elements
Mapping Lithium Content in Li-Ion Battery Cathode Materials

Mapping Lithium Content in Li-Ion Battery Cathode Materials
Advancements in Energy Dispersive Spectroscopy (EDS) with Wavelength Dispersive Spectroscopy (WDS)

Advancements in Energy Dispersive Spectroscopy (EDS) with Wavelength Dispersive Spectroscopy (WDS)
Improving EDS Quantitative Accuracy with the eZAF MACC Database

Improving EDS Quantitative Accuracy with the eZAF MACC Database
Evaluating Standardless EDS Analysis Accuracy in APEX Software

Evaluating Standardless EDS Analysis Accuracy in APEX Software
Enhancing EDS Quantitative Accuracy with eZAF and the SCC Database

Enhancing EDS Quantitative Accuracy with eZAF and the SCC Database
Analyzing Shot-Peened Titanium Alloys Using Spherical Indexing

Analyzing Shot-Peened Titanium Alloys Using Spherical Indexing
Enhancing EDS Quantitative Accuracy with FSQ and SmartStandards

Enhancing EDS Quantitative Accuracy with FSQ and SmartStandards
Using OIM Analysis for Correlative Microscopy

Using OIM Analysis for Correlative Microscopy
Microscale Analysis of Lithium-Containing Compounds and Alloys

Microscale Analysis of Lithium-Containing Compounds and Alloys
Using Li-Ion Battery Cathode Materials to Improve EBSD Characterization

Using Li-Ion Battery Cathode Materials to Improve EBSD Characterization
What is Spherical Indexing?

What is Spherical Indexing?
Using EBSD to Characterize Additively Manufacture Stainless Steel

Using EBSD to Characterize Additively Manufacture Stainless Steel
The Study of Microstructures in Stainless Steel Oxide Scales

The Study of Microstructures in Stainless Steel Oxide Scales
OneView IS Camera: Recording Atomic-Scale Crystal Nucleation and Growth Dynamics

OneView IS Camera: Recording Atomic-Scale Crystal Nucleation and Growth Dynamics
Characterization of Advanced High Strength Steel with the Murano Heating Stage

Characterization of Advanced High Strength Steel with the Murano Heating Stage
Geoscience Cathodoluminescence Techniques

Geoscience Cathodoluminescence Techniques
4D STEM: Magnetite Nanoparticle Orientation Mapping

4D STEM: Magnetite Nanoparticle Orientation Mapping
4D STEM Diffraction Analysis of Directionally-Grown ZnO Nanowires

4D STEM Diffraction Analysis of Directionally-Grown ZnO Nanowires
Cathodoluminescence Polarization-Filtered Spectrum Imaging

Cathodoluminescence Polarization-Filtered Spectrum Imaging
Recommend Procedure for Dimpling Ductile Materials

Recommend Procedure for Dimpling Ductile Materials
Subnanometer MoS Interconnecting Wires and Torsional Deformation

Subnanometer MoS Interconnecting Wires and Torsional Deformation
Finding Element Distributions in a Meteorite with Energy Dispersive Spectroscopy

Finding Element Distributions in a Meteorite with Energy Dispersive Spectroscopy
Real-Time Data Processing during In-Situ Heating

Real-Time Data Processing during In-Situ Heating
Concentration of Precipitates in a Ni-W Alloy with Virtual (BF/DF) Imaging

Concentration of Precipitates in a Ni-W Alloy with Virtual (BF/DF) Imaging
Electric Field Mapping in 2D Heterostructures

Electric Field Mapping in 2D Heterostructures
Using Electron Energy Loss Spectroscopy (EELS) for High-Speed Composition and Chemical Analysis

Using Electron Energy Loss Spectroscopy (EELS) for High-Speed Composition and Chemical Analysis
Successful EBSD Analysis by Optimizing the Multiphase AI Alloys

Successful EBSD Analysis by Optimizing the Multiphase AI Alloys
Atomic-Scale Observation of Oxygen Delivery in Carbon Nanotubes

Atomic-Scale Observation of Oxygen Delivery in Carbon Nanotubes
Ultra-Wide Bandgap Semiconductors and Spectroscopic Analysis

Ultra-Wide Bandgap Semiconductors and Spectroscopic Analysis
Measuring Photonic Bands with Energy-Momentum Spectroscopy

Measuring Photonic Bands with Energy-Momentum Spectroscopy
Cross-Sectional Specimen Preparation for Transmission Electron Microscopy (TEM)

Cross-Sectional Specimen Preparation for Transmission Electron Microscopy (TEM)
Exploring Human Tooth Enamel with Electron Counting 4D STEM

Exploring Human Tooth Enamel with Electron Counting 4D STEM
High-speed, Hyperspectral Spectrum Imaging

High-speed, Hyperspectral Spectrum Imaging
Capturing Nanoparticle Transformation Dynamics with the OneView IS Camera

Capturing Nanoparticle Transformation Dynamics with the OneView IS Camera
Broad Argon Beam Ion Milling and Focused Ion Beam Milling

Broad Argon Beam Ion Milling and Focused Ion Beam Milling
Lithium Metal Battery Solid Electrolyte Interphase Imaging

Lithium Metal Battery Solid Electrolyte Interphase Imaging
Carbon Nanoparticle Agglomeration Imaging

Carbon Nanoparticle Agglomeration Imaging
Spintronics: Electron Diffraction for Chirality Identification

Spintronics: Electron Diffraction for Chirality Identification
NiS-filled Carbon Nanotubes and Dynamic In-Situ Lithiation

NiS-filled Carbon Nanotubes and Dynamic In-Situ Lithiation
Using Cathodoluminescence Techniques for MicroLED Processing Analysis

Using Cathodoluminescence Techniques for MicroLED Processing Analysis
Studying Beam-Induced Dendritic Growth over Different Timescales

Studying Beam-Induced Dendritic Growth over Different Timescales
Using Cathodoluminescence to Investigate Nanophotonic Material Optical Properties

Using Cathodoluminescence to Investigate Nanophotonic Material Optical Properties
The Mapping of Lithium in a Scanning Electron Microscope (SEM)

The Mapping of Lithium in a Scanning Electron Microscope (SEM)
Streamlined Microanalysis in Scanning Electron Microscopes

Streamlined Microanalysis in Scanning Electron Microscopes
Using Electron Counting for Graphene Imaging

Using Electron Counting for Graphene Imaging
Low-Dose Imaging via Real-Time Electron Counting

Low-Dose Imaging via Real-Time Electron Counting
Multiphase CoRe Alloy Interphase Analysis

Multiphase CoRe Alloy Interphase Analysis
Using EBSD to Characterize the Deformation Microstructure of an Additively Manufactured 316-L Stainless Steel Alloy

Using EBSD to Characterize the Deformation Microstructure of an Additively Manufactured 316-L Stainless Steel Alloy
Combining EDS-EBSD Analysis to Characterize the Microstructure of a Nitrided Steel

Combining EDS-EBSD Analysis to Characterize the Microstructure of a Nitrided Steel
Directionally-Grown ZnO Nanowires and its High-Speed 4D STEM Diffraction Analysis

Directionally-Grown ZnO Nanowires and its High-Speed 4D STEM Diffraction Analysis
Oxygen Delivery During Catalyzed Oxidation of Carbon Nanotubes Observation at the Atomic Scale

Oxygen Delivery During Catalyzed Oxidation of Carbon Nanotubes Observation at the Atomic Scale
Semiconductor Analysis – Preparing Cross-Sectional TEM Samples Using an Ion Polishing System

Semiconductor Analysis – Preparing Cross-Sectional TEM Samples Using an Ion Polishing System
Using EBSD Heating Stages for the SEM Analysis of Advanced High Strength Steel (AHSS)

Using EBSD Heating Stages for the SEM Analysis of Advanced High Strength Steel (AHSS)
Characterizing Intermetallic Phases in Duplex Steel Alloys Using Pegasus

Characterizing Intermetallic Phases in Duplex Steel Alloys Using Pegasus
Optimizing Steel Properties by Controlling Retained Austenite Content Using EBSD

Optimizing Steel Properties by Controlling Retained Austenite Content Using EBSD
Using EBSD and EDS to Analyze the Microstructures of Optical Materials

Using EBSD and EDS to Analyze the Microstructures of Optical Materials
Improving the Material Properties of Additive Manufactured Metals Using EBSD

Improving the Material Properties of Additive Manufactured Metals Using EBSD
Polishing of Focused Ion Beam Specimens with the PIPS II System

Polishing of Focused Ion Beam Specimens with the PIPS II System
Ensuring Identical Specimen Preparation for TEM Using the PIPS II System

Ensuring Identical Specimen Preparation for TEM Using the PIPS II System
Improving Fuel Efficiency in Automotive Applications Using Lightweight Structural Materials

Improving Fuel Efficiency in Automotive Applications Using Lightweight Structural Materials
Electron Backscatter Diffraction (EBSD) in Materials Science and Metallurgy

Electron Backscatter Diffraction (EBSD) in Materials Science and Metallurgy
Enhancing Transmission Electron Microscopy (TEM) with ClearView

Enhancing Transmission Electron Microscopy (TEM) with ClearView
EBSD Data Collection and Analysis

EBSD Data Collection and Analysis
A New Technique for the Characterization of Lithium Alloys and Compounds

A New Technique for the Characterization of Lithium Alloys and Compounds
Improving Sample Analysis using Cathodoluminescence (CL) and Energy Dispersive Spectroscopy (EDS)

Improving Sample Analysis using Cathodoluminescence (CL) and Energy Dispersive Spectroscopy (EDS)
An Introduction into the Broad Argon Ion Beam Tool

An Introduction into the Broad Argon Ion Beam Tool
Discussing Electron Backscatter Diffraction (EBSD) with EDAX

Discussing Electron Backscatter Diffraction (EBSD) with EDAX
Applications of High-Speed CMOS Cameras for EBSD Micro-Structural Analysis

Applications of High-Speed CMOS Cameras for EBSD Micro-Structural Analysis
OIM Analysis for EBSD Mapping

OIM Analysis for EBSD Mapping
Analysing Energy Dispersive Spectroscopy Data Accurately and Efficiently with APEX™ Software

Analysing Energy Dispersive Spectroscopy Data Accurately and Efficiently with APEX™ Software
Nanocathodoluminescence Reveals the Optical Properties of III-nitride Light Emitting Diodes

Nanocathodoluminescence Reveals the Optical Properties of III-nitride Light Emitting Diodes
GIF Quantum LS Imaging Filter with K2 Summit Camera Enables Scientists to Reach 2.2 Å using Cryo-Electron Microscopy

GIF Quantum LS Imaging Filter with K2 Summit Camera Enables Scientists to Reach 2.2 Å using Cryo-Electron Microscopy
EDAX Octane Elite Ultra: Advanced Windowless EDS for SEM

EDAX Octane Elite Ultra: Advanced Windowless EDS for SEM
Monarc Pro T System for Optically-Coupled TEM

Monarc Pro T System for Optically-Coupled TEM
ClearView® Scintillator Camera

ClearView® Scintillator Camera
Cipher: Revealing the Distribution of Lithium in Scanning Electron Microscopes

Cipher: Revealing the Distribution of Lithium in Scanning Electron Microscopes
EDAX OIM Matrix™ Software Package

EDAX OIM Matrix™ Software Package
EDAX Velocity™ EBSD Camera Series

EDAX Velocity™ EBSD Camera Series
EDAX Spectrum Match Software

EDAX Spectrum Match Software
K3 Cameras: Single-Electron Counting Direct Detection Cameras

K3 Cameras: Single-Electron Counting Direct Detection Cameras
K3 IS Camera for In-situ Microscopy

K3 IS Camera for In-situ Microscopy
ChromaCL2TM iBSED Detector: Color Cathodoluminescence Imaging System

ChromaCL2TM iBSED Detector: Color Cathodoluminescence Imaging System
Disc Grinder to Pre-Thin and Polish Samples

Disc Grinder to Pre-Thin and Polish Samples
Disc Punch for Cutting Transmission Electron Microscope (TEM) Discs

Disc Punch for Cutting Transmission Electron Microscope (TEM) Discs
STEMx System: 4D STEM Diffraction System

STEMx System: 4D STEM Diffraction System
Elsa Cryo-Transfer Holder

Elsa Cryo-Transfer Holder
Low Energy Surface Preparation with the Ilion II System

Low Energy Surface Preparation with the Ilion II System
EDAX EDS: Elite T Silicon Drift Detector

EDAX EDS: Elite T Silicon Drift Detector
Stela Hybrid-Pixel Camera: Fully Integrated Hybrid-Pixel Electron Detector

Stela Hybrid-Pixel Camera: Fully Integrated Hybrid-Pixel Electron Detector
Liquid Helium and Liquid Nitrogen Cooling Stages

Liquid Helium and Liquid Nitrogen Cooling Stages
EDAX Clarity EBSD Detector Series

EDAX Clarity EBSD Detector Series
EDAX Lambda WDS Spectrometers

EDAX Lambda WDS Spectrometers
EDAX APEX™ Software for EDS

EDAX APEX™ Software for EDS
EDAX APEX Software for Electron Backscatter Diffraction (EBSD)

EDAX APEX Software for Electron Backscatter Diffraction (EBSD)
EELS and EFTEM Systems - GIF Continuum and Continuum S

EELS and EFTEM Systems - GIF Continuum and Continuum S
SEM-Based Cathodoluminescence - Monarc CL Detector

SEM-Based Cathodoluminescence - Monarc CL Detector
Plasma Tool to Remove Hydrocarbon Contamination - Solarus II Plasma Cleaner

Plasma Tool to Remove Hydrocarbon Contamination - Solarus II Plasma Cleaner
EDAX OIM Analysis Software

EDAX OIM Analysis Software
EDAX Neighbor Pattern Averaging & Reindexing (NPAR™)

EDAX Neighbor Pattern Averaging & Reindexing (NPAR™)
Transforming Electron Microscopy with CMOS Camera Rio

Transforming Electron Microscopy with CMOS Camera Rio
EDAX Octane Elite EDS System

EDAX Octane Elite EDS System
EDAX Pattern Region of Interest Analysis System (PRIAS)

EDAX Pattern Region of Interest Analysis System (PRIAS)
Rapid and Reliable Pre-Thinning to Near Electron Transparency with the Dimple Grinder II

Rapid and Reliable Pre-Thinning to Near Electron Transparency with the Dimple Grinder II
Polishing and Coating of SEM Samples using a PECS II Argon Beam System

Polishing and Coating of SEM Samples using a PECS II Argon Beam System
Reproducible and Precise Ion Polishing with the PIPS II System

Reproducible and Precise Ion Polishing with the PIPS II System
Single and Double Tilt Heating Holders

Single and Double Tilt Heating Holders
Specimen Heating for SEM with the Murano Heating Stage

Specimen Heating for SEM with the Murano Heating Stage
EDAX Neptune (EDS-WDS) System

EDAX Neptune (EDS-WDS) System
EDAX Octane Elect EDS System: Enhanced Energy Dispersive Spectroscopy Platform

EDAX Octane Elect EDS System: Enhanced Energy Dispersive Spectroscopy Platform
EDAX Element EDS System: Powerful Analytical Capability in a Compact Package

EDAX Element EDS System: Powerful Analytical Capability in a Compact Package
EDAX Pegasus (EDS-EBSD) System

EDAX Pegasus (EDS-EBSD) System
EDAX Trident (EDS-EBSD-WDS) System

EDAX Trident (EDS-EBSD-WDS) System
EDAX APEX Software for EBSD

EDAX APEX Software for EBSD
EDAX APEX Software for EDS/EDX

EDAX APEX Software for EDS/EDX
EDAX OIM Analysis Software

EDAX OIM Analysis Software
EDAX OIM Matrix

EDAX OIM Matrix
Neighbor Pattern Averaging and Reindexing (NPAR<sup>TM</sup>)

Neighbor Pattern Averaging and Reindexing (NPAR<sup>TM</sup>)
Pattern Region of Interest Analysis System (PRIAS<sup>TM</sup>) from EDAX

Pattern Region of Interest Analysis System (PRIAS<sup>TM</sup>) from EDAX
Spectrum Match

Spectrum Match
How to Use Saved EBSD Patterns in Specific Applications

How to Use Saved EBSD Patterns in Specific Applications
When and How to Use ChI-Scan™ in OIM Analysis™ v8

When and How to Use ChI-Scan™ in OIM Analysis™ v8
How to Use NPAR™ in OIM Analysis™ v8

How to Use NPAR™ in OIM Analysis™ v8
Advances in EDS Throughput - From X-ray Counts to Solutions

Advances in EDS Throughput - From X-ray Counts to Solutions
Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis

Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis
EDS in the TEM: Fundamentals and Principles

EDS in the TEM: Fundamentals and Principles
Can Direct Electron Detection be Used to Improve EBSD Analysis?

Can Direct Electron Detection be Used to Improve EBSD Analysis?
Harnessing the Power of Spherical Indexing with EDAX OIM Matrix

Harnessing the Power of Spherical Indexing with EDAX OIM Matrix
Understanding and Reducing Errors in Strain Measurements with HR-EBSD

Understanding and Reducing Errors in Strain Measurements with HR-EBSD
Correlative Microscopy with EBSD

Correlative Microscopy with EBSD
Applications of EBSD in Analyzing Deformed High-Temperature Materials

Applications of EBSD in Analyzing Deformed High-Temperature Materials
Introduction to Electron Backscatter Diffraction (EBSD)

Introduction to Electron Backscatter Diffraction (EBSD)
Addressing EBSD Indexing Challenges with Spherical Indexing

Addressing EBSD Indexing Challenges with Spherical Indexing
The Impact of Deformation Mode on Recrystallization Kinetics in Ni and Ti

The Impact of Deformation Mode on Recrystallization Kinetics in Ni and Ti
Advancements in EDS and EBSD

Advancements in EDS and EBSD
Introducing APEX 3.0 Software: EDS, EBSD, and WDS Integration

Introducing APEX 3.0 Software: EDS, EBSD, and WDS Integration
Making EDS Quantification with Standards an Everyday Technique Using FSQ in APEX

Making EDS Quantification with Standards an Everyday Technique Using FSQ in APEX
EBSD and TKD for Deeper Insights into the Cold Spray Deposition Process

EBSD and TKD for Deeper Insights into the Cold Spray Deposition Process
Advanced Tools for Enhanced EBSD Data Collection and Analysis

Advanced Tools for Enhanced EBSD Data Collection and Analysis
Quantifying Lithium Content Using the Composition by Difference Method

Quantifying Lithium Content Using the Composition by Difference Method
Applications of Direct Detection in Electron Backscatter Diffraction

Applications of Direct Detection in Electron Backscatter Diffraction

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